Aperture Coupling Method for EMI Analysis of Microwave Circuits within Multilayer Cavities T. Yang1 and J. L. Volakis1,2 1 Radiation Lab., EECS Dept., The University of Michigan, Ann Arbor, MI 48109 2 ElectroScience Lab., The Ohio State University, Columbus, OH 43212 taesiky@umich.edu, volakis.1@osu.edu Introduction With increasing density of RF/microwave integrated circuits and systems, printed circuit board (PCB) becomes more multilayered and metallized and demands more vertical structure. This trend makes electromagnetic interference (EMI) and signal integrity analysis of such systems a challenging task. Hence, efficient modeling and accurate prediction of EMI effects on the high speed RF/microwave integrated circuits is becoming an important design requirement. This paper presents a simple and efficient approach for the EMI analysis of PCB enclosed within cavities having multilayered substrates, possibly separated by metallic plate with apertures. The cavity Green’s function is used to model the enclosure structure and internal circuit components and the method of moment (MoM) is applied (referred to as the MoM-GF technique). Specifically, the method employs magnetic currents on the non-metallic region at each layer interface instead of electric currents on the metallized portions. By employing the surface equivalence principle, each layer is separated and modeled as a single cavity (see Fig.1). That is, the original multilayer cavity is replaced by cascaded cavities. Because only single cavity is considered in the proposed method, there is no need for a multilayer cavity Green’s function (GF) whose analytical derivation becomes quite inefficient and time consuming with a large number of layers. In addition, for such cases in which there exist vertical interconnects and vias connected to planar passive circuits enclosed in a multilayer cavity, the aperture coupling method does not require (electric) junction current modeling. This is because the proposed method considers only magnetic currents in the layer interface and, hence, there is no planar electric current to be otherwise coupled to vertical metals. Thus, for each single cavity, horizontal magnetic currents at the apertures (or non-metallic areas) and vertical electric currents at the vias/loads are unknowns to be determined. Compared to a method using electric currents on the planar passive microwave circuits placed in the layer interface, the present method is more efficient when the cavity of interest is composed of multilayered substrates, large planar metallic portions in each layer interface, and numerous vertical interconnects embedded in each layer. Formulation To illustrate the approach, consider the general geometry consisting of cascaded interior cavities or a cavity with layered substrates separated by metallic interfaces containing an arbitrary distribution of apertures as shown in Fig.1 (a). For electromagnetic wave penetration analysis, we employ the surface equivalence principle at the interface apertures and introduce equivalent magnetic current densities over both sides of the PEC planes of the same but opposite magnitudes. Referring to the configuration in Fig.1, the computation of the magnetic currents at layer interfaces are performed by enforcing magnetic field continuity as follows. Top surface of layer 1: H ti H ta ( M 1 ) H tb1 ( M 1 ) H tb1 ( J1 ) H tb1 ( M 2 ) (1) Bottom surface of layer N: H tb ( N 1) ( M N ) H tbN ( M N ) H tbN ( J N ) (2) Bottom surface of layer n (or top surface of layer n+1): H tbn ( M n ) H tbn ( J n ) H tbn ( M n 1 ) H tb ( n 1) ( M n 1 ) H tb ( n 1) ( J n 1 ) H tb ( n 1) ( M n 2 ) (3) where Jn refers to the electric currents on the vertical posts or via within the nth