CURRICULUM VITAE
Dmitri V. Sokolov, PhD
CONTACT DETAILS
5 Belfast Place
Roslyn
Palmerston North 4414
New Zealand
Phone: +64 (6) 353 3009
Mobile: +64 (21) 063 5382
E-mail: dmitry.v.sokolov@gmail.com
DEGREE
Doctor of Philosophy in Applied Physics
PERSONAL PROFILE
Creative, solutions focused, detailed analyst with about 20 years of R&D in Microscopy and
Information Management, I have experience in preparing and delivery of lectures and
workshops, group and individual training and currently looking for a position of a researcher or
a lecturer in Experimental Physics and Nanotechnology. I believe that efficient Problems
Solving requires developed Multidisciplinary Collaborative Networking. Development of
Research and Educational Network is one of my current priorities.
PROFESSIONAL PROFILE AND INTERESTS
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Preparation and delivery of lectures, seminars, labs, workshops and group and
individual training on microscopy and image analysis;
o Delivered lectures on fundamentals of microscopy, labs on microscopy and
image analysis of biological samples, organised and was invited to give talks on
Information Management and Food Microanalysis at workshops, trained about
300 students and researchers
Building of precision combined opto-electro-mechanical equipment;
o Combined Light and Scanning Electron / Scanning Probe Microscope (SPM) at
IAI, Russia
o Combined Confocal Laser Scanning Microscope (CLSM) and Profilometer /
SPM head for nano-Metrology at PTB, Germany
Probe-sample interaction processes and mechanisms;
o Comparative SEM / SPM for nano-devices applications, Hokkaido University,
Japan
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o Multimodal CLSM, hyperspectral imaging and SPM for materials
characterization at Samsung SDI, South Korea and Massey University, New
Zealand
SPM-based nanolithography for nano-devices applications,
o 10-20 nm wide structures on InGaAs, PMMA with nano-plowing, etching and
oxidation, Hokkaido University, Japan
Processes and mechanisms of thin film deposition, etching, oxidation and machining in
nanoscale;
Hands-on experience on polymer, metal and compound semiconductor thin film
deposition with Spin-Coating, Spattering, Molecular Beam Epitaxy (MBE),
Electroplating, Photolithography and other techniques in Clean Room environment;
o MBE growth of InGaAs/InAlAs heterostructures
o Photolithography of microstructures on Si, GaAs and heterostructure substrates
o Pt contacts electroplating, Hokkaido University, Japan
Experience in imaging and characterisation of metal, polymer, III-V group compound
semiconductor and Organic Light Emitting Devices (OLED), biological and other
samples in controlled air, liquid and vacuum environments with Scanning Probe
Microscopy (SPM) in more than 10 modes, Confocal Laser Scanning Microscopy
(CLSM) in 5 modes Confocal Profilometry, Hyperspectral Imaging for Materials
Characterisation, and Scanning Electron Microscopy (SEM);
Advanced Image Analysis with ImageJ, Fiji, MetaMorph, ImagePro Plus, and other
(customized) software packages;
o Development of protocols for Quantitative Fluorescence Microscopy, Massey
University, New Zealand
o 3D reconstruction of sheep fetus tissue from single sections for light
microscopy, Massey University, New Zealand
o microparticles characterization, Bauman University, Russia
Development of Collaborative Environment
o MIAWiki, a Collaborative Environment for Microscopy and Image Analysis
featuring more than 1000 Web pages and Knowledge Nodes;
o Development of DataBases on Fluorescence Microscopy Applications and
Image Analysis Functions.
EDUCATION
2008 – papers on Biology of Cells and Biology of Plants, Massey University, Palmerston
North, New Zealand
2008 – Workshop on Advanced Confocal Microscopy, Leica Microsystems/University of New
South Wales, Sydney, Australia
1995 - 2000 – research and PhD student, a Scholarship of the Japanese Ministry of
Education, Culture, Sports, Science and Technology (Monbukagakusho); Research Centre
for Interface Quantum Electronics, Hokkaido University, Sapporo, Japan
1994 - Certified Engineer for Research, Machinery for Electronics Industry, Moscow Bauman
State Technical University, Moscow, Russia
1990 - Certified Mechanical Engineer, Machinery for Electronics Industry, Moscow Bauman
State Technical University, Moscow, USSR
DISTINGUISHED APPOINTMENTS
2011 – Honorary Research Associate, Massey University, Palmerston North, New Zealand
PROFESSIONAL EXPERIENCE
April 2007 to July 2011
Manager of Confocal Microscopy, Manawatu Microscopy and Imaging Centre (MMIC),
Institute of Molecular BioSciences, Massey University, Palmerston North, New Zealand.
