ECE/CS 5720/6720 R.R. Harrison nMOS transistor – top view (layout) Active Polysilicon Contact drain Metal W gate L source Layout Examples 1 ECE/CS 5720/6720 R.R. Harrison nMOS transistor – cross section across channel drain gate cross section source Metal polysilicon SiO2 p- substrate Layout Examples 2 ECE/CS 5720/6720 R.R. Harrison nMOS transistor – cross section along channel gate cross section source drain polysilicon Metal SiO2 n+ Metal n+ p- substrate Layout Examples 3 ECE/CS 5720/6720 R.R. Harrison substrate tie – layout and cross section cross section substrate Metal p+ p- substrate Layout Examples 4 ECE/CS 5720/6720 R.R. Harrison pMOS transistor – top view (layout) Active Polysilicon Contact Metal Well drain gate W L source well Layout Examples 5 ECE/CS 5720/6720 R.R. Harrison pMOS transistor – cross section across channel drain gate cross section source well Metal polysilicon SiO2 n- well p- substrate Layout Examples 6 ECE/CS 5720/6720 R.R. Harrison pMOS transistor – cross section along channel gate cross section drain well source Metal Metal n+ p+ polysilicon SiO2 Metal p+ n- well p- substrate Layout Examples 7 ECE/CS 5720/6720 R.R. Harrison poly resistor – layout and cross section Polysilicon Contact Metal cross section Metal polysilicon Metal SiO2 p- substrate Typical resistance: 3-30 /square for heavily doped poly (standard) 120-1200 /square for undoped poly (requires extra “dopant block” layer) Layout Examples 8 ECE/CS 5720/6720 R.R. Harrison well resistor – layout and cross section Active Contact Metal Well cross section Metal Metal n+ n+ n- well p- substrate Typical resistance: 700-1300 /square Note: Resistance increases slightly with voltage due to the widening depletion layer between the n-well and p-substrate! (This is the same effect that leads to “pinch off” in jFETs.) Layout Examples 9 ECE/CS 5720/6720 R.R. Harrison poly/poly2 capacitor – layout and cross section Polysilicon (“poly”) Second-layer Polysilicon (“poly2”) Contact Metal cross section polysilicon Metal Metal SiO2 SiO2 p- substrate Typical capacitance: 0.5-0.9 fF/m2 Note: There is also a “bottom plate” capacitance between the lower poly layer and the substrate that is typically about 10% of the poly/poly2 capacitance. Layout Examples 10 ECE/CS 5720/6720 R.R. Harrison Example layout – nMOS current mirror in out ground Active Polysilicon Contact Metal in out ground Layout Examples 11 ECE/CS 5720/6720 R.R. Harrison Example layout – multiple metal layers Metal3 via2 Metal2 via polysilicon Metal1 SiO2 Metal1 contact n+ n+ p- substrate Contacts connect bottom-layer metal (metal1) to active (n+ or p+ regions), poly, or poly2. Metal2 can be connected to metal1 using a via. Metal3 can be connected to metal2 using a via2. Thus, if we want to connect metal1 to metal3, we must go through metal2 using a via and a via2. In some processes (including the one we use in this class), vias/contacts may be stacked vertically. In other processes, they must be offset from one another. Neither contacts nor vias should be placed over transistor gates. Layout Examples 12