layer. Thus, tangential electric field must be zero on the vias of the nth layer. Etbn ( M n ) Etbn ( J n ) Etbn ( M n 1 ) 0 (4) The above equations are discretized using roof-top basis functions for representing magnetic currents and pulse basis for the vertical interconnects/posts along with Galerkin’s testing. Doing so, we obtained the general matrix system i M 1 I YMa Mb1 YMb1J YMb1M 0 0 0 0 1 1 1 1 1 2 J 0 Z Jb1M Z Jb1J Z Jb1M 0 1 0 0 0 1 1 1 1 1 2 M 2 0 Y b1 Y b1 Y b1 b 2 Y b 2 Y b 2 0 0 J 0 M 2 M1 M 2 J1 M 2 M 2 M 2 J 2 M 2 M 3 2 b2 b2 b2 0 0 Z Z Z 0 0 J2 M 2 J2 J2 J2 M3 M 3 0 b2 b2 b 2 b3 b3 0 0 Y Y Y Y 0 J 0 M 3 M 2 M 3 J 2 M 3 M 3 M 3 J3 3 0 0 0 Z Jb33M 3 Z Jb33J3 0 0 b ( N 1) bN bN YM N J N YM N M N 0 M 0 N bN bN 0 Z Z M M M J N N N N J N 0 where all matrix elements take the form of double modal series and the details are available in [1]. It is interesting to note that by invoking reciprocity, coupling admittance matrices YMbij Ji and YMbi M can be shown to be equal to the negative transpose of Z JbiM and YMbi M , i j j i i j respectively, for j = i or i+1. Results To validate the technique, coupled voltage is computed at the 50Ω load of interdigital filter enclosed within a rectangular cavity having a slot illuminated by Ey polarized plane wave incidence. The details of all dimensions are given in Figs.2 and 3 where the cavity and enclosed filter geometry is identical except that for Fig.3, to increase structure complexity, a second plate containing three rectangular apertures is added inside the cavity. The present method (Magnetic GF in legend of Figs.) is compared with HFSS (Ansoft) and another MoM-GF method [1] (Electric GF in legend of Figs.) using electric currents in the metallic parts of the layer interface. In all cases, close agreement is exhibited for broad frequency band. We observe two large coupling peaks at around 2GHz and 6 to 8 GHz, corresponding to the resonances of the filter and the cavity plus aperture. The overall coupled voltages in Fig. 2 are higher than those in Fig. 3 where the second set of apertures is non-resonant at the frequency of interest. Conclusion A simple and efficient technique is presented to model PCB enclosed within a cavity having multilayer substrates. The method employs magnetic currents in non-metallic region of layer interface instead of electric currents in planar metallic parts and is only associated with single layer cavity GF. Examples were given to demonstrate the validity of the method. (Ei, Hi) M1 -M1 J1 (ε1, μ1) Layer 1 M2 -M2 J2 (ε2, μ2) M3 Layer 2 -MN (εN, μN) JN (a) Layer N (b) Fig. 1. (a) General geometry for the multilayered cavities with apertures and passive microwave circuits under EMI illumination. (b) Connectivity of the cascaded cavities via the surface equivalence principle. -3 Enclosed Interdigital Filter x 10 7 Magnetic GF Electric GF HFSS 6 Induced Voltage (V) 5 Ki Ey x y 4 z 0 ε1 50 Ω d1 3 ε2 d2 2 1 0 1 2 3 4 5 Frequency (GHz) 6 7 8 Fig. 2. Voltage at the load of an interdigital filter enclosed a cavity. The dimensions are given as follows: cavity (29 x 40 x 4), aperture (19 x 2), strip (1 x 20), d1=1, d2=3, ε1=1, ε2=3.48 in [mm]. -3 7 x 10 6 Ey Voltage at the output (V) z 5 y Ki x A1 ε1 4 3 2 Magnetic GF Electric GF HFSS A2 A3 d1 A4 ε2 ε3 d2 d3 1 0 2 3 4 5 Frequency (GHz) 6 7 8 Fig. 3 Coupling onto the microwave filter placed below the second set of apertures. The dimensions of the apertures and the cavity are given as follows: cavity (29 x 40 x 4), aperture #1 (19 x 2), aperture #2 (3 x 16), aperture #3 & 4 (15 x 2), d1=2, d2=d3=1, ε1=ε2=1, ε3=3.48 in [mm] References [1] Taesik Yang, “Coupling onto RF Components Enclosed in Canonical Structures”, Ph.D. dissertation, EECS Dept., University of Michigan, Feb. 2006