Digital Integrated Circuits A Design Perspective Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic Introduction EE141 Integrated © Digital Circuits2nd 1 Introduction What is this book all about? Introduction to digital integrated circuits. CMOS devices and manufacturing technology. CMOS inverters and gates. Propagation delay, noise margins, and power dissipation. Sequential circuits. Arithmetic, interconnect, and memories. Programmable logic arrays. Design methodologies. What will you learn? Understanding, designing, and optimizing digital circuits with respect to different quality metrics: cost, speed, power dissipation, and reliability EE141 Integrated © Digital Circuits2nd 2 Introduction Digital Integrated Circuits Introduction: Issues in digital design Device Physics The CMOS inverter Combinational logic structures Sequential logic gates Basic Computer Architecture Arithmetic building blocks Memories and array structures EE141 Integrated © Digital Circuits2nd 3 Introduction Introduction Why is designing digital ICs different today than it was before? Will it change in future? EE141 Integrated © Digital Circuits2nd 4 Introduction The First Computer The Babbage Difference Engine (1832) 25,000 parts cost: £17,470 = $707,500 (2015 dollars) EE141 Integrated © Digital Circuits2nd 5 Introduction ENIAC - The first electronic computer (1946) EE141 Integrated © Digital Circuits2nd 6 Introduction The Transistor Revolution First transistor Bell Labs, 1948 Shockley, Bradeen & Brattain EE141 Integrated © Digital Circuits2nd 7 Introduction The First Integrated Circuits Bipolar logic 1960’s ECL 3-input Gate Motorola 1966 EE141 Integrated © Digital Circuits2nd 8 Introduction Intel 4004 Micro-Processor 1971 1000 transistors 1 MHz operation EE141 Integrated © Digital Circuits2nd 9 Introduction Intel CORE i7 microprocessor EE141 Integrated © Digital Circuits2nd 10 Introduction EE141 Integrated Circuits2nd © Digital Introduction Moore’s Law In 1965, Gordon Moore noted that the number of transistors on a chip doubled every 18 to 24 months. He made a prediction that semiconductor technology will double its effectiveness every 18 months EE141 Integrated © Digital Circuits2nd 12 Introduction 1959 1960 1961 1962 1963 1964 1965 1966 1967 1968 1969 1970 1971 1972 1973 1974 1975 LOG2 OF THE NUMBER OF COMPONENTS PER INTEGRATED FUNCTION Moore’s Law EE141 Integrated © Digital 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Electronics, April 19, 1965. Circuits2nd Introduction 13 Evolution in Complexity EE141 Integrated © Digital Circuits2nd 14 Introduction Transistor Counts 1 Billion Transistors K 1,000,000 100,000 10,000 1,000 i486 Pentium® III Pentium® II Pentium® Pro Pentium® i386 80286 100 8086 10 Source: Intel 1 1975 EE141 Integrated © Digital 1980 Circuits2nd 1985 1990 1995 2000 Courtesy, Intel 2005 2010 15 Introduction Moore’s law in Microprocessors 1000 2X growth in 1.96 years! Transistors (MT) 100 10 486 1 386 286 0.1 0.01 P6 Pentium® proc 8086 8080 8008 4004 8085 0.001 1970 1980 1990 Year 2000 2010 Transistors on Lead Microprocessors double every 2 years EE141 Integrated © Digital Circuits2nd Courtesy, Intel 16 Introduction Die Size Growth Die size (mm) 100 10 8080 8008 4004 1 1970 8086 8085 1980 286 386 P6 Pentium ® proc 486 ~7% growth per year ~2X growth in 10 years 1990 Year 2000 2010 Die size grows by 14% to satisfy Moore’s Law EE141 Integrated © Digital Circuits2nd Courtesy, Intel 17 Introduction Frequency Frequency (Mhz) 10000 Doubles every 2 years 1000 100 486 10 8085 1 0.1 1970 8086 286 P6 Pentium ® proc 386 8080 8008 4004 1980 1990 Year 2000 2010 Lead Microprocessors frequency doubles every 2 years EE141 Integrated © Digital Circuits2nd Courtesy, Intel 18 Introduction Power Dissipation 100 Power (Watts) P6 Pentium ® proc 10 8086 286 1 4004 8008 486 386 8085 8080 0.1 1971 1974 1978 1985 1992 2000 Year Lead Microprocessors power continues to increase EE141 Integrated © Digital Circuits2nd Courtesy, Intel 19 Introduction Power will be a major problem 100000 18KW 5KW 1.5KW 500W Power (Watts) 10000 1000 Pentium® proc 100 286 486 8086 10 386 8085 8080 8008 1 4004 0.1 1971 1974 1978 1985 1992 Year 2000 2004 2008 Power delivery and dissipation will be prohibitive EE141 Integrated © Digital Circuits2nd Courtesy, Intel 20 Introduction Power density Power Density (W/cm2) 10000 Rocket Nozzle 1000 Nuclear Reactor 100 8086 10 4004 Hot Plate P6 8008 8085 Pentium® proc 386 286 486 8080 1 1970 1980 1990 2000 Year 2010 Power density too high to keep junctions at low temp EE141 Integrated © Digital Circuits2nd Courtesy, Intel 21 Introduction Not Only Microprocessors Cell Phone Small Signal RF Power RF Power Management Analog Baseband Digital Baseband (DSP + MCU) Digital Cellular Market (Phones Shipped) EE141 Integrated © Digital Circuits2nd 22 Introduction Challenges in Digital Design DSM 1/DSM “Macroscopic Issues” “Microscopic Problems” • Ultra-high speed design • Interconnect • Noise, Crosstalk • Reliability, Manufacturability • Power Dissipation • Clock distribution. • Time-to-Market • Millions of Gates • High-Level Abstractions • Reuse & IP: Portability • Predictability • etc. Everything Looks a Little Different …and There’s a Lot of Them! ? EE141 Integrated © Digital Circuits2nd 23 Introduction (M) Productivity Trends 10,000 10,000,000 100,000 100,000,000 Logic Tr./Chip Tr./Staff Month. 