Customer Requirement:
Well-defined method of nanowire production that repeatedly produces aligned ZnO nanowires.
Weighting:
7/100
Engineering Requirement:
Hexamethylene tetramine, Zinc Nitrate Hydrate and Polyethylene imine concentrations, amount of DI water, heating mechanism,
duration and temperature must be specified. The samples should be consistent in length, density, aspect ratio and alignment.
Required
Materials
System Test:
1. Prepare 5 samples from different growth batches using chosen growth parameters.
2. Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
3. Take images of samples. The images should not be corrupted due to charging effects, that comparisons will have to be performed at consistent
magnification and that images must be representative of the sample.
4. Evaluate images.
Pass: Research professor signs off below that there is sufficient evidence provided through SEM images that the chosen process parameters yield consistent
samples.
Fail: Not enough evidence is provided to convince the research professor that consistency between samples was achieved.
______________________________________________
Research Professor’s Signature of Approval
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 1 of 32
Customer Requirement:
Zinc oxide nanowires should have dimensions suitable for piezoelectric energy harvesting.
Weighting:
7/100
Engineering Requirement:
Nanowire at least 1 um in length and have an aspect ratio of at least 10:1.
Required
Materials
System Test:
1. Prepare sample using chosen growth parameters.
2. Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
3. Take images of samples. The images should not be corrupted due to charging effects, that comparisons will have to be performed at consistent
magnification and that images must be representative of the sample.
4. Study images. Use measurement tools to show length and widths of nanowires on SEM images.
Pass: SEM images show that nanowires are longer than 1 um -AND- that the aspect ratio is greater than 10:1.
Fail: Nanowires are less than 1 um long -OR- the aspect ratio is less than 10:1.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 2 of 32
Customer Requirement:
Nanowire density must be low enough to allow movement in the wires but high enough to ensure output that it is detectable.
Weighting:
7/100
Engineering Requirement:
Nanowire density should be between 10 – 50 µm-2 to allow for sufficient bending in nanowires to produce a piezoelectric output
current.
Required
Materials
System Test:
1. Prepare sample using chosen growth parameters.
2. Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
3. Take five representative images of sample. The images should not be corrupted due to charging effects, that comparisons will have to be performed at
consistent magnification and that images must be representative of the sample.
4. Study images. Use Paint to analyze the density of the nanowires over the surface of the samples:
i. Use scale bar on image to determine the conversion factor between pixels and µm.
ii. Draw a unit square (size will vary with image magnification) and count the number of nanowires within the square.
iii. Average density values from the five images.
Pass: SEM images and analysis show that average nanowire density is between 10 – 50 µm-2.
Fail: SEM images and analysis are not conclusive -OR- average nanowire density is less than 10 µm-2 OR greater than 50 µm-2.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 3 of 32
Customer Requirement:
Seed layer must be strongly attached to Kevlar to ensure durability.
Weighting:
15/100
Engineering Requirement:
Adhesion of seed layer to Kevlar can withstand actuation for 100 cycles without showing signs of separation.
Required
Materials
System Test:
1.
2.
3.
4.
Take images of seed layer of one Kevlar sample from growth batch.
Use another Kevlar strand to be actuated for 100 cycles.
Prepare actuated sample for SEM imaging.
Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
5. Take images of samples. The images should not be corrupted due to charging effects, that comparisons will have to be performed at consistent
magnification and that images must be representative of the sample.
6. Study images. Seed layer should be firmly attached to Kevlar.
Pass: SEM images and analysis show no damage to the seed layer (peeling, cracking, etc.)
Fail: SEM images and analysis show damage to the seed layer (peeling, cracking, etc.)
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 4 of 32
Customer Requirement:
Picoammeter circuit must accurately be able to measure expected current output from nanowires.
Weighting:
15/100
Engineering Requirement:
Picoammeter circuit must accurately be able to measure in 50 pA quantities to adequately test nanowires output.
Required
Electrical
System Test:
1.
2.
3.
4.
