Subject Group of Materials Science and Engineering
3616
Analysis of Nano-structural Materials
Winter
Description and rationale: First, the kind of the defects in materials and some observation/analysis method of
their structures are studied. A mechanism and image formation principle of transmission electron microscopy
(TEM) to the nanostructure analysis on the materials are sequentially studied. Students will learn the TEM
contrast theorem which includes the diffraction contrast and the phase contrast, the observation technique of
various defects and the relation to the image formation condition, and understand basics and applications of
various spectroscopy with TEM.
Keywords: Crystalline Structure, Lattice Defect, Transmission Electron Microcopy (TEM), Electron Diffraction,
Diffraction and Phase Contrast, Energy Dispersive X-ray Spectroscopy (EDS), Electron Energy-Loss Spectroscopy
(EELS)
Pre-requisite: applied mathematics, fundamentals of material physics, fundamentals of crystallographics
Expected students: master and doctoral
Instructor: Assoc. Prof. Naoyuki HASHIMOTO (hasimoto@eng.hokudai.ac.jp),
Assoc. Prof. Norihito SAKAGUCHI (sakagu@ufml.cret.hokudai.ac.jp)
Course Outline:
1.
Defects in Metals
2.
Observation and Analysis of Defect Structures.
3.
Crystal Structure and Structure Factor
4.
Hardware of Transmission Electron Microscope
4.1 Components of TEM
4.2 Mechanism of electron lens
4.3 Feature of electron gun
Basics of Electron Diffraction
5.1 Bragg’s law and Laue equation
5.2 Dynamical diffraction theory
Diffraction Contrast
6.1 Bright- and dark-field imaging
6.2 Analysis of defects by TEM
Phase Contrast
7.1 Formation of phase contrast and structure image
7.2 Multi-slice (MS) method and its applications
Analytical TEM Method
8.1 Energy-dispersive X-ray spectroscopy (EDS)
8.2 Electron energy-loss spectroscopy (EELS)
5.
6.
7.
8.
Grading: 30% class participation
60% final report
10% oral examination
Textbooks and references: Handouts are provided at lecture and references are given below.
1) Electron Microscopy of Thin Crystals, P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley, M.J. Whelan, Krieger
Publishing Company
2) Transmission Electron Microscopy: A Textbook for Materials Science, D.B. Williams, C.B. Carter, Springer
1/2010