Supplementary materials for
“Quantitative measurement of in-plane cantilever torsion for
calibrating lateral piezoresponse force microscopy”
Hyunwoo Choi1,2, Seungbum Hong2,a) and Kwangsoo No1,a)
1
Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA
2
Department of Materials Science and Engineering, Korea Advanced Institute of Science
and Technology, Daejeon 305-701, Korea
a)
Corresponding authors : hong@anl.gov and ksno@kaist.ac.kr
1
Figure S1. Trace and retrace lateral signal images of BaTiO3 single crystal at the scan size of
(a) 20, (b) 80 and (c) 400 nm.
Effects of the increase in the lateral force on the increases in the absolute
values of the lateral torsion signal
In order to examine the effects in the increase of the lateral force on the increases in
the absolute values of the lateral torsion signals, we scanned BaTiO3 (BTO) single crystal
with fixed scan distance of 200 nm under various scan speed (in case of the experiment in the
manuscript, scan rate is maintained with 10 Hz, and the scan distance changes). Figure S2
shows the root mean square (RMS) lateral signals of the trace and the retrace scan images as
a function of the scan speed (from 400 to 2000 nm/s, with the step of 200 nm/s). One can see
that the lateral signal linearly increases as the scan speed increases.
2
Figure S2. RMS lateral torsion signal of the trace and the retrace scan images as a function of
the scan speed. Sample is BTO single crystal, and the scan distance is 200 nm.
Table SI. Previously reported d31 values of BaTiO3.
d31 (pm/V
= pC/N)
-58a
-72b
-75c
-82d
a
Reference 1.
Reference 2.
c
Reference 3.
d
Reference 4.
e
Reference 5.
f
Reference 6.
b
3
-78e
-97.5e
-103.3f
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