Create current source circuit which can produce a reliable output.
Connect circuit to picoammeter in series.
Measure output.
Compare experimental results with expected output current from circuit and HP4140B.
Pass: The picoammeter can successfully measure currents in 50 pA quantities.
Fail: The picoammeter cannot successfully measure currents in 50 pA quantities.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 5 of 32
Customer Requirement:
Sample rate of electrical measurements must ensure sampling at a rate much greater than the input frequency from the actuator.
Weighting:
7/100
Engineering Requirement:
Sample rate of electrical measurements must be a minimum of 1 kHz.
Required
Electrical
System Test:
1. Connect measurement circuit to the current generator described in the previous test.
2. Take measurements for one minute.*
3. From waveform, count number of acquired data points and confirm that data was sampled at a rate of at least 1kHz.
* Measurements will be tracked by using an oscilloscope.
Pass: Sampling frequency is calculated to be at least 1 kHz.
Fail: Sampling frequency is calculated to be less than 1 kHz.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 6 of 32
Customer Requirement:
Kevlar attachment to mechanical actuator must allow for replacement of different samples.
Weighting:
15/100
Engineering Requirement:
Kevlar replacement process must be able to be completed in one hour or less.
Required
Mechanical
System Test:
1.
2.
3.
4.
Detach electrical measurement probes from the testing apparatus.*
Unclamp the Kevlar sample and remove from testing apparatus.
Securely clamp new Kevlar fiber onto the actuation head.
Attach electrical measurement probes to the Kevlar samples.*
* This will not be necessary if electrical measurement probes do not connect directly to Kevlar.
Pass: Complete replacement of Kevlar in one hour or less.
Fail: Fail to replace Kevlar sample in the one hour time frame.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 7 of 32
Customer Requirement:
Actuator must have positional precision to a degree in which the error is a negligible factor of the actuation length.
Weighting:
5/100
Engineering Requirement:
Mechanical actuator must have positional precision of at least 0.1 mm so as to make a repeatable set of input forces.
Required
Mechanical
System Test:
Voice Coil:
1. Use software to program voice coil positions.
2. Analyze logged data and check bits to ensure 0.1mm or better accuracy.
-ORGeneral Positional Accuracy:
1. Set actuation device to predetermined position.
2. Set a block using calipers at 0.1mm greater than a position for the actuator to move to.
3. Move the actuator to the new position.
4. Use calipers to determine distance from the block.
Pass: Actuator performs functions as programmed.
Fail: Actuator does not perform a programmed function as expected.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 8 of 32
Customer Requirement:
Electrical measurements should not be hindered by adverse effects from a motor.
Weighting:
7/100
Engineering Requirement:
Mechanical system should not interfere with electrical measurements, ie. any EMI (Electromagnetic Interference) from a motor
should be filtered out to an order of magnitude less than expected output current values.
Required
Mechanical
System Test:
1.
2.
3.
4.
5.
6.
7.
8.
Prepare two Kevlar fiber samples with a zinc oxide seed layer, but without nanowire growth.
Clamp this pair of fibers to the actuation mechanism.
Attach electrical measurement probes to the Kevlar.
Program an actuation sequence.
Analyze any observed current waveform.
Characterize noise produced by zinc oxide coated sample using three test runs.
As a second test, prepare copper wire for actuation.
Repeat steps 2 through 6 for the copper wire.
Pass: Research professor signs off that the observed waveform is negligible -OR- can be mathematically removed during analysis.
Fail: Research professor does not sign off observed waveform is not negligible -OR- cannot be mathematically removed during analysis.
______________________________________________
Research Professor’s Signature of Approval
.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 9 of 32
Customer Requirement:
Pull on Kevlar should be large enough that the nanowires are bent relative to one another, but not large enough as to damage the
Kevlar or nanowires.
Engineering Requirement:
Pull on Kevlar should be adjustable (from 0.2 to 5 mm if necessary) to find an optimal stroke that stresses system without
permanently damaging the Kevlar and nanowires.
