Supporting Information to the manuscript: Structures and physical properties of transparent conducting, amorphous Zndoped SnO2 films Q. Zhu,‡ Q. Ma,§, ‡ D. B. Buchholz, ‡ R. P. H. Chang, ‡ M. J. Bedzyk, ‡ T. O. Mason‡ ‡ § Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA DND-CAT, Northwestern Synchrotron Research Center at Advanced Photon Source, Argonne, Illinois 60439, USA 1. Local structure change with annealing Fig. S1 shows the Zn K-edge EXAFS spectra and their Fourier transforms (FTs) of the asdeposited and post-annealed a-ZTO90 film films. Higher magnitudes of second shell peaks were observed after one hour annealing at 450°C, when crystallization has occurred as evidenced by GIXRD (see Fig. 1 in the main text). The change of the local structure around Zn could be evidenced by the first (Table 1) and second shell fitting results (Table S1). Figure S1. The Zn K-edge k3-weighted EXAFS spectra (left) and their Fourier transforms (right) measured on ZTO90 films deposited at 10 mTorr (a) and air-annealed at 300°C (b), 400°C (c), 450°C (d), respectively. The smaller coordination numbers of Zn-O for the 450°C-annealed sample compared to the as-prepared sample (see Table 1) is also reflected in the decrease in the magnitude of the respective FTs. Table S1. EXAFS determined structural parameters for the second coordination shells. Samples R (Å) N σ2(Å2) Sn-Sn Zn-Sn Sn-Sn Zn-Sn Sn-Sn Zn-Sn a-SnO2 3.22 - 1.9 - 0.0093 - a-ZTO90 3.26 3.08 1.9 1.5 0.0085 0.017 (300°C) 3.26 3.07 1.9 1.5 0.0085 0.016 (400°C) 3.25z 3.08 2.0 1.1 0.0093 0.018 (450°C) 3.18 3.12 2.1 2.6 0.0093 0.017 Figure S2. Fourier transforms of k3-weighted EXAFS (solid lines) and the best fits including the second shells (dashed lines) of Sn and Zn K-edges for the as deposited a-ZTO90 film (10 mTorr). 2. Double-shell modeling of the first coordination shell around Sn Fig. S3 presents the š02 values as function of the the data range used for fitting of Sn K-edge. Strong dependence on the EXAFS data range was observed in the cases of 300°C- and 400°Cannealed ZTO90 films as well as the a-SnO2 film, where N around Sn decreased monotonically up to 5% from increasing the EXAFS data range from 9.5 to 12.4 Å-1. Meanwhile, the figure of merit for the fittings deteriorates by nearly 4-fold. In contrast, such a relation is much weaker, if any, for the as-prepared a-ZTO90 film. This correlation with kmax can be removed with a doubleshell model. In the double-shell model, two Sn-O bond distances with a small separation were assumed, and the total coordination number N is fixed at 6 (=N1 + N2). When considering a small structural change (1-2%), fitting may not produce fully reliable results due to the difficulties in the fitting algorithm, precision of calculated phases ļŖ(k) and amplitudes f(k), and strong correlation between the parameters, such as that between N and σ2. However, with the observation of a beating characteristic around 9 Å-1 as shown in Fig. 7, this suggests the development of two Sn-O bond distances in the first shell around Sn. Therefore, the double-shell model is believed to better approximate the true structure. See the reference 31 for more details. Figure S3. kmax-dependence of š02 for Sn K-edges of a-SnO2 and a-ZTO films. The fitting results were obtained by assuming a single Sn-O distance and N = 6. Line of a-SnO2 is for eye guidance only. š02 of cSnO2, which is 1.02, is determined using the data up to 14.7 Å-1 where the first shell EXAFS oscillations are included in complete. 3. Data processing of the X-ray scattering measurements Figure S4. The incident x-ray intensity normalized, raw scattered intensity and Zn Kļ” fluorescence data of a-ZTO90 along with background data with no sample. Figure S5. Raw data from Fig. S4 after background corrections and compared to a calculated XRD pattern from polycrystalline rutile c-SnO2. Figure S6. The scattered intensity data from Fig. S5 after normalization to the calculated elastic and inelastic scattering background using the high-angle method. q = 4πsin(2Theta/2)/λ. Figure S7. Structure factor of a-ZTO from data shown in Fig. S6. Figure S8. Pair distribution functions (PDF) obtained by Fourier transforms of Fig. S7 data over q-ranges with different qmax cut-offs as labeled. The upper most curve is the data shown in Fig. 2 in the main text.