The signature test framework involves the use of a single test configuration and predicts all of the
specifications of interest with a single high optimized input stimulus, thereby, reducing the overall test
time and test cost.
Consider variations in the process parameter space P of Figure 1 that affect the specifications of the
DUT. For low cost diagnosis, an alternate set of measurements is determined such that the test
measurements are strongly correlated with variations in the test specification values of the device under
test (DUT) under process variations. This set of measurements defines the measurement space M of
Figure 1Figure . For RF devices, the set of M measurements is made on the output of a sensor connected
to the RF device. Any deviation in the observed measurements from the expected implies a corresponding
deviation of the measured RF specifications of the DUT from the expected in the specification space S,
due to perturbations in the process space P (see perturbations indicated in Figure 1). A nonlinear
regression mapping model using MARS (Multi-Variate Adaptive Regression Splines) is then developed
using measurements on a “training set” of devices. This model is then used to predict the RF test
specifications S of the DUT from the observed alternate test measurements M as shown in Figure 1. The
process of applying the alternate test and predicting the DUT specifications S from the alternate test
measurements is performed by algorithms running on the baseband DSP or the tester in production
environment. The failure coverage of the alternate testing technique depends on the choice of the input
test stimulus.
Figure 1: Signature test framework
Details of the files that were transferred
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Matlab files for performing optimized test generation for performing signature test framework
Matlab files for 2.4 GHz RF transmitter system with process variations
MARS evaluation code '
Documentation file explaining the usage of these files
Files transferred to
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Marian Verhelst (marian.verhelst@intel.com)
David Arditti (david.arditti@intel.com)