International Journal of Engineering Trends and Technology (IJETT) – Volume 27 Number 3 - September 2015 Design of a New Power Efficient Explicit-Pulsed Dual Edge Triggered Sense-Amplifier Flip-Flop P.Manikanta#1, R.Ramana Reddy*2, 1 Student, 2Professor, ECE Department, Jntuk, India Abstract— In this paper a new dual-edge triggered sense-amplifier flip-flop (NEWDET-SAFF) is proposed. The proposed flip-flop presets its storage nodes to a medium voltage level between VDD and VSS just before input capturing. By embedding dualedge triggering mechanism and conditional precharging in the new symmetric latch, the NEWDETSAFF is capable of achieving low power dissipation and delay. The presetting operation allows the proposed flip-flop to be faster and more clock-skew tolerant than conventional flip-flops. Simulations are carried out using a mentor graphics tools of 130-nm CMOS process technology and results indicate that NEWDET-SAFF results has 22% improvement on clock-skew tolerance, 20% decrease of data-to-output delay, 22.3% reduction of power-delay product, as compared to DET-SAFF. Keywords — Dual-edge triggering, clock-skew tolerance, Conditional precharging. I. INTRODUCTION Speed, power consumption, robustness, clock-skew tolerance, and layout area are the most important parameters in the design of highperformance semiconductor devices. Since flip-flops are essential elements for designing these devices, they have a critical influence on determining these parameters. As frequency increases, pulse-based flipflops are used popularly to compare with conventional master-slave flip-flops [1]. The basic idea is to construct a short pulse around the triggering edge of the clock. This pulse acts as the clock input to a latch, sampling the input data only in a short window. Race conditions are thus avoided by keeping the transparent period of the latch very short. This sampling window is usually wide enough for the input data to propagate to the output Q. So, the setup time can be negative. Since input data can arrive at the flipflop even after the triggering edge of the clock, this feature is attractive in that some timing can be borrowed from the previous cycle [2]. Soft clock edge property obtained by the pulse-based operation also provides a large clock-skew tolerance while maintaining low data-to-output latency. If the variation on this latency is smaller than the variation of the clock edge, clock skew is said to be absorbed [3]. The highest clock-skew tolerance can be obtained if data-to-output delay is flat in the region of expected clock arrival. Conventional methods to absorb clock skew usually have large synchronization overhead, reduce design flexibility, and require the generation and distribution of overlapped multiple clock phases. ISSN: 2231-5381 Many dual edge triggered flip-flops have been discussed [3]-[10]. II. REVIEW OF EXISTING DUAL- EDGE TRIGGERED FLIP-FLOPS A. Static Output-Controlled Discharge FlipFlop By using static dual edge triggered flip-flop, static output controlled discharge flip-flop (SCDFF) is designed and the schematic diagram is shown in Fig.1. The pulse generator and the static latch can involve an explicit pulse generator and a latch that captures the pulse signal. And the static latch consists of two static stages. In the first stage, input D is used to drive the pre-charge transistor so that node X follows D during the sampling period. The conditional discharging technique is implemented by inserting a QB controlled NMOS in the discharge path. (a) (b) Fig.1. Static output-controlled discharge flip-flop (SCDFF): (a) dual pulse generator and (b) static latch. This helps to reduce the power dissipation, of the input activity. The major advantage of SCDFF is low power consumption and soft edge property. Drawback of SCDFF is delay. B. Dual Edge-Triggered Static-Pulsed Flip-Flop DSPFF consists of pulse generator and static latch stages. The pulse generator and the static latch of dual http://www.ijettjournal.org Page 148 International Journal of Engineering Trends and Technology (IJETT) – Volume 27 Number 3 - September 2015 edge static pulsed flip-flop is shown in Fig.2.The pulse generator consists of four inverters which generate delayed and inverted clock signals, CLK2 and CLK3, along with two NMOS transistors for pulse generation. In latching stage, once the PULS signal is generated, both pass transistors are turned ON to capture the inputs data so that either SB or RB will be discharged. The adaptive clock inverter chain will disable some internal clocked transistors when the data activity is low. The signal derived from node NC of the sensing stage