Introductory course in Scanning Probe Microscopy
It is once again time to give the introductory course in scanning probe
microscopy. This time with a new examiner. The course is directed towards Ph.d
students and others that want a theoretical and practical introduction to scanning
probe microscopy techniques. It gives a better understanding of what you see,
and why, when you measure with AFM/STM, as well as insights in more
advanced SPM techniques
Time: The course will start February 26th, provided sufficient interest. I will try to
adjust the schedule according to the schedule of the participants. The course is
expected to be finished around easter (late march/early april).
Organization: The course will consist of 4-5 * 2 h lectures and 1*6 h laboration.
(3 hp credits)
Litterature: Scanning Probe Microscopy, the lab on a tip, E. Meyer, H. J. Hug, R.
Bennewitz. (You can follow the course without buying the book as I will distribute
the lectures together with other handouts, but it is useful as a reference and an
overview of the field.) The book is available at Adlibris.com
Examination: Home exam
Topics to be treated is among others:
General SPM:
The common principles and technologies used in SPM
The Scanning Tunneling Microscope (STM)
The Atomic Force Microscope (AFM)
AFM specific:
Force detection methods
Tip/cantilever technology
AFM operation modes
Tip-surface interaction
Image artifacts
Measurements in liquids
Local force measurements
Atomically resolved AFM
Electrical and other techniques based on AFM
Practical handling issues
Registration : Those interested in participating should contact me by e-mail. If
you notify me before 2012-01-15, and specify which times you cannot attend
lectures and laborations, I will try to take this into account when preparing the
schedule. Further information will be distributed to the participants before the
course starts