The Panalytical X’Pert Pro Multipurpose Diffractometer (MPD)
The instrument is a PANalytical X'Pert Pro MPD, powered by a Philips PW3040/60 X-ray generator and
fitted with an X'Celerator* detector. Diffraction data is acquired by exposing powder samples to Cu-Kα Xray radiation, which has a characteristic wavelength () of 1.5418 Å. X-rays were generated from a Cu
anode supplied with 40 kV and a current of 40 mA.
The data were collected over a range of INSERT YOUR SCAN RANGE HERE o2θ with a step size of INSERT
YOUR PARAMETERS HERE o2θ and nominal time per step of INSERT DATA HERE, using the scanning
X’Celerator detector (hence the counting time per step). Fixed divergence and anti-scatter slits of INSERT
HERE were used together with a beam mask of 10mm and all scans were carried out in ‘continuous’ mode.
Phase identification was carried out by means of the X'Pert accompanying software program PANalytical
High Score Plus in conjunction with the ICDD Powder Diffraction File 2 Database (2004), ICDD Powder
Diffraction File 4 - Minerals (2014), the American Mineralogist Crystal Structure Database (March 2010)
and the Crystallography Open Database (May 2013; www.crystallography.net).
* The X’Celerator is an ultra-fast X-ray detector that uses RTMS (Real Time Multiple Strip) technology. It
operates as an array of a hundred channels which can simultaneously count X-rays diffracted from a
sample over the range of 2θ angles specified during a scan. The X’Celerator is therefore able to give
produce high quality diffraction data in a significantly shorter time period than an older style
diffractometer would require.
CEAM XRPD Lab
July 2013