Bruker AFM Workshop with 5th AFM BioMed Conferences
Bruker Nano Surfaces is pleased to invite you to the Bruker AFM Workshop, on 7 May 2013,
1st day of 5th AFM BioMed Conferences. This workshop will
be an informative session on the latest innovations and trends in AFM metrology and their
applications.
Bruker AFM Workshop Schedule
Time:
9:00–17:00, 7 May 2013
Address: 239 Zhang Heng Road, Pudong New District, Shanghai, China
9:00-9:30
Register
9:30-9:40
Welcome Speech and intro to Bruker Nano Surfaces
Jeffrey, Bruker Nano Surfaces, China
9:40-10:30
Development in Life Sciences Atomic Force Microscopy：Significant Improv
Temporal Resolution
Dr. Long Fei/Qiu Dengli, Bruker Nano Surfaces，China
10:30-11:20
Beyond Images: Biological Specific Properties Measurement by AFM
Dr. Sun Wanxin,, Bruker Nano Surfaces, APAC, Singapore
11:20-12:10
Experiment tips for life science research: how to culture perfect cells, prepar
modify probes and get high resolution cells’ AFM images.
Dr. Li Ang,, Bruker Nano Surfaces, APAC, Singapore
12:10-13:30
Lunch
14:00-17:00
Q&A
DEMO
For more details and registration, please fill the below registration form and reply to
lin.niu@bruker-nano.com or sales.asia@bruker-nano.com
Seats are limited. Sign up today!
Sincerely,
Bruker Nano Surfaces Division
Table 1: Bruker AFM Work Shop Registration Form
University/Institute
Name
Department
Field of Research
Type of Product
Title
Attendee 1
Title
Attendee 2
Mail-Address
Phone
Mobile Phone
E-Mail
Note
Fax