is used to implement adaptive clocking. If input D is derived from output Q node NC will be pulled up and the transistors pass transistors in the inverter chain will turn on. Consequently, the desired inverted and delayed signals, CLK3 and CLK4 will be produced so that an arrow transparent window is created on the rising and falling edges of the clock. Either SB or RB will be discharged during this transparent period, changing the output state in the latching stage. (a) (a) Adaptive inverter chain (b) Fig.2. Dual edge-triggered static pulsed Flip-Flop (DSPFF): (a) dual pulse generator, and (b) static latch A smaller delay can be obtained since DB and D are directly fed to the nodes, SB and RB, respectively. The PMOS transistors, together with two weak NMOS transistors, effectively avoid the floating of nodes SB and RB when the flip-flop is opaque, thereby providing a fully static operation. The explicit pulse generator is simple and suitable for dual-edge triggering. The static feature of DSPFF eliminates unnecessary transitions. Symmetrical output delays can be obtained by carefully sizing the transistors aspect ratios. On top of that, DSPFF suffers from high leakage current. This is caused by a high-voltage drop across either of the pass transistor in the pull down path, when they are off. C. Adaptive Clocking Dual Edge-Triggered SenseAmplifier Flip-Flop ACSAFF is an implicit dual edge triggered sense amplifier flip-flop. It consists of three stages: The adaptive clock inverting stage, the front end sensing stage and the Nikolic’s [11] stage is shown in Fig.3. ISSN: 2231-5381 Front end sensing stage Latch stage (b) Sensing and latch stage Fig.3. Adaptive clocking dual edge- triggered sense- amplifier FlipFlop (ACSAFF) ( a) Adaptive inverter chain (b) Sensing and latch stage Once the output is altered with reference to the input then the node NC will be blocked through either of the pull down transistors path. This flip-flop has shown its superiority in terms of power consumption at low switching activity. D. Dual-Edge Triggered Sense-Amplifier Flip-Flop The schematic diagram of the DET-SAFF is shown in Fig.4 the dual edge triggered pulse generator [12] produces a pulse signal synchronized at the rising and falling clock edges. The pulse generator can be http://www.ijettjournal.org Page 149 International Journal of Engineering Trends and Technology (IJETT) – Volume 27 Number 3 - September 2015 shared by multiple flip-flop circuits when a group of flip-flops are located closely. For a sense amplifier based flip- flop, in the evaluation phase, as soon as D is low, SB will be set to high, and if D is high, RB will be set to high. III. PROPOSED DUAL EDGE TRIGGERED SENSE AMPLIFIER FLIPFLOP The schematic diagram of the NEWDETSAFF is shown in Fig.5 it consists of pulse generator and sensing stages of DET-SAFF. In the latching stage a new high speed and symmetrical latch is developed to achieve low power and high speed. (a) Dual pulse generator Sensing stage node. This topology significantly speeds up the highto-low output transition because the output latch immediately captures the input value once the PULS signal is generated. On the other hand, the low-to-high latency will also be improved. This is because the output node will not only be charged by the pull-up transistors, but also with the pull down pass transistors. The advantage of DET-SAFF is high speed and low power. But the unnecessary transitions especially at low switching activities cause a lot of power to be wasted. Latch stage (a) Dual pulse generator (b) Sensing and latch stage Fig.4. Dual edge-triggered sense-amplifier Flip-Flop (a)Dual pulse generator (b) Sensing and latch stage Therefore, the conditional pre-charging technique is applied in the sensing stage of DETSAFF, to avoid redundant transitions at major internal nodes. Two input controlled PMOS transistors in the pull-up stage of sense amplifier are embedded in the pre-charge paths of nodes SB and RB, respectively. In this case, if D remains high for n cycles, SB may only be discharged in the first cycle. For the following cycles, SB will be floating when PULS is low or fed to the low state DB when PULS is high. As for RB, it only needs to be precharged in the first cycle and remains at its high state for the remaining cycles. Since the pre-charging activity is conditionally controlled, the critical pull down path of SB and RB is simplified, consisting of only one signal transistor. This helps to reduce the discharging time significantly. As such, the resulting sensing stage possesses low-power and high-speed features. A fast symmetric latch is developed