Oxford Materials and the Department of Chemistry are pleased to welcome Dr Curtis Marcott to
present a seminar on Tuesday 5th November 2013 entitled:
“Expanding Application for AFM-based Infrared Nanospectroscopy”
Atomic force microscope-based infrared spectroscopy (AFM-IR) has been developed in recent years
providing extremely high spatial resolution chemical characterization and imaging. The technique is
based on the combination of a tunable infrared laser with an atomic force microscope that can locally
map and measure thermal expansion of nanoscale regions of a sample resulting from the
absorption of infrared radiation. Because the AFM probe tip can map the thermal expansion on very
fine length scales, the AFM-IR technique provides a robust way to obtain interpretable IR absorption
spectra at spatial resolution scales well below the diffraction limit. The technique also provides
simultaneous and complementary mapping of mechanical properties and has been widely and
successfully applied to applications in polymers and the life sciences. Most previous AFM-IR
measurements have been performed using total internal reflection illumination from below the
sample, generally requiring samples to be prepared as thin sections transferred to an IR
transparent prism. We have recently extended the AFM-IR technique to work in a "top side
illumination" configuration. The top side illumination enables a much broader range of samples to be
measured and can in some cases dramatically simplify sample preparation. Using top side
illumination we have been able to measure samples including semiconductors, metal films,
geological samples and others.
The seminar will take place in the Oxford Room in Begbroke Science Park starting from 1.30pm.
The lecture is open to everyone, however spaces are limited so if you are interested please contact
Susan Warren or Ashley Shepherd to book a space and avoid disappointment.
susan.warren@materials.ox.ac.uk
ashley.shepherd@chem.ox.ac.uk
Refreshments will be provided.