ME 898.3 (8) Materials Characterization Techniques
Course Outline
Aims:
The aim of this course is to provide a sufficiently detailed understanding of some important materials
characterization techniques in materials study for current and future research and development
environment, as well as for industrial applications. The techniques of materials characterization and
analysis are discussed. Emphasis is on applications, but the basics of each technique are provided to
develop better understanding of how the instruments work. Current research from the literature that
makes use of the technique as an analytical tool will be discussed. Laboratory projects tailored to give
students hands-on experience will be given.
Instructor: Ike Oguocha
Room: 2B36 Engineering Building Phone: (306) 966-7832
E-Mail: iko340@engr.usask.ca
Topics:
1.
Mechanical and Electrical Characterization
Hardness measurements, mechanical testing, and electrical resistivity measurements.
2.
X-ray Diffraction
Property and production of x-ray; absorption of x-ray. Principles of x-ray diffraction, Bragg's
Law, direction of diffracted beams. Intensities of diffracted beams: scattering by an electron, an
atom, a unit cell; structure factor and its calculations; factors affecting diffracted intensity in
power diffraction - polarization-Lorentz, structure, multiplicity, absorption, and temperature
factors. Experimental methods - Laue, powder diffraction, Debye-Scherrer powder and
diffractometer. Applications of x-ray diffraction. Synchrotron x-rays.
3.
Electrons and Their Interaction with the Specimen
Electron beam generation, scattering of electrons by atoms, interaction volume, deflection of
electrons - magnetic lenses, and electron diffraction. Principles of energy dispersive x-ray
spectrometry (EDS) and wavelength dispersive x-ray spectrometry (WDS).
4.
Electron Microscopes
The scanning electron microscope (SEM), the transmission electron microscope (TEM), and the
scanning transmission electron microscope (STEM). Sample preparation for electron microscopy.
Electron micrographic techniques.
5.
Thermal analysis
Techniques of differential thermal analysis (DTA), differential scanning calorimetry (DSC),
thermogravimetry analysis (TGA), and thermomechanical analysis (TMA). Instrumentation and
applications of DTA, DSC, TGA, and TMA.
6.
Other topics
Depending on the mix of students taking the class and their research interests, additional topics
may be added during the first week of lecture.
Evaluation:
Class Assignments
Laboratory Reports
Literature Review Project*
Final Exam**
Total
15%
15%
20%
50%
100%
* No marks without class presentation.
** Part I = Closed Book (3 h); Part II = Take Home (24 h)
Note: A minimum of 70% class attendance is required.
Reference Texts:
1. D. B. Williams and C. B. Carter, Transmission Electron Microscopy, Plenum Press, New York
and London, 1996.
2. P. J. Goodhew, J. Humphreys, and R. Beanland, Electron Microscopy and Analysis, 3rd Edition,
Taylor and Francis, New York and London, 2001.
3. J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori and E. Lifshin, Scanning Electron
Microscopy and X-Ray Analysis: A Text for Biologists, Materials Scientists, and Geologists, 2nd
Edition, Plenum, New York and London, 1992.
4. I. M. Watt, The Principles and Practice of Electron Microscopy, 2nd Edition, Cambridge
University Press, New York, 1997.
5. S. J. B. Reed, Electron Microprobe Analysis and Scanning Electron Microscopy in Geology,
Cambridge University Press, New York, 1996.
6. S. L. Flegler, J. W. Heckman, Jr., and K. L. Klomparens, Scanning and Transmission Electron
Microscopy: An Introduction, Oxford University Press, 1993.
7. B. D. Cullity, Elements of X-ray diffraction, 2nd edition, Addison-Wesley Publishing Company
INC, London, 1978.
8. R. Jenkins and R. L. Snyder, Introduction to X-ray Powder Diffractometry, Wiley, New York,
1996.
9. A. D. Krawitz, Introduction to Diffraction in Materials Science and Engineering, John Wiley &
Sons, New York, 2001.
10. D. Brandon and W. D. Kaplan, Microstructural Characterization of Materials, John Wiley and
Sons, New York, 1999.
11. B. Wunderlich, Thermal Analysis, Academic Press, Boston, 1990.
12. W. W. Wendlandt, Thermal Analysis, 3rd ed. Wiley New York, 1986.
13. Other textbooks and sources (e.g. internet, journals, conference proceedings).