DMA
Q800
General Information
Instrument:
DMA Q800
DMA measures mechanical properties, such as
modulus (elasticity) and viscosity (damping) as a
function of time, temperature, frequency, stress or
combinations of these parameters.
Main application:
A DMA can be used to determine the viscoelastic
behaviour of materials, perform creep experiments
and study changes in damping capacity and modulus
as a function of temperature and humidity. We also
use it to study the change in viscoelastic properties
during the cure (hardening) of thermoset polymers
UV 3600
The UV-3600 combines research-grade UV-Vis or UV-Vis-NIR
optical performance with the ease and familiarity of PC
operation. It is equipped with three detectors: a PMT detector
(photomultiplier tube) for the UV-Vis regions, and InGaAs and
PbS detectors for the near infrared region. Together, the three
detectors ensure high sensitivity during transmittance and
reflectance, even in the switchover range, and significantly
reduced noise. A high-performance double monochromator
ensures ultra-low stray light (0.00005% or less at 340 nm) at
high resolution, while a measurement wavelength range of
185 - 3300 nm allows spectroscopic analysis in a wide variety
of fields. It has a large sample compartment and integrating
sphere attachment for easy measurement of solid samples.
The Absolute Specular Reflectance (ASR) attachments ensure
that high-accuracy absolute reflectance measurements are
possible while additional accessories expand the range of
measurement possibilities. Specialized accessory and
software packages provide solutions in the analysis of films,
powders, coatings, plastics, and liquids. UVProbe is an all-inone software package used to control the UV-3600 and
incorporates the following four functions: Spectrum,
Photometric (Quantitation), Kinetics, Report Generator. Each
function can be easily operated with its dedicated screen.
Included as standard are a wide variety of data processing
functions such as peak/valley detection and area calculation.
Security features by which each user is limited to the use of
specific functions, and an audit trail for the instrument and the
data are all standard as well.
AFM stands for Atomic Force Microscopy or Atomic
Force Microscope and is often called the "Eye of
Nanotechnology". AFM, also referred to as SPM or
Scanning Probe Microscopy, is a high-resolution
imaging technique that can resolve features as small
as an atomic lattice in the real space. It allows
researchers to observe and manipulate molecular and
atomic level features.
How AFM works is illustrated in the figure to the right.
AFM works by bringing a cantilever tip in contact with
the surface to be imaged. An ionic repulsive force from
the surface applied to the tip bends the cantilever
upwards. The amount of bending, measured by a laser
spot reflected on to a split photo detector, can be used
to calculate the force. By keeping the force constant
while scanning the tip across the surface, the vertical
movement of the tip follows the surface profile and is
recorded as the surface topography by the AFM.
The predecessor of AFM is STM, Scanning Tunneling
Microscopy or the Scanning Tunneling Microscope, was
invented in 1981 by G. Binnig and H. Rohrer who
shared the 1986 Nobel Price in Physics for their
invention. An excellent technique, STM is limited to
imaging conducting surfaces
Agilent
AFM
Chromium
Sputter
Coaters
The K575X is a compact, turbomolecular-pumped sputter
coater optimised to deposit fine metal coatings for SEM, FEGSEM and thin film applications. The sputter coating process is
completely automatic, making the K575X ideal for
inexperienced or occasional users. The K575X is fitted as
standard with a chromium (Cr) target, but a wide range of
oxidising and non-oxidising metals are available - including
iridium (ir), which has a small grain size yet does not oxidise
on contact with air.
The K575XD is a dual-head version of the K575X and is fitted
with two sputter heads. This enables the deposition of two
sequential coating materials without the need to break
vacuum.