Agilent IC-CAP Device Modeling 1/f Noise Measurement Configuration
Characterization with 1/f Noise Measurement Solution
Flicker noise or 1/f noise is an important noise source generated at low frequencies. The noise can cause
severe effects on many RF applications. The challenge facing modeling engineers is the ability to measure
the noise with precision. The Agilent IC-CAP Device Modeling Configurations can be extended to add 1/f
noise measurement capability with good accuracy. Controlled by IC-CAP device modeling software,
accurate and reliable measurements can be extracted and analyzed with the IC-CAP Modeling Suite
Software.
The measurement configuration consists of the following major components:
 Agilent 4156C Semiconductor Parameter Analyzer with two Source Monitor Units (SMU’s)
 Agilent 35670A Dynamic Signal Analyzer
 Stanford Research SR570 Low Noise Current Amplifier (available only from Stanford Research)
 Digital Voltage Multimeter DMM
 Low-Pass Band Filter (schematics provided)
 G-S-G Probes for On-Wafer Measurement (available from third party companies such as Cascade
Microtech)
 Cables and Adapters
The following is a block diagram of the 1/f Noise Measurement Solution:
The following IC-CAP software modules are basic requirements for a 1/f noise measurement solution:
 85199A IC-CAP Software Environment
 85199B IC-CAP Analysis Module
 85199D DC Measurement Drivers
 85199G Noise Measurement Drivers
 85195B 1/f Noise Modeling Package
Note: 85199A, B, and D are included in the 85190A IC-CAP Modeling Suite
Material List for the 1/f Noise Measurement Solution
Quantity
Part Number
Description
Notes
1
1
2
2
2
1
2
2
1
1
1
4156C
35670A
1250-0080
1250-1700
1250-3231
8120-1839
8120-2582
8120-5068
16494A #002
85102-20230
85102-20233
PSPA
Dynamic Signal Analyzer
Adapter, BNC barrel (f-f)
Adapter, BNC (m), SMA (f)
Adapter, BNC (f), Triax (m)
Cable, Coax, BNC, 0.61 m
Cable, Coax, BNC, 1.5 m
Cable, Coax, SMA 0.61 m
Cable, Coax, Triax 3 m
Lowpass Bipolar Filter
Lowpass CMOS Filter
Required
Required
Required
Required
Required (Open Guard)
Required
Required
Required
Required
Provided with purchase of 85195B*
Provided with purchase of 85195B*
Optional
1
1
Hardware
SR570
34401A
Description
Stanford Research LNA
Digital Multimeter
Required
A voltmeter is needed to measure the
voltage out of LNA. The 34401A can
be replaced by a handheld voltmeter
* 85195B 1/f Noise Modeling Package is a parameter extraction module for modeling 1/f Noise
from BJT and MOSFET devices.
Notes:
The Stanford Research Low Noise Current Preamplifier, Model SR570, can be ordered from:
Standford Research
1290-D Reamwood Ave.
Sunnyvale, California 94089 USA
Phone: (408) 744-9040
Fax: (408) 744-9049
e-mail: info@thinkSRS.com
www.srsys.com