Weighting:
5/100
Required
Mechanical
System Test:
1.
2.
3.
4.
5.
6.
7.
Set a block using calipers a distance of 0.2 mm from the actuation head.
Move the actuation head to the 0.2 mm point.
Verify the actuator position using calipers.
Set a block using calipers a distance of 5 mm from the actuation head.
Move the actuation head to the 5 mm point.
Verify actuator position using calipers.
Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
8. Take images of samples. The images should not be corrupted due to charging effects, that comparisons will have to be performed at consistent
magnification and that images must be representative of the sample.
9. Evaluate images.
Pass: Actuation device is able to vary the pulling distance from 0.2 mm to 5 mm. The Kevlar and zinc oxide seed layer are not damaged at optimized stroke.
Fail: Actuation device is unable to vary the pulling distance of 0.2mm to 5 mm -OR- an optimal stroke cannot be found.
______________________________________________
Research Professor’s Signature of Approval
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 10 of 32
Customer Requirement:
Mechanical actuation system should have a variable low frequency range.
Weighting:
5/100
Engineering Requirement:
Mechanical actuation system must have a variable frequency of 1 – 20 Hz at optimized stroke.
Required
Mechanical
System Test:
1.
2.
3.
4.
5.
6.
Design a sensor circuit which will measure each wave cycle of an actuation sequence.
Build the fore mentioned circuit.
Orient the sensor so as to detect the actuation waveform.
Program the actuator for frequencies of 1 and 20 Hz.
Activate the actuation device and run for 1 minute at each frequency.
Analyze the output waveforms from the sensor circuit.
Pass: Mechanical actuation system is able to perform actuation at frequencies of 1and 20 Hz.
Fail: Mechanical actuation system does not have a variable frequency -OR- is unable to actuate with frequencies of 1and 20 Hz.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 11 of 32
Customer Requirement:
Analysis and theory of results.
Weighting:
5/100
Engineering Requirement:
Resulting currents seen experimentally should be explained through small-scale physics and characterizing equations.
Required
General
System Test:
1. If a current output is measured, provide a convincing argument that this current is coming from the wires.
2. If there is no output current measured, explain why this is occurring.
3. Data should be sufficient enough to back-up theory and analysis.
Pass: Research professor finds analysis of results accurate and adequate.
Fail: Research professor does not find analysis complete or satisfactory.
______________________________________________
Research Professor’s Signature of Approval
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 12 of 32
Customer Requirement:
Examine possible alternative materials such as polyethylene fibers instead of Kevlar, other piezo materials rather than ZnO,
aluminum rather than gold for a Schottky barrier, etc.
Engineering Requirement:
Examine alternative materials for energy generation and tabulate a comparison of results.
Weighting:
10/50
Desired
Materials
System Test:
1. Growth methods for different substrate or nanowires materials are detailed.
2. Test results exist for any additional materials that were explored.
3. Comparisons have been made between ZnO Kevlar with Au Schottky and the alternative.
Pass: Alternative materials have been explored and tested to the satisfaction of research professor.
Fail: No alternatives were explored -OR- they were not explored sufficiently and to the satisfaction of research professor.
______________________________________________
Research Professor’s Signature of Approval
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 13 of 32
Customer Requirement:
Compare results from piezoelectric and non-piezoelectric growth materials.
Weighting:
5/50
Engineering Requirement:
Comparison of piezoelectric ZnO nanowires to a non-piezoelectric material. Analyze results to determine if this additional data
supports findings from piezoelectric wires.
Desired
Materials
Test:
1.
2.
3.
4.
5.
Non-piezoelectric material chosen with a known method of nanowires growth compatible with Kevlar substrate.
Growth method characterized, samples from method are made.
Test using identical procedures that were developed for ZnO-coated Kevlar.
Analysis has been completed with identical figures of merit to ZnO-coated Kevlar.
Conclusions from analysis can be used to either support or disprove ZnO nanowires can generate energy from piezoelectric strain.
