IEEE SCC21 Standards Development
Study Group Meeting Minutes for Amendment 1 to
IEEE Std 1547.1-2005 (test procedures for equipment interconnecting
distributed resources with electric power systems)
August 15 – 16, 2013 (San Francisco CA)
A study group meeting on potential changes to IEEE Std 1547.1 (test procedures) was held for the
purpose of discussing what changes to IEEE Std 1547.1 might be necessary in relation to IEEE Std P1547a
Amendment 1 to 1547 (then at ballot).
The attendees (Attachment A) were welcomed by Tom Basso SCC21 Vice Chair, Dick DeBlasio IEEE
SCC21 Chair, and Jim Daley Chair of IEEE Std 1547.1-2005 (and co-chair of P1547a). Tom presented the
agenda and IEEE introductory slides (Attachment B) with further information on 1547 background
presented by Dick. He focused on IEEE SCC21 activities and plan for future full revision of the IEEE 1547.
He mentioned that a meeting on 1547 full revision would be in IEEE headquarters area (Piscataway/New
Brunswick NJ) early December 2013. On answering a query, Dick mentioned that the December meeting
will be open (as usual) to everyone including ISOs/RTOs, NERC, FERC, and all individuals interested in
distributed energy resources interconnecting with the grid.
Jim Daley gave a presentation some background on IEEE 1547.1. He also discussed the status of the
P1547a which was under ballot. He mentioned that at the June SCC21 testing workshop held the day
before the June P1547a meeting, the participants established the IEEE 1547.1a proposed PAR for
amendment 1 to IEEE 1547.1 and that PAR was submitted to IEEE Standards Board (subsequently
approved).
Jim opened the discussion on IEEE 1547.1a concepts by presenting slides for consideration (Attachment
C). In his early slides Jim stated he challenged the group that no changes would be required for IEEE
1547.1 testing of response to area EPS abnormal voltage and frequency. This blanket statement drew
pointed disagreement from various participants. However, Jim in later slide showed he accounted for such
concerns by considering draft test procedures first for voltage regulation and then look back into the
voltage and frequency tests in relation to the draft tests and concerns raised during the establishment of
the voltage regulation draft test(s).
Specifically for 1547.1a testing response to abnormal voltage and frequency, it was stated for example
that volt-VAR type of advanced functions could affect the operations of abnormal voltage and/or
frequency trip and need to be considered in the abnormal voltage/frequency trip tests.
Additionally concerns were raised as to whether or not testing for unintentional islanding might be
impacted by the new voltage and frequency IEEE 1547a revisions. Though Jim stated we would provide
such concerns to the group on full revision of IEEE 1547 and IEEE 1547.1, Jim stated his position that he
was not yet convinced that IEEE 1547.1a would require revisions to the IEEE 1547.1 unintentional
islanding test procedures. In contrast, various participants thought it would be necessary and proper to at
least consider islanding test revisions for IEEE 1547.1a. Participants didn’t have definitive
results/experience to cite one way or another. .
Discussion then addressed defining draft test procedures for voltage regulation testing, initially focusing
on “Type (Design) Tests.” Various topics were generally discussed such as steady-state versus dynamic
testing, different volt-VAR modes for voltage regulation, fixed VAR/power factor operation, autonomous
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 1
operation, Information-Communications Technology (ICT) based operation of the advanced inverters,
intentional delays, dead bands, hysteresis, and response time.
A pre-publication draft report on inverter interoperability testing was brought up as an example for
consideration [Test Protocol for Advanced Inverter Interoperability Functions - V22, Sandia National
Labs]. Jim then displayed the current IEEE 1547.1 standard to show the group the format and style as a
model for establishing the draft procedures for the P1547.1a amendment.
A participant, Aminul Huque from EPRI, volunteered and drafted a “strawman” version of a test
procedure for fixed reactive power operation, building upon the Sandia report and drafted into the 1547.1
style. Once completed, the strawman draft was revised with the group and further formatted into the IEEE
1547.1 style. (Attachment D – Initial Draft Type-Test Procedures for Voltage Regulation).
During discussions, the group debated specifics for that voltage regulation test procedure as well as
additional topics that are actually in other parts of the IEEE 1547.1 standard, such as EPS simulator
requirements, error margins, the number of times each test needs to be repeated, etc. Various sections
of the IEEE 1547.1 document were referred back to, such as clause 4 and Annex A. Those sections
provide more detail to clarify some of the topics of discussions.
Discussions on day 2 started with the second method of voltage regulation through volt-VAR profiles.
Mischa Steurer from Florida State University volunteered and drafted a “strawman” version of the test
procedures for the volt-VAR advanced functions. Detailed discussions followed on each of the steps
drafted and revisions made to the initial version (see Attachment D). Some discussion points addressed
testing for input power variation, e.g., which would especially be required in consideration for PV
system inverter output that varies with irradiance changes and temperature. In the existing IEEE 1547.1,
some tests are conducted at various power levels.
It was also discussed that the test procedures need to be generic enough to accommodate different
technologies but at the same time detailed enough to test manufacturer specified volt-VAR curves such
as a curve with deadband and/or hysteresis. Various other topics were discussed such as how to balance
“over-testing” that would add complexity/cost versus what would be technically appropriate; one phase
versus 3-phase testing; and, considerations of the certification rules in differing jurisdictions (e.g.,
Europe versus USA). A number of these concerns are similarly already addressed in IEEE 1547.1.
