Progress report on development of the Low Power LVDS Receiver in 0.25u CMOS technology for the ALICE Silicon Strip Detector (SSD). 20 January 2003. V. Gromov (vgromov@nikhef.nl), R. Kluit. ET NIKHEF, Amsterdam. Abstract. A new LVDS Receiver circuit in 0.25u CMOS technology has been developed to satisfy severe constraints on power dissipation made for the ALICE SSD front-end control electronics. The LVDS Receiver is focused on consuming the least power while being expected to operate under relatively low data speed (10MHz). The circuit description along with test results are presented and compared to the simulations. Introduction. The ALICE SSD electronics includes several ASICs (application-specific integrated circuits) designed in 0.25u CMOS technology. The chips will operate in a closed area where dissipated power cannot be easily taken aside. Therefore it is important to keep the total power consumption as low as possible. LVDS Signaling Standard is used throughout the system as an interface between the chips. The LVDS receiver has been one of the most common cells on the chips. By making the cell less power consuming we can save a lot of power overall. Although the expected data speed is 10MHz at the most, the low power cell must be fast enough to cope with the speed. Some of the chips will be AC-coupled, as long as they will work at different ground potentials. That means the receiver needs a self-biasing capability. It is reasonable to switch the receiver off while data transmission is not on. For this purpose an enable/disable functionality is necessary to implement. On the basis of the arguments listed above a Low Power self-biased LVDS Receiver with enable/disable function, capable to operate at 10MHz data speed is designed in 0.25u CMOS technology. Inputs for the receiver design. Main specifications of LVDS Signaling Standard and operation conditions of ALICE SSD read-out determine inputs for the receiver design: . characteristic impedance of the transmission cable (equal to the value of the terminating resistor) 110. . differential voltage swing: 350mV 80mV . power dissipation in the terminating resistor: (350mV)2 /110 = 1.1mW. .common mode offset: 1.25V0.5V. .maximum required data speed : 10MHz. .the circuit has to operate in a noisy environment, therefore special measures should be taken to suppress common mode disturbances and avoid noise triggering. Specifications of the receiver. 1. Technology. The receiver cell must be compatible with any design in 0.25u CMOS technology and hence it has to be developed in this technology. 2. Speed. The receiver should be fast enough to handle 10MHz data speed with 50% duty cycle. 3. Power consumption. Since terminating resistor dissipates 1.1mW, it does not makes sense to require the receiver to consume much less power than 1.1mW because further cut-backs will not lead to visible power savings in total. 4.Common mode range of operation. A rail-to-rail differential stage at the input of the receiver is needed to ensure reliable operation and high common mode noise suppression in the range: 1.25V 0.5V. 4. Hysteresis. To avoid multiple noise triggering at the moment when both inputs approaching turn-off point a hysteresis is necessary. The level of hysteresis needs to be larger than the noise peak-to-peak value. By estimating the noise level we suggest a hysteresis of 25mV will be enough. 5. Self-biasing capability. As the receiver will be AC-coupled to the LVDS driver, self-biasing at the inputs is necessary. The input voltage levels must comply with following conditions: VH - VL =350mV 70mV (VH + VL)/2 =1.25V 150mV 6. Enable/disable functionality. To avoid unnecessary power dissipation when the receiver is out of use, a disabling function should be implemented into the circuit. 2 Coupling to the receiver inputs. There are two ways to couple the receiver to the transmission cable (see Fig.1). We use DC-coupling when the driver and the receiver operate at the same ground potential. If it is not the case, AC-coupling is necessary. The difference between these modes of operation is described in Fig.2. correct quiescent voltage levels at the inputs (see C in Fig.2). Otherwise it can happen that the swing is just not enough to give an overdrive sufficient to switch the receiver (see D in Fig.2). Therefore range of deviation of voltage levels at the inputs needs to be consistent with range of deviation of the driver current in order to avoid the odd situation where data transmission does not occur. Fig.1. Principal diagram of DC-coupling to the receiver and principal diagram of AC-coupling to the