Responsibilities:
 Development of research programs based on confocal and fluorescence microscopy.
 Supervision and training users on confocal, light and fluorescence microscopy.
 Technical assistance and advise to the users of MMIC.
 Maintenance of equipment.
Achievements:
 Initiated, consulted and supervised a number of projects on preparation, imaging and
analysis of symbiosis of fungi and ryegrass, characterisation of wood structures, plant
root, stem and internodes, fat/protein/polysaccharides emulsions, milk and cheese,
whole brain of fly, tight and gap junctions in animal tissues, dendritic cells, etc.
 Developed principles of Multi-Channel Absorption Microscopy.
 Developed tilt compensations stage for Scanning Laser Confocal Microscopy.
 Trained over 100 users for confocal, light and fluorescence microscopy.
 Supervised and supported over 80 users per year.
 Gradual increase in service sales. 90% increase at the year 2010 compared to the
year 2009.
 Organized MMIC teleconferences on X-ray microtomography with Xradia, USA;
Quantification of connexin formation in damaged horse muscle tissues with
Ophthalmology & Translational Vision Research, Auckland University, New Zealand;
Combined confocal/AFM/Raman microscopy and spectroscopy, Coherent Scientific,
Australia, etc.
 Organized MMIC Workshop on Confocal Microscopy and Image Analysis.
 Preparation and delivery of lectures and seminars on basics of confocal microscopy.
 Prepared Lab on Confocal Imaging and 2D and 3D Image Analysis of chromosomes at
different mitotic stages with MetaMorph and MBF ImageJ software packages.
 Prepared manuals for confocal, fluorescence and light microscopes at MMIC.
 Developed Server of Ready Solutions principles as a fundamental tool for Technology
of Research.
 Developed Interactive Collaborative Workspace for Microscopy and Image Analysis
(hosting currently over 350 Web pages and knowledge nodes).
 Developed open database on Applications of Fluorescence Microscopy.
 Developed open database on Image Analysis Functions including MetaMorph, MBF
ImageJ, Fiji, ImagePro Plus, Volocity and LAS AF image software packages (over 100
functions).
January 2006 to January 2007
Senior Researcher, CTO Analysis Team, Samsung SDI Co., Ltd., Yongin-si, Korea.
Responsibilities:
 Research and development on combined analytical techniques for molecular,
semiconductor and plasma electronic devices characterisation.
 Research and development on processes and mechanisms of molecular kinetics in
surfaces, thin films and interfaces for display applications.
 Projects management: concept development, proposals writing, experiments planning,
personnel training, preparation of papers, reports, presentations and equipment
requests, correspondence and communication with in-house and external managers,
clients, analysts, engineers and staff.
Achievements:
Methods and techniques for molecular electronic devices characterisation and analysis are
proposed. OLED surface and ultrashallow cross-sections preparation techniques based on
SPM-based nano-machining and ultra-microtomy are realised (first successful result in the
world practice). Performed critical dimension metrology of organic and polysilicon samples.
Scanning Spread Resistance Microscopy (SSRM), Scanning Capacitance and Scanning
Kelvin Probe characterisation are implemented.
November 2002 to October 2004
Project Researcher, Project 5.15 “Quantitative Scanning Probe Microscopy”, PhysikalischTechnischen Bundesanstalt, Braunschweig, Germany,
Responsibilities:
Leader of the sub-project “Combined confocal and scanning probe microscopy” featured
diamond tip based tuning fork sensor.
 Developed concept of nano-coordinate measuring machine.
 Design, development and research on interferometrically controlled combined confocal
profilometer – scanning probe microscope.
 Development of electronics for setup control and signal detection.
 Data acquisition and analysis.
 Preparations of papers, reports and presentations.
 Work co-ordination through the group of mechanical and electrical engineers and
consultation with leaders of the corresponding divisions, experts and colleagues.
Achievements:
 Development of interferometrically controlled combined confocal profilometer and
scanning probe microscope with resolution limited by the light diffraction and tip
shape correspondingly.