this new latch [13] makes use of SB and RB to pull up the output nodes. But the pull down path is modified. It composes PULS -controlled NMOS pass transistor, through which D (DB) is directly fed to the Q (QB) ISSN: 2231-5381 (b) Latch stage Fig.5. Proposed new Dual edge-triggered sense-amplifier FlipFlop (a) Dual pulse generator (b) Latch stage Once the PULS is generated from pulse generator then the sensing stage will generate the SB and RB notice transistors Q1 and Q3 resemble the series-connected complementary pair from the inverter circuit. Both are controlled by the same input signal (input SB), the upper transistor will turn OFF and the lower transistor will turn ON when the input is “high” (logic 1), and vice versa. The transistors Q2 and Q4 are similarly controlled by the same input signal (input RB), to the logic levels. The upper transistors of both pairs (Q1 and Q2) have their source and drain terminals http://www.ijettjournal.org Page 150 International Journal of Engineering Trends and Technology (IJETT) – Volume 27 Number 3 - September 2015 are parallel connected, while the lower transistors (Q3 and Q4) are series-connected. This arrangement results the output to go “high” (logic 1) if either top transistor saturates, and will go “low” (logic 0) only if both lower transistors saturate. The design cross coupling results a latch circuit as a result the data will be latched in the design. IV. SIMULATION RESULTS AND PERFORMANCE COMPARISONS All the flip-flops were designed using Chartered Semiconductor Limited’s 0.13µm CMOS process technology, at an operating temperature of 270C and a supply voltage of 1.8V, using MENTOR GRAPHICS TOOLS. The performance of the proposed flip-flop is evaluated and compared with SCDFF, DSPFF, ACSAFF, and DETSAFF. The design was optimized to 1.25 GHZ. Table I summarize the performance metrics of the reviewed flip-flops and proposed designs, at input switching activity of α = 1. The proposed NEWDET-SAFF achieved low CLK-to-Q delay among the flip-flops. V. CONCLUSION In this paper a new technique, conditional precharge, is proposed. This technique is incorporated in the dual edge triggered sense amplifier flip-flop and a new flipflop named NEW DET-SAFF is proposed to reduce the delay and power dissipation in flip-flops. With a data switching activity of 50%, the new flip-flop can save upto 36% of the energy with the same speed as that for the fastest pulsed flip-flops. While explicit pulsed data close to output (ep-DCO) is suitable for speed critical paths, NEWDET-SAFF is suitable for both speed critical paths and speed-insensitive paths for energy-efficiency. Moreover, the design has shown its superiority in high switching activity with a reduced delay of 73% respectively. REFERENCES: [1] [2] [3] TABLE I COMPARISON RESULTS OF FLIPFLOPS CLK-to-Q delay(ps) Min D-toQ delay (ps) Rise time(ps) Fall time(ps) MOCF(GH Z) # of transistors DSPFF [9] ACSAFF [10] DETSAFF [12] NEW DETSAFF 619.80 886.7 598.5 192.36 37.877 620.40 572.9 803.1 197.36 178.19 746.7 218.89 111.02 30.720 800.7 111.02 50.452 49.751 1.43 0.83 1 1 24 39 22 22 103.33 97.981 1 29 *MOCF: Maximum operating clock frequency is the highest frequency at which output can acquire 90% of full swing [4] [5] [6] [7] [8] [9] [10] 40 power(nw) Designs SCDFF [8] 30 SCDFF 20 DSPFF 10 0 [11] [12] ACSAFF DETSAFF H. Kojlma et al., “Half-Swing Clocking Scheme for 757. Power Saving in Clocking circuitry,” VLSI Symp., pp.23-24, June 1994. J.Montanaro et al., “A 16C-Mhz, 32-b, O5-W CMOS RISC Microprocessor,” JSSC, vol. 31, pp. 1703-1714, Nov. 1996,. R. P. Llopis, M. Sachdev, “Low power, testable dual edge triggered flip-flops”, ISLPED Digest of Technical Papers, p.341-345, 1996. C.-C. 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VLSI Design 2005, Jan. 2005, pp. 846–849. J.M.Rabaey, “Digital Integrated Circuits : A design perspective,” Second Edition, Prentice Hall Electronics and VLSI Series, Chapter 7. pp. 354-356, 2003. B.Nikolic, V. G. Oklobdzija, V. Stajanovic, W. Jia, J. K. Chiu, and M. M. Leung, “Improved sense-amplifier based flip-flop: Design and measurements,” IEEE J. Solid-State Circuits, vol. 35, no. 6, pp. 876–883, Jun. 2000. J. Aliakbar Ghadiri, et al, “Pre-Capturing Static Pulsed FlipFlop”, IEEE International Symposium on Circuits and Systems, Vol. 3, pp. 2421-2424, May 2005. A. G. M. Strollo, D. De Caro, E. Napoli, and N. Petra, “A novel high speed sense-amplifier-based flip-flop,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 13, no. 11, pp. 1266–1274, Nov. 2005. NEWDET-SAFF Fig. 5. Power dissipation of different flip-flops ISSN: 2231-5381 http://www.ijettjournal.org Page 151