Midterm exam II
Electron Microscopy and Microanalysis in Electron Microscopy (PVZ)
1. Derive the resolution of SEM (write an expression).
2. Estimate the maximal resolution in electron microscopy.
3. Describe the difference between SEM and TEM including difference in resolutions
4. Give definitions of the elastic and inelastic scatterings.
5. Describe interaction of electrons with a matter in an electron microscope.
6. Describe the “backscattered electrons” contrast in SEM.
7. Describe the “secondary electrons” contrast in SEM
8. Describe the Electron Diffraction in TEM.
9. Describe Focused Ion Beam (FIB) technique in TEM.
10. Write down Moseley law and describe its application for elemental analysis
11. Describe main postulates of Bohr model of an atom.
12. Provide definition of all quantum number from the Bohr Model of the atom
13. Nomenclature for Principle X-ray Emission Lines
14. Describe EDS technique in SEM
15. Describe WDS technique in Microprobe analysis
16. Provide an comparison of the EDS and WDS techniques
17. Describe basic principles of the Electron Energy Loss Spectroscopy (EELS)
Atomic force microscopy
1. Describe the principles of operation of an atomic force
2. Describe the principles of operation of a tunneling microscope
3. Determine the resolution of the atomic force microscope
4. Describe the contrasts of the atomic force microscope
5. Describe the contrasts of the tunneling microscope
X-ray Diffraction
1. What is the wavelength of x-rays?
2. Give a definition of the powder x-ray diffraction
3. Give a definition of the x-ray diffraction from crystals
4. Derive Bragg’s equation
5. Give a definition of a crystal
6. Give a definition of the unit cell
7. Name seven lattice systems
8. Describe three types of cubic cell
9. Describe four types of crystals
10. Give a definition of Miller’s indexes