Pass: Non-piezoelectric material was tested. Research professor believes results are conclusive.
Fail: No tests on non-piezoeletric material performed -OR- results inconclusive to research professor.
______________________________________________
Research Professor’s Signature of Approval
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 14 of 32
Customer Requirement:
Nanowires should be 3µm long with an aspect ratio over 100:1. These would most likely improved results.
Weighting:
10/50
Engineering Requirement:
Nanowires should be 3µm long with an aspect ratio over 100:1.
Desired
Materials
System Test:
1. Prepare sample from chosen growth experiment.
2. Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
3. Take images of samples. The images should not be corrupted due to charging effects, that comparisons will have to be performed at consistent
magnification and that images must be representative of the sample.
4. Study images. Use measurement tools to show length and widths of nanowires on SEM images.
Pass: SEM images show that nanowires are longer than 3 um -AND- that the aspect ratio is greater than 100:1.
Fail: Nanowires are less than 3 um long -OR- the aspect ratio is less than 100:1.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 15 of 32
Customer Requirement:
Electrical measurements sampled at frequency that will better show any spikes in current as the system tries to reach equilibrium.
Weighting:
5/50
Engineering Requirement:
Electrical measurements sampled at 0.5 MHz or higher.
Desired
Electrical
System Test:
1. Connect measurement circuit to the current generator described in the previous test.
2. Take measurements for one minute.*
3. From waveform, count number of acquired data points and confirm that data was sampled at a rate of at least 1kHz.
* Measurements will be tracked by using an oscilloscope.
Pass: Sampling frequency is calculated to be at least 0.5 MHz.
Fail: Sampling frequency is calculated to be less than 0.5 MHz.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 16 of 32
Customer Requirement:
Adjust mechanical actuation frequency to a higher range and determine the effects of higher frequencies on material breakdown.
Weighting:
5/50
Engineering Requirement:
Change mechanical actuation frequency to 100 – 200 Hz.
Desired
Mechanical
System Test:
1.
2.
3.
4.
Orient the sensor from minimum requirements so as to detect the actuation waveform.
Program the actuator for frequencies 100 and 200 Hz.
Activate the actuation device and run for 1 minute at each frequency.
Analyze the output waveforms from the sensor circuit.
Pass: Mechanical actuation system is able to perform actuation at frequencies of 100 and 200 Hz.
Fail: Mechanical actuation system does not have a variable frequency -OR- is unable to actuate with frequencies of 100 and 200 Hz.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 17 of 32
Customer Requirement:
Entire system portable and stable enough to exhibit a working test procedure at Engineering Expo.
Weighting:
15/50
Engineering Requirement:
System components must be able to be carried by an individual. Measurements made should still be conclusive and satisfy all
minimum requirements despite not being in a low-noise environment.
Desired
General
System Test:
1. Each system component shall weigh no more than 35 lbs.
2. Perform standard test procedure in any room specified by course instructor.
Pass: System components weight less than 35 lbs. -AND- test results do not disagree with previous results in controlled environment.
Fail: One or more system components weigh 35 lbs. -OR-test results disagree with previous results.
Mentor Signature:____________________ Group Signatures: _____________________________________________________________________________
Page 18 of 32
Block to be Tested: TEOS (Seed Layer Coating)
Test Dependencies: None
Testing Equipment:
1. Scanning Electron Microscope
2. Samples
3. Sample preparation tools
4. Computer measurement software
Test Procedure:
1. Prepare sample from chosen growth experiment.
2. Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
3. Take images of samples. The images should not be corrupted due to charging effects, that comparisons will have to be performed at consistent
magnification and that images must be representative of the sample.
4. Study images. Use measurement tools to show step height of TEOS layer over Kevlar.
Pass: SEM images show that TEOS layer is present on Kevlar sample.
Fail: SEM images show that TEOS layer is not present on Kevlar sample.