receiver. The LVDS driver is a current source pulling the current through the terminating resistor (R=110 Ohm). The current runs clockwise or other way around according to the logic state. It also controls common mode voltage level. Differential voltage swing is set by the current value and the value of the terminating resistor. Due to fabrication process variation it can happen that the current deviate from the nominal value (3mA 0.7mA). Moreover the common mode voltage value can shift in the range 1.25V 0.5V. The receiver must be capable to operate within the range of the deviations. In DC-coupling mode the driver is direct coupled to the receiver. In order to set the receiver into a certain logic state the differential swing (which is voltage overdrive in this case) must be at least 100mV. That means it is not critical if due to fabrication process variation the driver delivers current slightly lower than the nominal (see A and B in Fig.2). In contrast to that, in AC-coupling mode the driver determines differential swing but not the quiescent voltage levels at the receiver inputs and hence the overdrive. It makes no problem if the driver delivers nominal current and the receiver self-biasing chain sets Fig.2. Signals at the LVDS Driver output and LVDS Receiver input in DC-coupling mode and AC-coupling mode of operation. The circuit. The principal diagram of the receiver is given in Fig.3. The comparator converts low-voltage differential signals at the inputs into a CMOS level signal at the output. The positive feedback chain is to provide proper bias voltages at the inputs when the receiver operates in AC-coupling mode. It includes Level adaptor and feedback resistors. The reset circuit sets the receiver into initial logic state right after the start-up. It consists of two CMOS transistors bypassing the feedback resistors, a NAND gate and an inverter gate. A reference voltage (Vref= +1.25V) along with biases for the current sources (Ib_Nch, Ib_Pch) come from the build-in Reference 3 source. The Enable input controls the state of the receiver. Fig.3. Principal diagram of the receiver. The design. 1. Rail-to-rail differential comparator with hysteresis. The comparator is the key component of the design (see Fig.4). Two complementary principal differential pairs (M479, M488 and M210, M218) form a rail-to-rail structure at the input. It is followed by cascode stages (M217, M481) loaded with transistors in the diode configuration (D1, D2). Drains of the transistors have been biased to 1.25V (Vref1=Vref2). That sets voltage swing at the Out1 point (VL=1.25V-0.8V=0.45V and VH=+1.25V+0.8V=2.05V). Inverters at the output convert these levels into CMOS ones (VH=Vdd, VH=Vss) and besides make the level transition process much faster. With the purpose to introduce hysteresis, two additional complementary differential pairs (M492, M478 and M211, M63) operate in parallel to the main input differential pair. Output voltages (Out1, Out2) control the additional differential pairs. This solution makes the turn-off voltage dependant on the present logic state of the comparator. The comparator turns off not exactly at the moment when voltages at the inputs (InPlus, InMinus) are equal, but when the overdrive reaches 25mV. The overdrive value and hence the hysteresis level is set with the proportionality between currents coming through the main and additional differential pairs. Fig.4. Schematic of the comparator with hysteresis. rail-to-rail differential 2. Level Adaptor. The main function of the level adaptor is to deliver quiescent LVDS logic levels to the comparator input when the receiver is used in AC-coupling mode (see Fig.5). Gate I318 convert single input signal into complementary output signals. These direct the current either to the route M88, M83, M71, M72, M73, M53 (stripped line) or to the route M88, M82, M84, M85, M86, M53 (dotted line). As middle point of the circuit is biased to +1.25V, output levels (OutP, OutN) have been set by voltage drop on zero-voltage threshold transistors in diode configuration (M71,M72 and M84,M85) as follows: VL= +1.25V-0.2V=1.05V, VH= +1.25V+0.2V=1.45V. 4 Ratio of areas of transistors M67 and M70 (W67/W70=0.33) together with value of resistor R1 (1k) determine current value in the circuit (42uA). The value is almost not sensitive to the supply voltage fluctuations. When disabled (Enable1 = GND) the current path is broken and the bias voltages drift to the power supply rails (Ib_Pch = VDD, Ib_Nch = GND). A voltage follower represents the reference voltage source (+1.25V) (see Fig.7). The output transistor M502 drives 49uA