Supplementary Information
Strong coupling of localized plasmons and molecular excitons
in nanostructured silver films
N. I. Cade, T. Ritman-Meer, and D. Richards
AFM analysis:
A Veeco Explorer atomic force microscope (AFM) was used to characterize each film.
Figure S1: AFM scans of regions of different nominal Ag film thickness. Each image is 1.3
1.3 m with a height scale of 6 nm.
S1
SERS enhancement:
Figure S2: Raman spectra from R6G on Ag films for a range of nominal thicknesses, exciting
at A) 514nm and B) 647 nm. All spectra are uncorrected. Dashed lines give the spectra from
R6G on glass.
S2