“Surface Analytical Techniques” 7.5 points
COURSE PERIOD:
October 2013 – March 2014
TARGET GROUP:
Graduate students advanced in their PhD studies who need a thorough knowledge in
surface analytical techniques and practices for their research projects.
AIMS AND OUTCOME OF THE COURSE
This is a 7.5 point graduate level course. The purpose of this course is to give an indepth introduction and understanding of analytical methods commonly used for
elemental and chemical analysis of the near-surface region. Three complimentary
techniques are in focus: X-ray photoelectron spectroscopy (XPS or ESCA), Auger
Electron Spectroscopy (AES), together with scanning Auger microscopy (SAM) and
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). The course will be
staffed by lecturers from LiU with considerable experience in applied surface
analysis. The following are the aims:
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a comprehensive understanding of XPS, AES and ToF-SIMS
a systematic knowledge on the theory underlying these techniques and current
practices in the analysis of surfaces
a knowledge on the used analytical equipment
to provide students with sufficient knowledge that they can decide upon which
methods are most appropriate for a range of different materials applications
After successful completion of the course the students will:
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understand the theory and practice of the surface analytical techniques of
XPS, Auger and ToF- SIMS,
appreciate the possibilities and limitations of each technique and be able to
decide which techniques are most appropriate to use in a given problem
be able to critically assess research in which these techniques have been
applied
understand and interpret results obtain with these techniques
COURSE CONTENT and STUDY FORMAT:
The course comprises lectures, theoretical exercises and laboratory
exercise. Practical aspects of surface analysis, such as specimen preparation will
also be described.
The course consists of 30h of lectures + 3×6h of laboratory exercises
Topics covered (list yet not complete)
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Introduction to Photoelectron and Auger Spectroscopy I: Basic Principles
Introduction to Photoelectron and Auger Spectroscopy II: Chemical Information
Introduction to Time-of-Flight Secondary Ion Mass Spectrometry
Instrumentation
Surface Analysis of Polymers
Surface Analysis of Inorganic Systems
Complementary Analytical Techniques
Auger, X-Ray and Ion mapping
Sputter Depth Profiling
Non Destructive Depth Profiling
High Spatial Resolution
Qualitative and Quantitative analysis
Spectral interpretation
Artifacts
Applications examples
Sample preparation
Recent Advances in Surface Analysis
LITERATURE
Along with extensive course notes, the following textbook(s) is (are) recommended:
Surface Analysis - The Principal Techniques, Editor(s): John C. Vickerman, Ian S.
Gilmore, 2nd Edition
Lectures will also be available for students in the electronic form
The supplementary reading:
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Surface Analysis by Auger and X-ray Photoelectron Spectroscopy edited by D.
Briggs and J.T. Grant
Photoelectron Spectroscopy: Principles and Applications by Stefan Hufner
Auger- and X-ray Photoelectron Spectroscopy in Materials Science by
Siegfried Hofmann
EXAMINATION
Examination is in the form of:
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lab report - students are supposed to perform thorough characterization of
one sample of their own and present a complete written lab report
(XPS+AES+SIMS) (group activity)
15 min. individual presentation on related topic followed by a 5 min question
session
written solutions to problems that will be hand out during lectures
attendance of the lectures will also affect the final result
CONTACT PERSON and LECTURERS
Grzegorz Greczynski (course responsible, grzgr@ifm.liu.se, G212)
Jens Jensen (responsible for SIMS part, jejen@ifm.liu.se, G406)
Per Sandström (responsible for AES, not confirmed yet)