EBB 511 – Materials Characterization Azizan Aziz Ph.D Projjal Basu Ph.D Synopsis 1. Introduction 2. Characterization Techniques 2.1 X-ray Diffraction (XRD) 2.2 Scanning Electron Microscope (SEM) 2.3 Transmision Electron Microscope(TEM) 2.4 Scanning Probe Microscopy 2.4.1 Scanning Tunneling Microscope 2.4.2 Atomic Force Microscope 2.5 Fourier Transform Infra-Red (FTIR) 2.6 UV-Vis (UV) 2.7 Thermal Analysis 3. The theoretical background,instrumentation and applications of these techniques will be discuss. Reference Books 1. An Introduction to Analytical Atomic Spectrometry; L.Ebdon, E.H. Evans, A. Fisher,S.J. Hill; Wiley; 1998 2. A Guide to Materials Characterization and Chemical Analysis; Edited by John P. Sibilia 3. Materials Science and Technology: Characterization of Materials; Volume 2A Part I dan 2B Part II 4. X-ray Diffraction : A Practical Approach; C. Suryanarayana & M. Grant Norton; Plenum Press;1998 5. X-ray Diffraction Procedures for polycrystalline and amorphous Materials; Harold P. Klug and Leroy E. Alexander ,1974 6. An Introduction To Thermal Analysis: Techniques and applications; Michael E. Brown, Chapman and Hall;1988 7. X-ray Characterisation of Materials; Ed. Eric Lifshin; Wiley-VCH ;1999 8. Scanning Probe Microscopy and Spectroscopy:Theory,Techniques and Applications; 2 edition;Ed. Dawn Bonnell; Wiley-VCH, 2000 9. Brian C. Smith, “ Fundamentals of Fourier Transform Infrared Spectroscopy” CRC Press, New York (1996) Dana W. Mayo, et al , “ Course Notes on the Interpretation of Infrared And Raman Spectra” Wiley Interscience (2004) Assessment Course Work (40%) Test (15%) Assignment (25%)** Exam (60%) **Titles of assigments will be made known later Materials Characterization • Materials Characterization has 2 main aspects - Accurately measuring the physical and chemical properties of materials - Accurately measuring (determining) the structure of a material - atomic level structure - Microscopic level structures • A critical part of Materials Science and Engineering is to study the relationships between – Properties of materials – Structures and Microstructures – The processing used to make the materials – The ultimate Performance of that materials in use Characterisation of Solid Samples Bulk elemntal composition Dissolution step Atomic absorption Direct solid analysis Electron. microscope ICP spectrometry SEM-EDX ICP mass spect. CHN analyser Structural Properties Surface phenomena IR spectrom. Dynamic SIMS. UV-Vis spectrom Static SIMS XRD/FESEM SEM/FESEM TEM./HRTEM XPS/SAM dilatometry. AFM Excitation Source Sample Detector Titles of Assignment 1. Scanning Probe Microscopy : Its Impact on Materials Science Research 2. Atomic Force Microscopy and Its application in nanomaterials characterisation 3. Characterisation of Nanoscale characterisation 4. X-ray Diffraction as a tool in Materials Characterisation 5. SEM and SPM: Comparison, the variant,limitation,advantages and its applications 6. Application of FTIR in Materials Science 7. AFM in surface engineering 8. STM and AFM in Nanotechnology 9. Application of XRD in the characterisation of Nanomaterials 10. Application of UV-Vis in Materials characterisation Only two (2) students per title. First come first serve basis. Submit the assigmnent by 10th Week - 12 September 2008 Marks will be given base on originality of the work. Cut and paste from source will not carry high grade. Format should be journal standard.