1 Dimensional analysis - Prasanna Pavani | Exnodes

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Structured-Illumination

Quantitative Phase Microscopy

Sri Rama Prasanna Pavani, Ariel Libertun, Sharon King, and Carol Cogswell

Micro Optical – Imaging Systems Laboratory

University of Colorado at Boulder http://moisl.colorado.edu

Pavani et al - Univ. of Colorado, Boulder 1

Phase Imaging - What?

 Transparent objects

(phase objects) modulate only the phase of light

 Square law detectors do not detect phase modulations

 Convert phase modulations into

“detectable” intensity modulations

Bright field

Pavani et al - Univ. of Colorado, Boulder 2

Phase imaging - How?

Phase contrast Diff. Interference Contrast

Convert phase modulations into “detectable” intensity modulations.

Digital Holography

 Quantitative phase for weak phase objects

 No phase wrapping

X Halo and shading-off

X Only for thin objects

 Quantitative phase after reconstruction

 No phase wrapping

X Polarization sensitive

X Only for thin objects

X Multiple images

Pavani et al - Univ. of Colorado, Boulder

 Quantitative phase after reconstruction

 Thick phase objects

 Single image

X Vibration sensitive

X Phase wrapping

3

Our method - Why?

 Quantitative phase imaging

Purpose:

Applicability:

 Thick, partially absorbing samples

 Polarization insensitive

Speed:

Miscellaneous:

 Single image

 Non-scanning (wide field)

 Non-Iterative

 Incoherent source

 Inexpensive

Pavani et al - Univ. of Colorado, Boulder 4

Our method

 Amplitude mask in the field diaphragm

 Pattern is imaged on the sample

 Phase object distorts the pattern

 Record the distorted pattern

 Analytical formula calculates phase

Vs

Pavani et al - Univ. of Colorado, Boulder

0.2

(mm)

0.1

5

Our method – 1D

2D dot shift

1D dot shift

Pavani et al - Univ. of Colorado, Boulder 6

Our method – 1D

o Analytically relate deformation to the optical path length

( ( ) )

 ( ( ) )

  t t ( ( ) ) C

 r

 i o Consider a 1D phase object p(x) o Ray R from point A, after refraction, appears as if it originated from B n

1 o Deformation t(x) is the distance between A and B

A t(x)

Pavani et al, “Quantitative bright field phase microscopy”, to be sent to Applied Optics

Pavani et al - Univ. of Colorado, Boulder

B p(x) n

2

7

Our method – 2D

p ( x )

2

( n

1 n

1 n

2

 n

2

)

 t ( x ) dx

C

1

2

1D deformations After 1D integrations

Quantitative Phase

2D deformation

C m

1

C m

P x

2

( m

1 , d )

P x

2

( m , d ) P y

2

( m

1 , d )

P y

2

( m , d )

Pavani et al, “Quantitative bright field phase microscopy”, to be sent to Applied Optics

Pavani et al - Univ. of Colorado, Boulder 8

Simulation

Quadratic phase

50

200

25

100

0 100 200

0

X 100

5

18

0 9 Calculated Phase

-5 0

1D deformations After 1D integrations

X 100

5

18

200

100

0 100 200

0

9

50

25

0

-5

Error

8

4

0

-4

-8

0 100 200

Pavani et al - Univ. of Colorado, Boulder

0

Peak error is 5 orders less than peak phase

9

Experimental Results

Dot shift

Original pattern

Deformed pattern

16.54

Object:

Drop of optical cement

360

X,Y Deformations

3

0

180

Quantitative phase

Pavani et al - Univ. of Colorado, Boulder

40

30

20

10

0

360

0 240 480

-3

3

0

180

0 240 480

-4

10

Experiment - Accuracy

Profilometer

Our method

Pavani et al - Univ. of Colorado, Boulder 11

Conclusion

Quantitative phase imaging in a brightfield microscope.

Phase is calculated from deformation using an analytical formula.

Inexpensive non-scanning, non-iterative, single-image technique.

Pavani et al - Univ. of Colorado, Boulder 12

Acknowledgements

Prof. Rafael Piestun

Prof. Gregory Beylkin

Vaibhav Khire

CDM Optics PhD Fellowship

National Science Foundation Grant No. 0455408

Pavani et al - Univ. of Colorado, Boulder 13

References

J. W. Goodman, Introduction to Fourier Optics , (Roberts & Company, 2005)

M Pluta, Advanced Light Microscopy, vol 2: Specialised Methods , (Elsevier, 1989)

M. R. Arnison, K. G. Larkin, C. J. R. Sheppard, N. I. Smith, C. J. Cogswell, “Linear phase imaging using differential interference contrast microscopy”

Journal of Microscopy 214 (1), 7

–12 (2004)

C. Preza, "Rotational-diversity phase estimation from differential-interference-contrast microscopy images," J. Opt. Soc. Am. A 17 , 415-424 (2000)

Sharon V. King, Ariel R. Libertun, Chrysanthe Preza, and Carol J. Cogswell, “Calibration of a phase-shifting DIC microscope for quantitative phase imaging,”

Proc. SPIE 6443, 64430M (2007)

E. Cuche, F. Bevilacqua, and C. Depeursinge, “Digital holography for quantitative phase-contrast imaging,” Opt. Lett. 24 , 291-293 (1999)

P. Marquet, B. Rappaz, P. J. Magistretti, E. Cuche, Y. Emery, T. Colomb, and C. Depeursinge, “Digital holographic microscopy: a noninvasive contrast imaging technique allowing quantitative visualization of living cells with subwavelength axial accuracy,” Opt. Lett.

