EBB 511 – Materials Characterization
Azizan Aziz Ph.D
Projjal Basu Ph.D
Synopsis
1. Introduction
2. Characterization Techniques
2.1 X-ray Diffraction (XRD)
2.2 Scanning Electron Microscope (SEM)
2.3 Transmision Electron Microscope(TEM)
2.4 Scanning Probe Microscopy
2.4.1 Scanning Tunneling Microscope
2.4.2 Atomic Force Microscope
2.5 Fourier Transform Infra-Red (FTIR)
2.6 UV-Vis (UV)
2.7 Thermal Analysis
3. The theoretical background,instrumentation and applications of these
techniques will be discuss.
Reference Books
1. An Introduction to Analytical Atomic Spectrometry; L.Ebdon, E.H.
Evans, A. Fisher,S.J. Hill; Wiley; 1998
2. A Guide to Materials Characterization and Chemical Analysis; Edited by
John P. Sibilia
3. Materials Science and Technology: Characterization of Materials;
Volume 2A Part I dan 2B Part II
4. X-ray Diffraction : A Practical Approach; C. Suryanarayana & M. Grant
Norton; Plenum Press;1998
5. X-ray Diffraction Procedures for polycrystalline and amorphous
Materials; Harold P. Klug and Leroy E. Alexander ,1974
6. An Introduction To Thermal Analysis: Techniques and applications;
Michael E. Brown, Chapman and Hall;1988
7. X-ray Characterisation of Materials; Ed. Eric Lifshin; Wiley-VCH ;1999
8. Scanning Probe Microscopy and Spectroscopy:Theory,Techniques and
Applications; 2 edition;Ed. Dawn Bonnell; Wiley-VCH, 2000
9. Brian C. Smith, “ Fundamentals of Fourier Transform Infrared
Spectroscopy” CRC Press, New York (1996)
Dana W. Mayo, et al , “ Course Notes on the Interpretation of Infrared And
Raman Spectra” Wiley Interscience (2004)
Assessment
Course Work (40%)
Test (15%)
Assignment (25%)**
Exam (60%)
**Titles of assigments will be made known
later
Materials Characterization
• Materials Characterization has 2 main
aspects
- Accurately measuring the physical and
chemical properties of materials
- Accurately measuring (determining) the
structure of a material
- atomic level structure
- Microscopic level structures
• A critical part of Materials Science and
Engineering is to study the relationships
between
– Properties of materials
– Structures and Microstructures
– The processing used to make the materials
– The ultimate Performance of that materials in
use
Characterisation of Solid Samples
Bulk
elemntal
composition
Dissolution step
Atomic absorption
Direct solid analysis
Electron. microscope
ICP spectrometry
SEM-EDX
ICP mass spect.
CHN analyser
Structural Properties
Surface phenomena
IR spectrom.
Dynamic SIMS.
UV-Vis spectrom
Static SIMS
XRD/FESEM
SEM/FESEM
TEM./HRTEM
XPS/SAM
dilatometry.
AFM
Excitation
Source
Sample
Detector
Titles of Assignment
1. Scanning Probe Microscopy : Its Impact on Materials Science Research
2. Atomic Force Microscopy and Its application in nanomaterials
characterisation
3. Characterisation of Nanoscale characterisation
4. X-ray Diffraction as a tool in Materials Characterisation
5. SEM and SPM: Comparison, the variant,limitation,advantages and its
applications
6. Application of FTIR in Materials Science
7. AFM in surface engineering
8. STM and AFM in Nanotechnology
9. Application of XRD in the characterisation of Nanomaterials
10. Application of UV-Vis in Materials characterisation
Only two (2) students per title. First come first serve basis.
Submit the assigmnent by 10th Week - 12 September 2008
Marks will be given base on originality of the work. Cut and paste from
source will not carry high grade.
Format should be journal standard.