Responsible Party: Ashley Mason Group Signatures: _____________________________________________________________________________
Page 19 of 32
Block to be Tested: ALD (Seed Layer Coating)
Test Dependencies: None
Testing Equipment:
1. Ellipsometer
2. Wafer coupons
3. Kevlar samples
Test Procedure:
1. Prepare Kevlar sample and wafer coupon for seed layer deposition.
2. Use Atomic Layer Deposition to grow a seed layer on both the Kevlar sample and the wafer coupon.
Note: Due to the similarity of growth mechanisms between samples when a seed layer is successfully grown on the wafer,
the seed layer will have also successfully grown on the Kevlar sample.
3. Using the ellipsometer measure the thickness of the seed layer grown on the wafer coupon.
Pass: Ellipsometer shows that a seed layer has been grown on the wafer coupon.
Fail: Ellipsometer cannot measure seed layer thickness -OR- shows that a seed layer was not grown.
Responsible Party: Ashley Mason Group Signatures: _____________________________________________________________________________
Page 20 of 32
Block to be Tested: Hydrothermal Nanowire Growth
Test Dependencies: None
Either Hot Plate or Microwave growth method can be used
 Depicted by “OR” in block diagram.
Testing Equipment:
1. Scanning Electron Microscope
2. Samples (Can be Kevlar or wafer coupons)
3. Sample preparation tools
4. Computer measurement software
Test Procedure:
5. Prepare sample using chosen growth parameters.
6. Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
7. Take images of samples. The images should not be corrupted due to charging effects, that comparisons will have to be performed at consistent
magnification and that images must be representative of the sample.
8. Study images. Use measurement tools to show length and widths of nanowires on SEM images.
Pass: SEM images shows nanowire growth.
Fail: SEM images show that nanowires have not been successfully grown.
Responsible Party: Ashley Mason Group Signatures: _____________________________________________________________________________
Page 21 of 32
Block to be Tested: Kevlar Strand
Test Dependencies: None
Testing Equipment:
1. Scanning Electron Microscope
2. Kevlar samples
3. Sample preparation tools
Test Procedure:
1. Prepare sample using chosen growth parameters.
2. Properly mount samples for high quality SEM images. Previous mounting steps were as follows:
i. Firmly attach copper grounding straps to SEM stage.
ii. Apply carbon tape to stage on top of copper grounding straps.
iii. Attach sample to carbon tape and press firmly on Kapton tape which is still connected to ends of samples.
iv. Firmly attach additional copper grounding straps covering Kapton tape to keep samples from drifting during imaging.
v. Coat entire stage with carbon to hopefully decrease charging of the sample.
vi. Follow proper steps for traditional SEM equipment use and imaging.
3. Take images of samples. The images should not be corrupted due to charging effects, that comparisons will have to be performed at consistent
magnification and that images must be representative of the sample.
4. Study images.
Pass: SEM images shows Kevlar samples with ZnO nanowires grown on them.
Fail: SEM images show that Kevlar samples have not yielded successful nanowire growth.
Responsible Party: Ashley Mason Group Signatures: _____________________________________________________________________________
Page 22 of 32
Block to be Tested: Au Coated Kevlar Strand
Test Dependencies: None
Testing Equipment:
1. X-ray Diffraction (XRD)
2. Kevlar samples coated with Au
3. Sample preparation tools
Test Procedure:
1. Prepare sample using chosen growth parameters.
2. Analyze sample using XRD
3. Examine output data describing electron densities to determine if ZnO nanowires on Kevlar were successfully coated with Au.
Pass: XRD data shows that Au was successfully applied to ZnO nanowires.
Fail: XRD is inconclusive -OR- shows there is no Au coating.
Responsible Party: Ashley Mason Group Signatures: _____________________________________________________________________________
Page 23 of 32
Block to be Tested: Probes (Picoammeter)
Test Dependencies: None
Testing Equipment:
1. Digital Multimeter (DMM)
2. Impedance Analyzer
Test Procedure:
5.
6.
7.
8.
Attach probes to DMM terminals.
Measure and record resistance across probes.
Remove probes from DMM and attach to impedance analyzer.
