The course consists of the following topics:
1.
Introduction: the general philosophy of test. Economy of test and the quality of product.
2.
Mathematical methods in testing: Boolean differential algebra for test generation and fault diagnosis, binary decision diagrams for describing digital circuits, generalization of decision diagrams for describing digital systems.
3.
Faults. Classification of faults. Defects, faults, errors, failures. Stuck-at faults, shorts, opens, delay faults. Defect and fault modeling. Modeling defects by Boolean differential equations. Functional fault model as a general conception for hierarchical testing. Multiple faults and fault masking. Fault equivalence and fault dominance.
Methods for fault collapsing.
4.
Test generation. Test generation methods for combinational circuits, sequential circuits, finite state machines, memories, and digital systems (VLSI, microprocessors, systems-on-chip). Delay testing. Defect-oriented test generation. Universal test sets.
Random and pseudorandom test sets. Simulation based test generation. Genetic algorithms. Hierarchical test generation.
5.
Fault simulation and diagnosis. Test quality analysis. Simulation algorithms: parallel fault simulation, deductive and concurrent fault analysis, critical path tracing. Fault diagnosis and fault localization, combinational and sequential methods. Fault tables and fault dictionaries. Test program optimization.
6.
Practical work: design of a circuit for diagnostic experiments by CAD tools, manual test generation and fault simulation, comparison of different automated test pattern generation methods and tools, evaluation of the quality of manually generated (user defined) functional tests, fault diagnosis experiments.
Laboratory support: Cadence and Synopsys design tools, Turbo-Tester ATPG and fault simulation tools.
Literature:
1.
L.-T.Wang, C.-W.Wu, X.Wen. VLSI Test Principles and Architectures. Elsevier,
2006, 777 p.
2.
O.Novak, E.Gramatova, R.Ubar. Handbook of Testing Electronic Systems. Czech TU
Publishing House, 2005, 395 p.
3.
R.Ubar. Digitaalsüsteemide diagnostika I. Diagnostiline modelleerimine. TTÜ
Kirjastus, 148 lk.
4.
A.Miczo. Digital Logic Testing and Simulation. Wiley-Interscience, New Yersey,
2003, 668 p.
5.
N.Jha, S.Gupta. Testing of Digital Systems. Cambridge Univ. Press, 2003, 1000 p.
6.
M.L. Bushnell, V.D. Agrawal. Essentials of Electronic Testing. Kluwer Academic
Publishers, Boston / Dordrecht / London, 2000, 690 p.
7.
S.Mourad, Y.Zorian. Principles of Testing Electronic Systems. J.Wiley & Sons, Inc.
New York, 2000, 420 p.
8.
M.Abramovici, M.Breuer, A. Friedman. Digital Systems Testing and Testable
Design. IEEE Press, 1995, 652 p.