and has output impedance 1k. +1.25V Fig.5. Schematic of Level Adaptor. Reference source. The current reference circuit is used to generate bias voltages (Ib_Nch, Ib_Pch) for current sources of the receiver (see Fig.6). Fig.7 Schematic of the reference voltage source (+1.25V). Test results. Fig.8 shows experimental set-up used for the testing of the receiver. Fig.8 Experimental set-up for testing of the receiver. Fig.6. Schematic of the current reference circuit. Pulse generator PM 5786 feeds the receiver with differential input signals and sets common mode voltage 5 level. The programmable pulse generator controls Enable and ResetAC functions of the chip while the Tektronix Scope does the measurements. DC-coupling mode. Fig.9 demonstrates operation of the receiver in DCcoupling mode under following conditions: common mode voltage is 1.25V, duty cycle is 50%, differential swing at the inputs is 270mV (that is what the LVDS driver delivers in the worst case). The receiver easily runs at data speed as high as 30MHz. If the data speed goes up to 60MHz the receiver starts to fizzle out as the duty cycle at its output declines from 50% level. The measurements are in good agreement with the HSPICE simulations. Diff. Swing = 270mV LVDS_InP LVDS_InN receiver is not capable to handle the data speed. Maximum data speed is then: Fmax 0.5 / Internal delay The receiver response to the input differential signals taken on various common mode levels are given in Fig. 10 (data speed is 10MHz, differential swing is 270mV). Figure 10 demonstrates that the receiver can operate in range 1.25V0.5V with almost no change of its speed properties. LVDS_InP LVDS_InN Com . mode = 0.75V Internal delay = 8.6ns Fmax 60MHz Com .mode = 1.25V LVDS_InP LVDS_InN OutCMOS Freq = 10 MHz LVDS_InP LVDS_InN OutCMOS Com . mode = 1.25V Internal delay = 8.6ns Fmax 60MHz LVDS_InP LVDS_InN OutCMOS OutCMOS Freq = 33 MHz Duty cycle is not kept at 50 % level Freq = 67 MHz Fig.9 Operation of the receiver in DC-coupling mode. Common mode voltage is 1.25V, duty cycle is 50%, differential input swing is 270mV. Data speed is 10MHz, 33MHz, 67MHz. There is a different way to estimate the maximum data speed of the receiver. The internal delay is caused by the fact that it takes some time for the circuit to get to the turn-off point. The circuit does not respond properly if the input signal jumps to adjacent logic state and returns back faster than the internal delay time. Thus the OutCMOS LVDS_InP LVDS_InN Com . mode = 1.75V Internal delay = 9.4ns Fmax 50MHz OutCMOS Fig.10 Operation of the receiver in DC-coupling mode. Data speed is 10MHz, duty cycle is 50%, differential input swing is 270mV, common mode voltage is 0.75V, 1.25V and 1.75V. Figure 11 shows the receiver behavior when differential swing at the input is getting lower (data speed is 10MHz, common mode voltage is 1.25V). We notice some worsening of the high-speed properties down to 45MHz at the swing value of 100mV. 6 Diff. Swing = 270mV LVDS_InP LVDS_InN Com . mode = 1.25V Internal delay = 8.6ns Fmax 60MHz +26mV LVDS_InP - LVDS_InN -23mV OutCMOS OutCMOS Diff. Swing = 150mV LVDS_InP LVDS_InN Internal delay= 10.4ns Fmax 50MHz AC-coupling mode. OutCMOS Diff. Swing = 100mV LVDS_InP LVDS_InN Internal delay= 11.6ns Fmax 45MHz Fig.12 Operation of the receiver in DC-coupling mode. DC hysteresis is 25mV. High-speed properties of the receiver in ACcoupling mode are quite similar to those in DC-coupling mode (see Fig.13) (Cin=240pF, duty cycle is 50%, differential input swing is 360mV). The circuit can operate at 50MHz data speed. Diff. Swing = 360mV LVDS_InP LVDS_InN Freq = 20 MHz OutCMOS OutCMOS Fig.11 Operation of the receiver in DC-coupling mode. Data speed is 10MHz, duty cycle is 50%, common mode voltage is 1.25V. Differential input swing is 270mV,150mV, 100mV. Input differential overdrive at the moment when the output turns off give magnitude of DC hysteresis (see Fig.12). The DC hysteresis have been found as deep as 25mV (simulations gave slightly different value 30mV). LVDS_InP LVDS_InN Freq = 52 MHz OutCMOS Fig.13 Operation of the receiver in AC-coupling mode. Duty cycle is 50%, differential input swing is 270mV. Data speed is 20MHz, 50MHz. 7 As already mentioned, in AC-coupling mode, the differential swing needs to be consistent with the quiescent voltage levels at the inputs of the receiver to make it switch (see Fig.14) (Cin=240pF, duty cycle is 50%, data speed is 10MHz). The minimum value if the swing is 220mV. With such a swing the receiver can operate at most at 30MHz data speed. LVDS_InP LVDS_InN Initial state Minimum Diff. Swing = 220mV