Physics of XRF
X-ray fluorescence is a technique used for the elemental and chemical analysis of the surface of
materials such as glass, ceramics, and metals. It works by identifying the characteristic emission of
secondary X-rays from a material that has been excited with high energy X-rays.
Figure 1 below illustrates the steps that occur during the XRF process. This technique works by having a
high energy X-ray source and using it to excite the surface of the desired sample. If the incoming X-ray
has enough energy and is absorbed by an atom in the surface, and innermost electron will be ejected.
This phenomenon is known as the photoelectric effect. As result, a vacancy is created and the atom is
left in a unstable condition. Electrons in outer shells in the atom will then move in to cover this vacancy
seeking the lowest energy state possible. The change in energy difference between the shells the
electron moves is given of as a characteristic x-ray. By detecting and measuring the energy of this x-ray
that is unique for each element, one is able to determine the composition of the sample.
Figure 1- XRF process. Step 1- Incoming x-ray excites the atoms and as result emits a photoelectron.
Step 2- Electron in higher energy shell L, moves to shell K. A resulting x-ray is emitted with an energy
equal to the difference in energy between the transition of shells.
Example of XRF
Here please write the report of your study done at the lab using the portable XRF. Briefly include a
description of the sample preparation, steps of the XRF study, data, analysis and references. As long as
needed.
In these lab the elemental composition of three different ceramic samples was determined using the XMET 3000TX x-ray fluorescence analyzer. The data file obtained was then post-processed using the
PyMca software.
Data calibration process
Figure 3- XRF spectrum obtained for sample 17005(F)
Figure 4- XRF spectrum obtained for sample 17005(G)
Figure 5- XRF spectrum obtained for sample 17310
References

Amptek website
http://www.amptek.com/xrf.html