Supplementary Information:
Atomic configurations at InAs partial dislocation cores associated
with Z-shape faulted dipoles
Luying Li1,2*, Zhaofeng Gan2, Martha R. McCartney2, Hanshuang Liang3, Hongbin
Yu3, Yihua Gao1,4, Jianbo Wang5* and David J. Smith2*
1
Center for Nanoscale Characterization and Devices, Wuhan National Laboratory for
Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074,
China
2
3
Department of Physics, Arizona State University, Tempe, Arizona 85287, USA
School of Electrical, Computer, and Energy Engineering, Arizona State University,
Tempe, Arizona 85287, USA
4
5
School of Physics, Huazhong University of Science and Technology, Wuhan,
430074, China
School of Physics and Technology, Center for Electron Microscopy and MOE Key
Laboratory of Artificial Micro- and Nano-Structures, Wuhan University, Wuhan
430072, China
Figure S1. (a) Aberration-corrected HAADF image of dislocation core 3 as indicated
by a green arrow in Fig. 1(b) and (c). The defective region and perfect region used for
EDS are labeled by blue and red boxes, respectively. (b) EDS results for defective and
perfect regions.
The Error bar in the determination of the actual atomic positions:
STEM probe instability has historically been a problem, but recent advances in the
stability of probe-corrected STEMs have markedly alleviated these concerns. Much
important work has been published measuring extremely small displacements
(~several tens of picometers) of atomic columns using probe-corrected STEM, with
error bars of considerably less (10-15 picometers).34-37
A pure zincblende region from Fig. 2(a) is treated with the crystallographic imaging
processing tool in MacTempas software, and the actual atomic-column positions are
obtained through the peak-finding algorithm. The atoms are found to be perfectly
aligned along the horizontal direction in the image with only occasional displacement
of 1 pixel (1 pixel = 0.0148 nm). While the observed average bond length variation is
~ 0.05 nm, it would be appropriate to define the error bar as 0.015 nm.
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