TOPIC - BIST architectures I
MODULE : BIST architectures
UNIT 5: Built-in-Self-Test
Centralized and Separate Board-Level
BIST Architecture
 In offline mode, inputs are
driven by a PRPG.
 Outputs are monitored
using a single-input
signature analyzer. (To
reduce hardware costs, the
test is repeated m times,
once for each output)
 This method is best suited
for pipeline circuits with
limited feedback.
• centralized and separate
BIST architecture;
• no boundary scan;
• combinational or sequential
CUT.
Built-1n Evaluation and Self-Test (BEST)
 It is an application of the
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CSBL design to chips.
The inputs to the CUT are
driven by a PRPG and the
outputs are compressed using
MISR.
The hardware overhead for
the BEST architecture is low.
But, for some circuits this
technique can be ineffective in
achieving an acceptable level
of fault coverage.
Both an embedded version
and a separate version of this
architecture exist.
The details of switching between the
primary inputs and the output of the
PRPG when applying the normal or
the test inputs to the CUT are not
shown.
Either a MUX can be used, or the
primary inputs can first be loaded into
the PRPG and then applied to the
CUT. The same concepts apply to the
outputs.
BIST for high fault coverage
 The previous BIST architectures often result in low
fault coverage because they rely on the use of
pseudorandom patterns for testing a sequential
circuit.
 To circumvent this problem, an internal scan path
can be used within the CUT so that the testing of the
CUT can be reduced to the problem of testing
combinational logic. The next few BIST architectures
will illustrate this concept.
Random-Test Socket (RTS)
 The random-test socket
(RTS) is not a true BIST
architecture because the
test circuitry is external
to the CUT.
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distributed and separate
test hardware;
no boundary scan;
scan path (LSSD) CUT
architecture.
Testing procedure in RTS
 Initialize the LFSRs.
 Load a pseudorandom test pattern
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into the scan path using R2.
Generate a new pseudorandom
test pattern using R1
Capture the response on the
primary outputs of the CUT by
applying one clock pulse to R3
Execute a parallel-load operation
on the system storage cells to
capture the response to the
random test pattern.
Scan out the data in the internal
scan path of the CUT and
compress these data in R4.
Steps 2-6 are repeated until either an adequate
fault coverage is achieved
 Testing is inherently slow, since for
each test pattern the entire scan
path must be loaded.
LSSD On-Chip Self-Test (LOCST)
The test process is as
follows:
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Initialize: The scan path is
loaded with seed data via
the Sin line.
enable LFSR.
Load the scan path with a
pseudorandom test
pattern.
Compare the final value in
the SISR with the known
good signature.
•centralized and separate BIST
architecture;
•scan path (LSSD) CUT architecture.
•on-chip test controller.
Self-Testing Using MISR and Parallel
SRSG* (STUMPS)
 Applied to boards :
 Centralized and separate
BIST architectures.
 Multiple scan paths.
 No boundary scan.
 The scan paths are driven
in parallel by a PRPG, and
the signature is generated
in parallel from each scan
path using a MISR.
 The scan paths may be of
different lengths, the PRPG
is run for K clock cycles to
load up the scan paths.