Optical vibrational and morphological properties of Co3O4/CoS2 nanostructured thin film T. Hurmaa*, S. Köseb, S. Aksaya, a b Department of Physics, Anadolu University, TR-26470, Eskişehir, Turkey Department of Physics, Eskişehir Osmangazi University, TR-26020, Eskişehir, Turkey Abstract A mixture of crystalline Co3O4/ CoS2 nanostructured thin film has been prepared by using an ultrasonic spray pyrolysis method. The film has been characterized by X-ray diffraction (XRD), energy-dispersive X-ray spectroscopy (EDAX), Fourier transform infrared (FT-IR) and Raman spectroscopy. The surface topography of the film has been studied using scanning electron microscope (SEM). Optical reflectance and transmittance were recorded with a double beam spectrophotometer with an integrating sphere. The optical constants such as refractive index, extinction coefficient, optical conductivity, real and imaginary parts of the dielectric constant of the film were determined. The XRD pattern shows that the film has only clear diffraction peaks around 2 = 29.26o corresponding to the (111) plane of cubic Co3O4. The crystallite size was calculated to be approximately 24 nm. The Raman measurements revealed four peaks of Co3O4. Infrared spectrum of the film has been investigated in 500–3000 cm−1 region. Keywords: Co3O4/ CoS2; X-ray diffraction; Optical constant; FT-IR; Raman. Corresponding author: Tel.: +90-222-3350580; Fax: +90-222-3204910 E-mail address: tulayozer@anadolu.edu.tr (T. Hurma)