科目名
Course title
Analysis of Nano-structural Materials [ナノ構造解析学 E]
講義題目
Subtitle
責任教員
Instructor-in-charge
橋本 直幸 (工学研究院材料科学部門) Email: hasimoto@eng.hokudai.ac.jp
Naoyuki HASHIMOTO [Division of Materials Science and Engineering]
担当教員
Other instructors
坂口 紀史 (工学研究院材料科学部門) Email: sakagu@ufml.cret@eng.hokudai.ac.jp
科目種別
Class specification
工学院専門科目 Engineering
Norihito SAKAGUCHI [Division of Materials Science and Engineering] - Part 2
開講年度
Academic year
授業形態
Class type
対象学科・クラス
Eligible department/class
2011
開講学期
Semester
講義
単位数
Credits
補足事項
Other information
Lecture
Winter
2 学期
時間割番号
e3 Course No.
3616
2
対象年次
Expected students
MC1 ～ DC3
キーワード Keywords:
Crystalline Structure, Lattice Defect, Transmission Electron Microcopy (TEM), Electron Diffraction, Diffraction and Phase Contrast,
Energy Dispersive X-ray Spectroscopy (EDS), Electron Energy-Loss Spectroscopy (EELS)
授業の目標 Objectives:
First, the kind of the defects in materials and some observation/analysis method of their structures are studied. A mechanism and
image formation principle of transmission electron microscopy (TEM) to the nanostructure analysis on the materials are sequentially
studied. Students will learn the TEM contrast theorem which includes the diffraction contrast and the phase contrast, the observation
technique of various defects and the relation to the image formation condition, and understand basics and applications of various
spectroscopy with TEM.
到達目標 Goals:
授業計画 Outline:
1.
2.
3.
4.
5.
6.
7.
8.
Defects in Metals
Observation and Analysis of Defect Structures.
Crystal Structure and Structure Factor
Hardware of Transmission Electron Microscope
1. Components of TEM
2. Mechanism of electron lens
3. Feature of electron gun
Basics of Electron Diffraction
1. Bragg’s law and Laue equation
2. Dynamical diffraction theory
Diffraction Contrast
1. Bright- and dark-field imaging
2. Analysis of defects by TEM
Phase Contrast
1. Formation of phase contrast and structure image
2. Multi-slice (MS) method and its applications
Analytical TEM Method
1. Energy-dispersive X-ray spectroscopy (EDS)
2. Electron energy-loss spectroscopy (EELS)
成績評価の基準と方法 Grading:
30% class participation
60% final report
10% oral examination
テキスト・教科書 Textbooks: Handouts are provided at lecture.
講義指定図書 References:
1)
2)
Electron Microscopy of Thin Crystals, P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley, M.J. Whelan, Krieger Publishing
Company
Transmission Electron Microscopy: A Textbook for Materials Science, D.B. Williams, C.B. Carter, Springer
参照ホームページ Website:
受講条件 Pre-requisite: applied mathematics, fundamentals of material physics, fundamentals of crystallographics