Topics Derivation of transistor characteristics. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR MOSFET gate as capacitor Basic structure of gate is parallel-plate capacitor: gate + Vg SiO2 xox - substrate Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Parallel plate capacitance Formula for parallel plate capacitance: Cox = ox / xox Permittivity of silicon: ox = 3.46 x 10-13 F/cm2 Gate capacitance helps determine charge in channel which forms inversion region. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Threshold voltage Components of threshold voltage Vt: Vfb = flatband voltage; depends on difference in work function between gate and substrate and on fixed surface charge. s = surface potential (about 2f). Voltage on paralell plate capacitor. Additional ion implantation. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Body effect Reorganize threshold voltage equation: Vt = Vt0 + Vt Threshold voltage is a function of source/substrate voltage Vsb. Body effect is the coefficienct for the Vsb dependence factor. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Example: threshold voltage of a transistor Vt0 = Vfb + s + Qb/Cox + VII = -0.83 V + 0.58 V + (1.4E-8/8.6E-7) + 0.93 V = 0.7 V Body effect n = sqrt(2qSiNA/Cox) = 0.1 Vt = n[sqrt(s + Vsb) - sqrt(Vs)] = 0.05 V Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR More device parameters Process transconductance k’ = Cox. Device transconductance = k’W/L. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Channel length modulation length parameter describes small dependence of drain corrent on Vds in saturation. Factor is measured empirically. New drain current equation: – Id = 0.5k’ (W/L)(Vgs - Vt) 2(l - Vds) Equation has a discontinuity between linear and saturation regions---small enough to be ignored. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Gate voltage and the channel gate source current drain Vds < Vgs - Vt Id gate source current drain Vds = Vgs - Vt drain Vds > Vgs - Vt Id gate source Id Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Leakage and subthreshold current A variety of leakage currents draw current away from the main logic path. The subthreshold current is one particularly important type of leakage current. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Types of leakage current. Weak inversion current (a.k.a. subthreshold current). Reverse-biased pn junctions. Drain-induced barrier lowering. Gate-induced drain leakage; Punchthrough currents. Gate oxide tunneling. Hot carriers. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Subthreshold current Subthreshold current: – Isub = ke[(Vgs - Vt)/(S/ln 10)][1-e-qVds/kT] Subthreshold slope S characterizes weak inversion current. Subthreshold current is a function of Vt. – Can adjust Vt by changing the substrate bias to control leakage. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Thermal effects Vicious cycle: – Leakage current causes heating. – Heating increases leakage current. Thermal runaway: chip overheats due to leakage. Subthreshold leakage current is most important temperature-dependent current. – 8x-12x per 100°C. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Circuit simulation Circuit simulators like Spice numerically solve device models and Kirchoff’s laws to determine time-domain circuit behavior. Numerical solution allows more sophisticated models, non-functional (tabledriven) models, etc. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR Some (by no means all) Spice model parameters L, W: transistor length width. KP: transconductance. GAMMA: body bias factor. AS, AD: source/drain areas. CJSW: zero-bias sidewall capacitance. CGBO: zero-bias gate/bulk overlap capacitance. Modern VLSI Design 4e: Chapter 2 Copyright 2009 Prentice Hall PTR