10,000 10,000,000 100 100,000 Productivity (K) Trans./Staff - Mo. Complexity Logic Transistor per Chip 1,000 1,000,000 1,000 1,000,000 58%/Yr. compounded Complexity growth rate 10,00010 100 100,000 1,0001 10 10,000 x 0.1 100 x x 0.01 10 xx x x 1 1,000 21%/Yr. compound Productivity growth rate x 0.1 100 0.01 10 2009 2007 2005 2003 2001 1999 1997 1995 1993 1991 1989 1987 1985 1983 1981 0.001 1 Source: Sematech Complexity outpaces design productivity EE141 Integrated © Digital Circuits2nd Courtesy, ITRS Roadmap 24 Introduction Why Scaling? Technology shrinks by 0.7/generation With every generation can integrate 2x more functions per chip; chip cost does not increase significantly Cost of a function decreases by 2x But … How to design chips with more and more functions? Design engineering population does not double every two years… Hence, a need for more efficient design methods Exploit different levels of abstraction EE141 Integrated © Digital Circuits2nd 25 Introduction Design Abstraction Levels SYSTEM MODULE + GATE CIRCUIT DEVICE G S n+ EE141 Integrated © Digital Circuits2nd D n+ 26 Introduction Design Metrics How to evaluate performance of a digital circuit (gate, block, …)? Cost ~ Technology, size Reliability ~ Design approach, power supply Scalability Speed (delay, operating frequency) Power dissipation Energy to perform a function EE141 Integrated © Digital Circuits2nd 27 Introduction Cost of Integrated Circuits NRE (non-recurrent engineering) costs design time and effort, mask generation one-time cost factor Recurrent costs silicon processing, packaging, test proportional to volume proportional to chip area EE141 Integrated © Digital Circuits2nd 28 Introduction NRE Cost is Increasing EE141 Integrated © Digital Circuits2nd 29 Introduction Die Cost Single die Wafer Going up to 12” (30cm) From http://www.amd.com EE141 Integrated © Digital Circuits2nd 30 Introduction Cost per Transistor cost: ¢-per-transistor 1 0.1 Fabrication capital cost per transistor (Moore’s law) 0.01 0.001 0.0001 0.00001 0.000001 0.0000001 1982 EE141 Integrated © Digital 1985 Circuits2nd 1988 1991 1994 1997 2000 2003 2006 2009 31 2012 Introduction Yield No. of good chips per wafer Y 100% Total number of chips per wafer Wafer cost Die cost Dies per wafer Die yield wafer diameter/2 2 wafer diameter Dies per wafer die area 2 die area EE141 Integrated © Digital Circuits2nd 32 Introduction Defects defects per unit area die area die yield 1 is approximately 3 die cost f (die area) 4 EE141 Integrated © Digital Circuits2nd 33 Introduction Reliability― Noise in Digital Integrated Circuits v (t) V DD i(t) Inductive coupling EE141 Integrated © Digital Circuits2nd Capacitive coupling Power and ground noise 34 Introduction DC Operation Voltage Transfer Characteristic V(y) V VOH = f(VOL) VOL = f(VOH) VM = f(VM) f OH V(y)=V(x) VM Switching Threshold V OL V OL V OH V(x) Nominal Voltage Levels EE141 Integrated © Digital Circuits2nd 35 Introduction Regenerative Property v0 v1 v2 v3 v4 v5 v6 A chain of inverters Simulated response EE141 Integrated © Digital Circuits2nd 41 Introduction Fan-in and Fan-out N Fan-out N EE141 Integrated © Digital Circuits2nd M Fan-in M 42 Introduction The Ideal Gate V out Ri = Ro = 0 Fanout = NMH = NML = VDD/2 g= V in EE141 Integrated © Digital Circuits2nd 43 Introduction An Old-time Inverter 5.0 4.0 NM L 3.0 (V) 2.0 out V VM NM H 1.0 0.0 EE141 Integrated © Digital Circuits2nd 1.0 2.0 3.0 V in (V) 4.0 5.0 44 Introduction Delay Definitions EE141 Integrated © Digital Circuits2nd 45 Introduction Power Dissipation Instantaneous power: p(t) = v(t)i(t) = Vsupplyi(t) Peak power: Ppeak = Vsupplyipeak Average power: Vsupply t T 1 t T Pave p(t )dt isupply t dt t T t T EE141 Integrated © Digital Circuits2nd 48 Introduction Energy and Energy-Delay Power-Delay Product (PDP) = E = Energy per operation = Pav tp Energy-Delay Product (EDP) = quality metric of gate = E tp EE141 Integrated © Digital Circuits2nd 49 Introduction Summary Digital integrated circuits have come a long way and still have quite some potential left for the coming decades Some interesting challenges ahead Getting a clear perspective on the challenges and potential solutions is the purpose of this book Understanding the design metrics that govern digital design is crucial Cost, reliability, speed, power and energy dissipation EE141 Integrated © Digital Circuits2nd 51 Introduction