Measure and record impedance at frequencies up to 1 kHz.
Pass: All resistance and impedance measurements must be below 2Ω.
Fail: Measurements indicate that the impedance is greater than 2Ω.
Responsible Party: Todd Waggoner
Group Signatures: _____________________________________________________________________________
Page 24 of 32
Block to be Tested: Amplifier (Picoammeter)
Test Dependencies: Probes (Picoammeter)
Testing Equipment:
1. Precision Current Source
2. Oscilloscope
3. Probes
Test Procedure:
1.
2.
3.
4.
5.
6.
7.
8.
Attach oscilloscope probes to output of amplifier.
Measure and record voltage output of amplifier under no input condition.
Connect probes to precision current source.
Attach other end of probes to amplifier input.
Turn on current source.
Set current source to output 50 pA.
Measure and record voltage output of amplifier.
Repeat test with current source set to 100 pA and 150 pA.
Pass: Each 50 pA increment has a corresponding increase in output voltage of at least 1 mV.
Fail: One or more 50 pA increment increases output voltage by less than 1 mV.
Responsible Party: Todd Waggoner
Group Signatures: _____________________________________________________________________________
Page 25 of 32
Block to be Tested: I/O (Computer Processing)
Test Dependencies: PC (Computer Processing)
Testing Equipment:
1.
2.
3.
4.
Serial Datalogger
PC Peripherals (USB Mouse and Keyboard, Monitor, etc.)
USB Flash Drive
Oscilloscope
Test Procedure:
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
Turn on PC and monitor.
When properly booted into operating system (OS), open up Notepad or some other text editor using the mouse.
Type a sentence into Notepad.
Turn on oscilloscope.
Insert USB drive into oscilloscope and save any waveform data.
Remove drive and plug into empty PC USB port.
Open saved data in Excel or some other program that reads .csv files.
Plug datalogger into PC serial port.
Open HyperTerminal.
Connect to datalogger.
Pass:
 Monitor displays output from PC.
 Mouse cursor can move and click to open programs.
 Keyboard successfully used to display typed sentence in text editor.
 USB drive detected and contains valid oscilloscope data.
 HyperTerminal successfully interfaces with datalogger and displays its program interface.
Fail: One or more of the above tests fails or is inconclusive.
Note: If USB voice coil controller is used, do not use test steps 8 through 10. Disregard pass condition 5.
Responsible Party: Todd Waggoner
Group Signatures: _____________________________________________________________________________
Page 26 of 32
Block to be Tested: PC (Computer Processing)
Test Dependencies: I/O (Computer Processing)
Testing Equipment:
1. PC Peripherals (USB Mouse and Keyboard, Monitor, etc.)
Test Procedure:
1. Turn on PC and monitor.
2. Wait a maximum of five minutes for OS to successfully load.
3. Open up HyperTerminal and Excel.
Pass:
 Computer boots properly and user can interact with operating system within five minutes of power on.
 HyperTerminal and Excel are properly installed and open.
Fail: One or more of the above tests fails or is inconclusive.
Note: If USB voice coil controller is used, HyperTerminal is unneeded and will not be tested for functionality.
Responsible Party: Todd Waggoner
Group Signatures: _____________________________________________________________________________
Page 27 of 32
Block to be Tested: I/O (Computer Processing)
Test Dependencies: PC (Computer Processing)
Testing Equipment:
5.
6.
7.
8.
Serial Datalogger
PC Peripherals (USB Mouse and Keyboard, Monitor, etc.)
USB Flash Drive
Oscilloscope
Test Procedure:
11.
12.
13.
14.
15.
16.
17.
18.
19.
20.
Turn on PC and monitor.
When properly booted into operating system (OS), open up Notepad or some other text editor using the mouse.
Type a sentence into Notepad.
Turn on oscilloscope.
Insert USB drive into oscilloscope and save any waveform data.
Remove drive and plug into empty PC USB port.
Open saved data in Excel or some other program that reads .csv files.
Plug datalogger into PC serial port.
