XPS Peak Fitting
The high-resolution XPS spectra were fit with a Shirley background. A mixed GaussianLorentzian function was used to describe the peak shape. The Si 2p lines for silicon dioxide
were fit with line-shape of GL(10), while C 1s, O 1s and N 1s were better fit with GL(30). In
curve fitting of C 1s and N 1s, components were allowed to have full widths at half maximum
(FWHM) in the range of 1.9-2.2 eV. Additionally, the position in binding energy and FWHM
of specific components were constrained to have ± 0.3 eV and ± 0.2 eV the same value,
Figure S1. Adsorption-desorption isotherm (N2, -196°C) with pore size distribution (inset A)
and low-angle XRD pattern (inset B) collected for the pristine SBA-15 silica.
Figure S2. TG curves measured for untreated SBA-15 (A), SBA-15-VTS (B) and SBA15_VTS_PNVF_x (where x = 0.05, 0.1, 0.25, 0.5, 1.0, 1.25, 1.5 or 2.5) hybrid materials (C-J),
Figure S3. XPS wide-scan spectrum of untreated silica support (A), vinyl-functionalized
SBA-15 (B), SBA-15_VTS_PNVF_2.5 (C) and SBA-15_VTS_PVAm_2.5 (D).