OutCMOS LVDS_InP LVDS_InN ResetAC INV min 1us Internal delay= 16ns Fmax 30MHz Fig.15 Operation of the receiver in AC-coupling mode. Testing of the reset functionality. OutCMOS Fig.14 Operation of the receiver in AC-coupling mode. Duty cycle is 50%, data speed is 10MHz. Minimum differential input swing is 220mV Table1 presents values of the quiescent voltage levels at the inputs of the receivers. They characterize performance of the self-biasing chain. The levels are good matching although for a definite conclusion statistics is low. V(LVDS_InP)=1.41V0.02V V(LVDS_InP)=1.07V0.03V. Chip number 1 4 Table 1. Channel LVDS_InP TMS TCK TRST TMS TCK TRST 1.43V 1.43V 1.42V 1.43V 1.39V 1.43V The receiver demonstrates sound operation under different supply voltages (see Fig.16) (data speed is 10MHz, differential swing 360mV). VDD=2.2V LVDS_InP LVDS_InN OutCMOS Internal delay 8ns Fmax 60MHz VDD=2.5V LVDS_InN 1.08V 1.09V 1.04V 1.09V 1.04V 1.07V LVDS_InP LVDS_InN OutCMOS Internal delay 8 ns Fmax 60MHz VDD=2.8V Tests of the reset functionality have been described in Figure 15. An extra inverter in front of ResetAC input makes the low state active. With Cin=240pF it takes at least 1us to set the receiver into the initial logic state. LVDS_InP LVDS_InN OutCMOS Internal delay 8 ns Fmax 60MHz Fig.16 Operation of the receiver in AC-coupling mode. Duty cycle is 50%, data speed is 10MHz. Supply voltage (VDD) is 2.2V, 2.5V, 2.8V. 8 Ripples on the supply voltage do not seem to be a matter for concern as long as they do not influence the operation properties. (see Fig.17) (VDD is 2.5V 100mV). has the maximum value and differential sweep is the minimum the overdrive is 280mV. That is sufficient to make the receiver to switch. 0.92V+(1.31V-0.98V)-[1.3V-(1.31V-0.98V)]=280mV. Table 2. VDD=2.5 100mV LVDS_InP LVDS_InN Process deviation +1.5 0 -1.5 LVDS Driver with a N-well reference resistor LVDS Driver with a Polysilicon reference resistor LVDS Receiver (modified) UoutP UoutN UoutP UoutN 1.44V 1.00V 1.41V 1.01V LVDS_ InP 1.26V LVDS _InN 1.49V 48ua 1.34V 1.01V 1.36V 1.00V 1.1V 1.4V 47ua 1.28V 1.03V 1.31V 0.98V 0.92V 1.3V 46ua Iref OutCMOS Conclusion Fig.16 Operation of the receiver in AC-coupling mode with 200mV ripples on the power supply rail. Effect of the fabrication process variations. High yield of the chips is one of the main objectives to fulfill. Fabrication process instability spoils performance of the circuit in some cases even so far that it has no use. We have carried out corner analysis to make sure that the circuit is fully operational in the range 1.5 (yield 86%). Both LVDS Driver and LVDS Receiver are involved into data transfer. As was found, the Driver output current deviates a lot within from the nominal value. This caused by a variation of value of the N-well resistor that is a reference component for the output current. The stability is much better if the OP (P+ poly) resistor is used instead of the N-well resistor. (see Table 2). The Gate-to-source voltage of MOS transistors heavily depends on the process variation. That can put current reference circuit of the receiver out of the normal operation. After a modification of the circuit it will deliver a steady current across the mentioned process variation (see Table2). Nevertheless, the quiescent voltage levels at the receiver inputs are not completely stable (see Table 2). This occurs due to variation of voltage drop in ZVT MOS transistors in the Level Adaptor block (see Fig.5). In the worst case of AC-coupling mode when the gap between the quiescent voltages at the receiver input We have designed and tested a Low Power LVDS Receiver capable to operate in both AC-coupling mode and DC-coupling mode. The following specifications have been disclosed (see Table 3). Table3. Specifications. Power consumption 429uA 2.5V (simulation) =1.073mW Nominal data rate 10MHz Maximum data rate 50MHz Common mode range of 1.25V0.5V operation Single power supply (VDD) 2.5V Differential swing in DC100mV coupling mode. DC-hysteresis 25mV Precision of the input voltage VH - VL =350mV level setting in AC-coupling 70mV mode. (VH + VL)/2 =1.25V 150mV Differential swing in AC220mV coupling mode. Enable/disable functionality yes In the forthcoming submission we are going to modify the circuit in order to avoid improper operation within expected range of the fabrication process variation (1.5, yield 86%). Besides, it seems reasonable to design a separate DC version of the receiver as long as self-biasing chain is not needed in this case. We can save power and eliminate destruction of the input impedance by the positive feedback. 9