Open HyperTerminal.
Connect to datalogger.
Pass:
 Monitor displays output from PC.
 Mouse cursor can move and click to open programs.
 Keyboard successfully used to display typed sentence in text editor.
 USB drive detected and contains valid oscilloscope data.
 HyperTerminal successfully interfaces with datalogger and displays its program interface.
Fail: One or more of the above tests fails or is inconclusive.
Note: If USB voice coil controller is used, do not use test steps 8 through 10. Disregard pass condition 5.
Responsible Party: Todd Waggoner
Group Signatures: _____________________________________________________________________________
Page 28 of 32
Block to be Tested: Voice coil (Actuator)
Test Dependencies: None
Testing Equipment:
1. Photo detection circuit
2. Laser
3. Oscilloscope
Test Procedure:
1.
2.
3.
4.
5.
6.
7.
8.
Construct a photo detection circuit.
Connect the circuit to an oscilloscope.
Set the photo diode angled parallel to the voice coil mounting surface and directed orthogonal to the actuation direction.
Set a laser on the other side of the voice coil directed at the photo diode so that actuation motion will block and unblock the laser beam from the photo
diode during each cycle of actuation.
Set the oscilloscope to measure frequency.
Turn on the laser and begin actuation.
Adjust position of photo diode and laser so that the duty cycle is 50% ±1%.
Observe frequency on the oscilloscope and record.
Pass: The observed frequency is the programmed frequency ±5%.
Fail: The observed frequency is >5% of programmed frequency, or <5% of programmed frequency.
Responsible Party: Adam Stone
Group Signatures: _____________________________________________________________________________
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Block to be Tested: Mounting Brackets (Actuator)
Test Dependencies: Voice coil, Spring (Actuator)
Testing Equipment:
1. Calipers
Test Procedure:
1.
2.
3.
4.
Attach Kevlar fiber pair to the voice coil head and the spring on the fixed end.
Measure the length from the attachment point on the actuator head to the spring attachment point using calipers.
Run the voice coil through 100 cycles of actuation.
Measure the length of the attachment point on the actuator head to the spring attachment point.
Pass: The length measured after actuation is equal to the length measured before actuation ±5/1000 of an inch.
Fail: The length measured after actuation is more than the length measured before actuation plus 5/1000 of an inch, or is less than the length measured before
actuation minus 5/1000 of an inch.
Responsible Party: Adam Stone
Group Signatures: _____________________________________________________________________________
Page 30 of 32
Block to be Tested: Spring (Actuator)
Test Dependencies: None
Testing Equipment:
1. Calipers
Test Procedure:
1.
2.
3.
4.
5.
6.
Visually inspect the spring for deformations.
Measure the length of the spring at equilibrium.
Extend the spring a length of 5mm.
Release spring back to equilibrium.
Measure the length of the spring again.
Visually inspect the spring for deformations.
Pass: The length after extension is within 5% of the length prior to extension, and no additional deformations visible to the human eye.
Fail: The length after extension is greater than 5% or less than 5% of the length prior to extension, or there are visible deformations after extension.
Responsible Party: Adam Stone
Group Signatures: _____________________________________________________________________________
Page 31 of 32
Block to be Tested: Controller
Test Dependencies: Voice coil (Actuator)
Testing Equipment:
1. Voice coil
2. Calipers
Test Procedure:
1.
2.
3.
4.
5.
6.
Connect the controller to the voice coil.
Program one cycle of actuation for 10mm length.
Measure the actual distance travelled by the actuation head.
Program a position for the voice coil to move to.
Execute the command for the voice coil to move to the position referred to in step 4.
Measure the distance from the start position to the new position with calipers.
Pass: The voice coil head travels 10mm and returns to its original position. The voice coil head moves to the programmed position ±200nm.
Fail: The voice coil head is unable to travel 10mm. The voice coil head is unable to reach the programmed position ±200nm.
Responsible Party: Adam Stone
Group Signatures: _____________________________________________________________________________
Page 32 of 32