Jesús A. del Alamo Donner Professor, MacVicar Faculty Fellow Department of Electrical Engineering & Computer Science P O STD OC TOR A L A SSOC IA T E S Alon Vardy, MIT-Technion Fellow GR ADUA T E STU D ENT S Alex Guo, EECS, NDSEG Fellowship Luke Guo, EECS, NSF Fellow Donghyun Jin, EECS, Samsung Fellow Jianqiang Lin, EECS Wenjie Lu, EECS Shireen Warnock, EECS Yufei Wu, EECS Xin Zhao, DMSE U ND ER GRA DUA T E STU DE N T S Rose Abramson, EECS V I SIT OR S Jose M. Lopez Villegas, U. Barcelona SU PP OR T STA F F Elizabeth Kubicki, Admin. Asst. II SE L E CT E D PU B LI CA TI ON S J. A. del Alamo, “Recent progress in understanding the DC and RF reliability of GaN high-electron mobility transistors,” Invited talk at Materials Research Society Spring Meeting, April 9-13, 2012. J. Lin, T.-W. Kim, D. A. Antoniadis, J. A. del Alamo, “A Self-Aligned InGaAs Quantum-Well MOSFET Fabricated through a Lift-off Free Front-end Process,” Applied Physics Express, vol. 5, p. 064002, May 16, 2012. D. Jin, J. A. del Alamo, “Mechanisms responsible for dynamic ON-resistance in GaN high-voltage HEMTs,” 24th IEEE International Symposium on Power Semiconductor Devices and ICs, June 3-7, 2012, pp. 333346. T.-W. Kim, R. J. W. Hill, C. D. Young, D. Veksler, J. Oh, C. Y. Kang, D.-H. Kim, J. A. del Alamo, C. Hobbs, P. Kirsch, R. Jammy, “InAs Quantum-Well MOSFET (Lg=100 nm) with Record High gm, fT and fmax,” 2012 Symposium on VLSI Technology, June 12-15, 2012, pp. 179-180. J. A. del Alamo, D.-H. Kim, “InAs High-Electron Mobility Transistors on the Path to THz Operation,” Invited paper at International Conference on Solid State Devices and Materials, Sept. 25-27, 2012. J. A. del Alamo, “Nanometer-Scale III-V CMOS,” Short Course on the Future of Semiconductor Devices and Integrated Circuits at 34th IEEE Compound Semiconductor IC Symposium, Oct. 14, 2012. C.-H. Lin, T. A. Merz, D. R. Doutt, J. Joh, J. A. del Alamo, U. K. Mishra, L. J. Brillson, ”Strain and temperature dependence of defect formation at AlGaN/GaN high electron mobility transistors on a nanometer scale,” IEEE Transactions on Electron Devices, vol. 59, No. 10, pp. 2667-2674, Oct.2012. J. Lin, D. A. Antoniadis, J. A. del Alamo, “Sub-30 nm In As Quantum-Well MOSFETs with Self-Aligned Metal Contacts and Sub-1 nm EOT HfO2 Insulator,” IEEE International Electron Devices Meeting, Dec. 10-12, 2012, pp. 757-760. T.-W. Kim , R. J. W. Hill, D. Kim, D.-H. Koh, R. Lee, M. H Wong, T. Cunningham, J. A. del Alamo, S. K. Banerjee, S. Oktyabrsky, A. Greene, Y. Ohsawa, Y. Trickett, G. Nakamura, Q. Li, K. M. Lau, C. Hobbs, P. D. Kirsch, R. Jammy, “ETW-QW InAs MOSFETs with Scaled Body for Improved Electrostatics,” IEEE International Electron Devices Meeting, CA, Dec.10-12, 2012, pp. 765-768. D. Jin, J. A. del Alamo, ”Impact of high-power stress on dynamic ON resistance of high-voltage GaN HEMTs,” Microelectronics Reliability, vol. 52, pp. 2875-2879 (2012). D.-H. Kim, J. A. del Alamo, D. A. Antoniadis, J. Li, J.-M. Kuo, P. Pinsukanjana, Y.-C. Kao, P. Chen, A. Papavasiliou, C. King, E. Regan, M. ±Urteaga, B. Brar, T.-W. Kim, ”Lg=60 nm recessed In0.7Ga0.3As metal-oxidesemiconductor field-effect transistors with Al2O3 insulator,” Applied Physics Letters, vol. 101, p. 223507, 2012. D.-H. Kim, T.-W. Kim, R. J. W. Hill, C. D. Young, C. Y. Kang, C. Hobbs, P. Kirsch, J. A. del Alamo, R. Jammy, ”HighSpeed E-Mode InAs QW MOSFET with Al2O3 Insulator for Future RF Applications,” IEEE Electron Device Letters, vol. 34, No. 2, pp. 196-198, Feb. 2013. A. Guo, J. A. del Alamo, “Mo/n+-InGaAs Nanocontacts for Future III-V MOSFETs,” to be presented at 25th International Conference on Indium Phosphide and Related Materials, May 19-23, 2013. FACULTY PROFILE J. A. del Alamo Compound semiconductor transistor technologies for RF, microwave and millimeter wave applications. Nanometerscale III-V compound semiconductor transistors for future digital applications. Reliability of compound semiconductor transistors. Technology and pedagogy of online laboratories for engineering education. 39-567a 253-4764 alamo@mit.edu J.A. del Alamo, theses awarded (July 2013-June 2014) Degree S.B. S.M. and M.Eng. Ph.D. Student Name Lastname, Firstname Lastname, Firstname Lastname, Firstname Lastname, Firstname Lastname, Firstname Lastname, Firstname Lastname, Firstname Department EECS EECS DMSE EECS EECS EECS MechE Note: there are no page restrictions set on this section. Thesis title Title 1 (tentative) Title 2 (tentative) Title 3 Title 4 Title 5 Title 6 Title 7 (tentative) Thesis date June 2014 (tentative) June 2014 (tentative) November 2013 August 2013 September 2013 September 2013 May 2014 (tentative)