Solar Cell Fundamentals Lab Lecture 5C Phosphorus doping with spin on revised 9-15-2014

advertisement
I have seen this happen !
You have exceeded your
storage allocation
Creating a n-p junction on a
p-type silicon wafer
A n-p junction is a diode and a
solar cell
It can also be the start of a n-p-n
bipolar transistor or a FET
transistor
Starting with a n-type wafer would
create a p-n junction
When creating a doped
junction in silicon
There are two situations
• Using a limited source
• Using a infinite source
Each situation has a different
mathematical
calculation
to
determine diffusion depth
With an infinite source, the
dopant is constantly supplied
Example – phosphorus gas
continually supplied
P
P
P
P
P
P P P P P
P P P P P P P
P P P P P P P P P P P P
Clean silicon wafer
P-type
With an limited source, the
dopant has a fixed amount
available
Example – spin on phosphorus film
P
P
P
P
P
P
P
P
P
P
Clean silicon wafer
P-type
P
P
For the solar cell being
fabricated for this lab
The following will apply
Start with a clean p-type
silicon wafer
Clean silicon wafer
P-type
A SiO2 layer is deposited via
PECVD on the backside to
prevent backside doping
Clean silicon wafer
P-type
Backside SiO2
Using a liquid n-type
phosphorus spin on dopant, a
layer of phosphorus is left on
the surface
Spin on phosphorus (n) dopant
Clean silicon wafer
P - type
Backside SiO2
To avoid contamination, a separate
spinner is used for the spin on dopants
Spin at 3 KRPM
for 20 seconds.
Spin is preset for
correct
conditions
Wafer held
with vacuum.
Vacuum
switch is
located on
control panel
This spinner is located in the yellow
room closest to the garment change out
room
Liquid dopants are located in the dry
box. Use P509 and always check the
expiration date
Use P509 –
expiration date
1-30-2012
High temperature tube furnace
for 9500C diffusion
Furnace #6 is for phosphorus doping only.
Do not cross contaminate apparatus and
tweezers. Verify correct temperature before
using
0
950 C
After diffusion @
a
n-region is created in the
silicon. Time and temperature
determine the depth of the
n doped region
n doped silicon
--------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
P doped silicon
Backside SiO2
An HF etch removes any
residual phosphorus on the
surface and the backside SiO2
n doped
-------------------------------------------------------------------------------------------------------------------------------------------------
P-doped
A n/p junction has been
formed
n doped
-------------------------------------------------------------------------------------------------------------------------------------------------
P-doped
Solid phosphorus sources are
available
Liquid POCl3 with a nitrogen carrier gas
is also used as a phosphorus dopant.
POCl3 will form HCl on exposure to moist air or
water !
Nitrogen
carrier gas in
To high
temperature
furnace
tube
Constant
temperature cooler
(200C)
A photo-mask will need to be
created using AutoCAD
Due to the current limitations on
the tester in the clean room, cell
size is limited to a maximum of
10 cm2
Current solar light simulator in
Cameron clean room with Keithley
4200 I/V tester @ 1 amp max
Example of a photo-mask
transparency
AutoCAD dimension drawing
must be submitted for approval
• Dimension Drawing is due in 2 weeks
• Any pattern for top side conductor is
acceptable. Multiple top side conductor
patterns preferred
• Cell size can vary from 2 cm2 to 10cm2
• Patterns must be in-line to cut with the
dicing saw
A new solar cell tester will be
available in EPIC with higher
current capability (10 amp)
The new tester will provide the
capability to test standard size
industrial cells
125mm x 125mm
cell
Download