Layout cross

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ECE/CS 5720/6720
R.R. Harrison
nMOS transistor – top view (layout)
Active
Polysilicon
Contact
drain
Metal
W
gate
L
source
Layout Examples
1
ECE/CS 5720/6720
R.R. Harrison
nMOS transistor – cross section across channel
drain
gate
cross section
source
Metal
polysilicon
SiO2
p- substrate
Layout Examples
2
ECE/CS 5720/6720
R.R. Harrison
nMOS transistor – cross section along channel
gate
cross section
source
drain
polysilicon
Metal
SiO2
n+
Metal
n+
p- substrate
Layout Examples
3
ECE/CS 5720/6720
R.R. Harrison
substrate tie – layout and cross section
cross section
substrate
Metal
p+
p- substrate
Layout Examples
4
ECE/CS 5720/6720
R.R. Harrison
pMOS transistor – top view (layout)
Active
Polysilicon
Contact
Metal
Well
drain
gate
W
L
source
well
Layout Examples
5
ECE/CS 5720/6720
R.R. Harrison
pMOS transistor – cross section across channel
drain
gate
cross section
source
well
Metal
polysilicon
SiO2
n- well
p- substrate
Layout Examples
6
ECE/CS 5720/6720
R.R. Harrison
pMOS transistor – cross section along channel
gate
cross section
drain
well
source
Metal
Metal
n+
p+
polysilicon
SiO2
Metal
p+
n- well
p- substrate
Layout Examples
7
ECE/CS 5720/6720
R.R. Harrison
poly resistor – layout and cross section
Polysilicon
Contact
Metal
cross section
Metal
polysilicon
Metal
SiO2
p- substrate
Typical resistance:
3-30 /square for heavily doped poly (standard)
120-1200 /square for undoped poly (requires extra “dopant block” layer)
Layout Examples
8
ECE/CS 5720/6720
R.R. Harrison
well resistor – layout and cross section
Active
Contact
Metal
Well
cross section
Metal
Metal
n+
n+
n- well
p- substrate
Typical resistance:
700-1300 /square
Note: Resistance increases slightly with voltage due to the widening depletion
layer between the n-well and p-substrate! (This is the same effect that leads to
“pinch off” in jFETs.)
Layout Examples
9
ECE/CS 5720/6720
R.R. Harrison
poly/poly2 capacitor – layout and cross section
Polysilicon (“poly”)
Second-layer Polysilicon (“poly2”)
Contact
Metal
cross section
polysilicon
Metal
Metal
SiO2
SiO2
p- substrate
Typical capacitance:
0.5-0.9 fF/m2
Note: There is also a “bottom plate” capacitance between the lower poly layer
and the substrate that is typically about 10% of the poly/poly2 capacitance.
Layout Examples
10
ECE/CS 5720/6720
R.R. Harrison
Example layout – nMOS current mirror
in
out
ground
Active
Polysilicon
Contact
Metal
in
out
ground
Layout Examples
11
ECE/CS 5720/6720
R.R. Harrison
Example layout – multiple metal layers
Metal3
via2
Metal2
via
polysilicon
Metal1
SiO2
Metal1
contact
n+
n+
p- substrate
Contacts connect bottom-layer metal (metal1) to active (n+ or p+ regions), poly,
or poly2.
Metal2 can be connected to metal1 using a via.
Metal3 can be connected to metal2 using a via2.
Thus, if we want to connect metal1 to metal3, we must go through metal2 using a
via and a via2.
In some processes (including the one we use in this class), vias/contacts may be
stacked vertically. In other processes, they must be offset from one another.
Neither contacts nor vias should be placed over transistor gates.
Layout Examples
12
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