Scanning Electron Microscope (SEM) Laboratory
Scanning Electron Microscope (SEM)
The Scanning Electron Microscope (SEM) has, over the last decade, become
an essential tool for materials research. The SEM in the Mechanical
Engineering Department is equipped with a secondary electron (SE) detector
and a back-scattered electron (BSE) detector, which together with an EDS
(Energy Dispersive X-ray Spectroscopy) system, enable chemical analysis.
The SEM is used by ORT Braude College researchers in their projects and to
teach students about high resolution microscopy.
Stereoscope
A stereoscope is an optical
microscope of a special kind,
characterized by a large depth of field
compared to a conventional optical
microscope. The device provides a 3D
image of objects viewed through it.
These capabilities make the
stereoscope essential for SEM
filament replacement.
Sputtering Machine
Physical vapor deposition of an Au layer on the top surface of specimens, via a
sputtering machine, is one stage in the SEM specimen preparation process. The Au
layer improves the specimen's conductivity and hence better imaging and higher
resolution are obtained. Non-conductive specimens can be studied after Au
sputtering as well.