Cheng et al –supplementary
S1 is the HAADF-STEM image with Material Studio simulated image show the
interface of NiO-SrTiO3 with atomic resolution. The lattice structure in HAADFSTEM image is in a good agreement with the Material Studio image. No dislocation
is observed from the interface.
Figure S1. Enlarged HAADF-STEM shows the interface between the NiO nanocrystal and the
SrTiO3 substrate. No misfit dislocation is observed. (b) Material Studio simulates the lattice
structure of NiO-SrTiO3 interface in HAADF image.
S2 is the plot of R×A vs A for NiO nanocrystals with heights between 15 to 23 nm
(left). It shows that the Ron × A is independent of lateral area A. The Roff shows
considerable scatter and we cannot preclude any secondary factors. But we are
primarily concerned with the role of interface-mediated effects during the current
conduction. S2 right is the measurements of current at pristine state and high
resistance state respectively.
Figure S2 Plot of R×A vs A for NiO nanocrystals with heights between 15 to 23 nm (left) and the
measurements of current at pristine state and high resistance state respectively (right).