Fast, Non-Monte-Carlo Transient Noise Analysis for High-Precision Analog/RF Circuits by Stochastic Orthogonal Polynomials Fang Gong1, Hao Yu2 and Lei He1 1University of California, Los Angeles, Los Angeles, USA 2Nanyang Technological University, Singapore Presented by Fang Gong Motivation Device noise can not be neglected for high-precision analog circuit anymore! Signal-to-noise ratio (SNR) is reduced; Has large impact on noise-sensitive circuits: PLLs (phase noise and jitter), ADCs (BER) … V output V norm inal V noise Device Noise Sources: Thermal Noise: random thermal motion of the charge carriers in a conductor; Flicker Noise (1/f Noise): random trapping and de-trapping of charge carriers in the traps located at the gate oxide interface. Existing Work Monte Carlo method Model the thermal noises as stochastic current sources attached to noise-free device components. Sample the stochastic current sources to generate many traces. Non-Monte-Carlo method: [A. Demir, 1994] Decouple the noisy system into a stochastic differential equation (SDE) and an algebraic constraint. Use perturbation analysis and covariance matrix to solve for variance of transient noise in time domain. Examples of Commercial tools: Transient noise analysis in HSPICE (Synopsys) AFS transient noise analysis (Berkeley Design Automation), … SDAE based Noise Analysis- primer slide Modeling of Thermal Noise 2 kT ith ( t ) ith ( t ) (t ) 4 kT g m ( t ) R stationary process with constant power spectral density (PSD) Stochastic differential algebra equation (SDAE) Stochastic component deterministic component A d m q ( x ( t )) f ( x ( t ), t ) dt g r ( X ( t ), t ) r ( t ) 0 r 1 g r ( X ( t ), t ) r (t ) noise intensities Standard noise sources (White noise) Integrate it to build Itô-Integral based SDAE t t A q ( x ( s )) t 0 m f ( x ( s ), s ) ds W r (t ) 0 g r 1 t 0 t0 t t r ( X ( t ), t ) dW r ( t ) 0 Wiener process t r ( s ) ds dW 0 r (s) W ( t n ) W ( t n ) W ( t n 1 ) ~ N (0, h n ) Existing Solution to Itô-Integral based SDAE Stochastic Integral scheme for SDAE (e.g. backward differentiation formula (BDF) with fixed time-step) q ( xn ) A 4 3 q ( x n 1 ) 1 3 q ( xn 2 ) hn 3 W n W n W n 1 ~ N (0, h n ) r r 2 r f ( xn ) g Wn r m r ( x n 1 ) r 1 hn 1 3 g W n 1 r m r ( xn 2 ) r 1 0 hn Sampled with Monte Carlo at each time step With piecewise linearization along nominal transient trajectory: q ( xn ) q ( xn ) (0) xn xn xn (0) f ( xn ) f ( xn ) (0) Nominal response Transient noise q x xn q ( xn ) C n xn (0) (0) x xn f x (0) xn f ( xn ) G n xn (0) (0) x xn (0) New SOP based Solution Stochastic Orthogonal Polynomials without Monte Carlo ( ) ( ) ( ) ( ) n 0 0 1 ( ) [1, , 1, 2 1 i i i0 T ] Expand random variables with SoP W n W n W n 1 ~ N (0, h ) W n 0 0 1 1 h 1 ( 0 =0) r r r r x n 0 (t n ) 0 1 (t n ) 1 1 (t n ) 1 q(x (0) n ) C n 1 (t n ) 1 (0) A q(x 3 4 (0) n 1 ( 0 0) ) C n 1 1 ( t n ) 1 (0) q(x 3 1 (0) n2 h 2 3 f (x C n 1 (t n ) (0) A 4 3 (0) n 2 (0) ) G n 1 (tn ) 1 3 C n 1 1 ( t n 1 ) (0) 1 3 SoP expansions h 1 m g r 1 r 0 ) C n 2 1 (t n ) 1 (0) 3σ boundary in time domain h C n 2 1 (tn 2 ) (0) h 2 3 G (0) n 1 (tn ) 2 m g 3 r 1 V ar ( x n ) 1 ( t n ) 2 r 0 nominal response Experimental Results Experiment Settings Consider both thermal and flicker noise for all MOSFETs. Resistors only have thermal noise. Accuracy and efficiency validity SoP expansion method can achieve up to 488X speedup with 0.5% error in time domain, when compared with MC. Runtime Comparison on Different Circuits MC SoP Method CMOS comparator Inverter OPAM Comparator Oscillator Time(s) 91.95 4266.64 2226.71 146851.2 Error 0.43% 0.93% 1.78% 1.62% Time(s) 1.87 52.35 12.72 300.91 Speedup 49X 81X 175X 488X Conclusion A fast non-Monte-Carlo transient noise analysis using ItôIntegral based SDAE and stochastic orthogonal polynomials (SoPs) The first solution of SDAE by SoPs Expand all random variables with SoPs Apply inner-product with SoPs to expansions (orthogonal property) Obtain the SoP expansion of transient noise at each time-step To learn more come to poster session!