 Application of the natural diamond as SPM probe tip.
 Development of the optical confocal and acoustic triggering method for automatic nondestructive SPM tip approach from mm range down to sub-nm scales (first successful
result in the world practice).
 Development of the operable in ambient conditions mechanically non-balanced tuning
fork SPM sensor with controlled quality factor in the range 300 – 60 000 (world record).
September 2000 to October 2002
Researcher, Laboratory for Scanning Tunnelling Microscopy and Spectroscopy, Institute for
Analytical Instrumentation, Russian Academy of Sciences, St.-Petersburg, Russia.
Responsibilities:
 Research and development of combined electron – scanning probe microscope.
 Research and development of combined optical – scanning probe microscope.
 Research on probe-sample interaction in vacuum.
 Performed preparations of papers, reports and presentations.
Achievements:
Development of installation for complex research of SPM probe – sample interaction in
vacuum with combined tunnelling current – dynamic mode detection techniques.
April 1994 to March 1995
Researcher, Leading Engineer, Research Institute for Materials and Technological
Processes, Moscow Bauman State Technical University, Moscow, Russia.
Responsibilities:
 Research and development on detection of micro-particles on surfaces in vacuum
 Preparation and delivering of tutorials, demonstrations, lectures and seminars
Achievements:
 Development of artificial vision system integrated into the wafers loading chamber of
automated technological lines for semiconductor industry (no analogues known).
CHAPTERS IN BOOKS
 Sokolov, D. V. “AFM for Protein Nanotechnology” in Gerrard: Protein
Nanotechnology, 2nd Edition, “Methods in Molecular Biology” Series, Humana
Press Inc., Totowa, NJ, in process.
 Sokolov, D. V.; Kazantsev, D. V.; Tyrrell, J. W. G.; Danzebrink, H.-U. "Combined
confocal and scanning probe sensor for nano-coordinate metrology" in
Wilkening, Koenders (Eds.): Nanoscale Calibration Standards and Methods:
Dimensional and Related Measurements in the Micro- and Nanometer Range,
WILEY-VCH, Berlin, May 2005, p. 131-143.
 Sikora, A.; Sokolov, D. V.; Danzebrink, H.-U. "Scanning probe microscope setup
with interferometric drift compensation" in Wilkening, Koenders (Eds):
Nanoscale Calibration Standards and Methods: Dimensional and Related
Measurements in the Micro- and Nanometer Range, WILEY-VCH, Berlin, May
2005, p.109-118.
WORKSHOPS
2011 – “Microscopic analysis of structures in foods” at Short Course in Food Structure,
Riddet Institute, Massey University, Palmerston North, New Zealand
http://riddet.massey.ac.nz/event/short-course-in-food-structure
2009 – “Information Systems in Microscopy and Image Analysis” at Workshop on Confocal
Microscopy and Image Analysis, Leica Microsystems/MMIC, Massey University, Palmerston
North, New Zealand
LANGUAGES
Russian, Japanese, German
HOBBIES
Aikido, skis
WORK REFEREES
Rosie Bradshaw, A/Professor
Institute of Molecular Biosciences
Riddet Road, Massey University
Private Bag 11-222, Palmerston North
Phone: +64 6 356 9099 x2567
Email: R.E.Bradshaw@massey.ac.nz
Piotr Kulpinski, Ph.D., D.Sc.
Technical University of Lodz
Faculty of Material Engineering and Textile Design
Department of Man-Made Fibers
ul. Zeromskiego 116
90-924 Lodz
Poland
Phone: +48 42 631 3359
Fax: +48 42 637 2040
Email: Piotr.Kulpinski@p.lodz.pl
Jae-Hak Lee, Vice-President
Leader of CTO Analysis Team
Analysis Team, Corporate R&D Center,
Samsung SDI,
Yongin, Gyeonggi-do
South Korea
Email: jhak@samsung.com
CHARACTER REFEREES
Peter Kitin, Ph.D.
Laboratory for Wood Biology and Xylarium
Royal Museum for Central Africa
Leuvense steenweg 13
B-3080 Tervuren
Belgium
Phone: + 32 (0) 2 769 56 12
Fax:+ 32 (0) 2 769 52 42
Email: Peter.Kitin@oregonstate.edu