30 , 468-470 (2005)

M. Born and E. Wolf, Principles of Optics , ed. 7, (Cambridge University Press, Cambridge, U.K., 1999).

A. C. Kak, M. Slaney, Principles of Computerized Tomographic Imaging , (IEEE Press, New York, NY, 1988)

A. C. Sullivan, Department of Physics, University of Colorado, Campus Box 390, Boulder, CO 80309, USA and R. McLeod are preparing a manuscript to be called “Tomographic reconstruction of weak index structures in volume photopolymers.”

Huang D, Swanson EA, Lin CP, Schuman JS, Stinson WG, Chang W, Hee MR, Flotte T, Gregory K, Puliafito CA, et al.,

“Optical coherence tomography,”

Science1991 Nov 22;254(5035):1178-81.

A. F. Fercher, C. K. Hitzenberger, “Optical coherence tomography,” Chapter 4 in Progress in Optics 44, Elsevier Science B.V. (2002)

A. F. Fercher, W. Drexler, C. K. Hitzenberger and T. Lasser, “Optical coherence tomography - principles and applications,” Rep. Prog. Phys.

66 239

–303 (2003)

M. R. Ayres and R. R. McLeod, "Scanning transmission microscopy using a position-sensitive detector," Appl. Opt. 45 , 8410-8418 (2006)

BaroneNugent, E., Barty, A. & Nugent, K. “Quantitative phase-amplitude microscopy I: optical microscopy,” J. Microsc . 206 , 194 –203 (2002).

J. Hartmann, "Bemerkungen uber den Bau und die Justirung von Spektrographen," Z. Instrumentenkd. 20, 47 (1900).

I. Ghozeil, “Hartmann and other screen tests,” in Optical Shop Testing, D. Malacara, second edition Wiley, New York, 1992, pp. 367–396.

R. V. Shack and B. C. Platt, “Production and use of a lenticular Hartmann screen,” J. Opt. Soc. Am. 61, 656 (1971).

V. Srinivasan, H. C. Liu, and M. Halioua, “Automated phase-measuring profilometry of 3-D diffuse objects,” Appl. Opt. 23 , 3105- (1984)

M. G. L. Gustafsson, “Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy,” Journal of Microscopy 198 (2), 82–87

(2000)

M. D. Feit and J. A. , J. Fleck, "Light propagation in graded-index optical fibers (T)," Appl. Opt. 17 , 3990- (1978)

Haralick, Robert M., and Linda G. Shapiro. Computer and Robot Vision, Volume I. Addison-Wesley, 1992. pp. 28-48.

Pavani et al - Univ. of Colorado, Boulder 14

Applications and Future work

 Industrial inspection, biological imaging

 Extracting information from axial deformation

 Extending the depth of field of the system

 Fabrication of an amplitude mask with higher spatial resolution

Pavani et al - Univ. of Colorado, Boulder 15

Our method – How?

1 Dimensional analysis p ( x )

 tan n

1

(

 t r

( x

)

 i

) x

A

(from geometry) p ( x )

 tan sin

1

 n n

1

2 sin

 tan

1 n

1 t ( x ) dp ( x ) dx

 tan

1 p ( x )

 n

1 t ( x )



( n

1

1 ) dp ( x ) dx dp ( x ) dx

1

2 n

(Snell’s law, ) dx x

A

1

3

1

6

( n

1 )

3 

1

3

( n

1 )

2

3 n

2

 n

3

2

 dp ( x ) dx

 higher order terms



 p ( x ) dp ( x )

( n n

1

1

 n n

2

2

) t ( x ) dx p ( x )

2 I ( x )

C

2

1

(Taylor expansion)

( n n

1

1

 n n

2

2

) t ( x ) dx

I ( x )

C

2

C = 2 (C2 – C1) n

 n

1 n

2

Pavani et al - Univ. of Colorado, Boulder 16

Our method – How?

M

2 Dimensional analysis

Apply 1D solution along x and y to obtain P x

2 and P y

2

P x

2

( m , 1 : N )

P

2

( m , 1 : N )

C m

P y

2

( 1 : M , n )

P ( 1 : M , n )

K n

C m

1

C m

P x

2

( m

1 , d )

P x

2

( m , d ) P

2

( m

1 , d )

P

2

( m , d ) ,

N

P y

2

( m

1 , d )

P y

2

( m , d )

P

2

( m

1 , d )

P

2

( m , d )

C m

1

C m

P x

2

( m

1 , d )

P x

2

( m , d )

P x

2

P 2

P y

2

( m

1 , d )

P y

2

( m , d ) .

P y

2

Pavani et al - Univ. of Colorado, Boulder 17

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