In closing, Jim told that the participants the above two basic draft test procedures developed during the
meeting would be available at the IEEE 1547.1a website and would be requested to be commented on
using comment form. Also it was announced that the next meeting would continue on developing test
procedures for other modes of volt-VAR operation (such as ICT based). Also Jim reminded everyone to
reread IEEE 1547.1 especially to consider if their concerns are already covered elsewhere in 1547.1.
Next actions
 Next meeting would likely be early December in NJ near IEEE headquarters.
 The listserv will be used to solicit review of these minutes Attachment D materials developed and
solicit volunteers for additional draft test development.
The meeting was adjourned around 11:15 am.
Respectfully submitted,
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 2
Tom Basso, SCC21 Vice Chair and Secretary, Dick DeBlasio, SCC21 Chair,
and Jim Daley IEEE Std 1547.1 Chair.
--------------------------- -----------------------------------------------Attachment A – Attendees
Last Name
First Name
Affiliation
Arjona
Basso
Bravo
Brigandi
Ceglia
Cleveland
Coddington
Connelly
Daley
Diong
Enayati
Ernst
Furukawa
Hamon
Hironori
Huque
Igbokwe
Inzunza
IRIE
Johnson
Kazuto
Lydic
Mazy
Nunneley
Razon
Saint
Salas
Schoder
Scroggins
Sheehan
Siira
Steurer
White
Woodcock
Zgonena
Daniel
Tom
Richard
Michael
Matthew
Frances
Michael
Nancy
James M
Mamadou
Babak
Bernhard
Motoko
Marvin
Iwasaki
Mohammad Aminul
Chinedu
Ruben
Hiroshi
Gerald
Maeda
Brian
Anthony
John
Alvin
Bob
Roger
Karl
Rich
Michael
Mark
Mischa
Robert
Gordon
Tim
Idaho Power
National Renewable Energy Lab (NREL)
Southern CA Edison (SCE)
NSTAR Electric MA
IEEE
Xanthus Consulting International
National Renewable Energy Lab (NREL)
Duke Energy
Facilities Electrical Consulting Services
Dominion Virginia Power
National Grid
SMA Solar Technology AG
TMEIC
Hamon Engineering Inc
Mitsubishi Research Institute
Electric Power Research Institute (EPRI)
Solectria Renewables LLC
TMEIC
Mitsubishi Research Institute
Basler Electric Company
NEDO/Japan
Fronius USA
California Public Utilities Commission
SunSpec Alliance
DOE Sunshot
NRECA
Southern CA Edison (SCE)
CAPS @ FSU
Cummins Power Generation
IREC
ComRent International
Florida State University
Power-One Inc.
KACO new energy
UL LLC
P1547.1a meeting Aug 15 – 16, 2013 Notes
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Attachment B – Introductory Slides and Agenda
Slide 1
IEEE SCC21 Standards Development
P1547.1a Study Group Meeting Aug 15 - 16, 2013, San Francisco CA
http://grouper.ieee.org/groups/scc21/1547.1a/1547.1a_index.html
P1547.1a Amendment 1 to
IEEE Std 1547.1-2005
SCC21 Chair: Dick DeBlasio
SCC21 Vice Chair Tom Basso ,
Thomas.Basso@nrel.gov
Jim Daley, IEEE Std 1547.1 Chair
Matt Ceglia. IEEE Standards Dept.
1
Slide 2
IEEE SCC21 Standards Development
P1547.1a Study Group Meeting Aug 15 - 16, 2013, San Francisco CA
P1547.1a Amendment 1 to IEEE Std 1547.1
Scope and purpose:
Consider 1547.1 potential changes for
addressing IEEE Std 1547 Amendment 1.
2
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 4
Slide 3
Agenda – P1547.1a Aug 15 – 16, 2013
Thurs. 8 am – 8:30 am
Thurs. 8:30 am – 9:15 am
Thurs. 9:15 am – 10 am
(break to 10:20)
Thurs. 10:20 am – 5 pm
(lunch on your own;
break at 3 pm)
Fri.
8 am – 8:30 am
Fri.
8:30 am – 12 pm
(break included )
Fri.
Noon
Check in
Welcome: opening of meeting –
scope and purpose; IEEE required
statements, agenda.
Background1547.1 and P1547a
Amendment 1
Review and discussion
Check in
Discussion; future actions
Adjourn – Thank you!
3
Slide 4
TENTATIVE Next Actions: 1547 series
Next Meetings – early December? (1st week “likely”?)
IEEE 1547.1a Amendment 1 (test procedures)
IEEE 1547 full revision workshop
IEEE 1547a Amendment 1 (V regulation, response to area
EPS abnormal conditions of V and frequency) at ballot July –
Aug 2013; to IEEE publications Sept?
P1547.7 (impacts of DR on distribution) – at recirculation;
to IEEE publications group Sept. 2013?
P1547.8 (recommended practices/”how-to”) to IEEE ballot
in 2014 (Draft 6 Nov 2013)
4
9/19/2013
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 5
Slide 5
IEEE 1547 Interconnection Standards
P1547a -- Amendment 1: at ballot Jul–Aug 2013; to IEEE publications Sept.’13
1547.1 - 2011 Conformance Test Procedures for Equipment Interconnecting DR
with EPS Reaffirmed in 2011
1547.1a Amendment 1 – initiated Aug 2013
1547.2 - 2008 Application Guide for IEEE 1547 Standard for Interconnection of
DR with EPS
1547.3 - 2007 Guide for Monitoring, Information Exchange and Control of DR
1547.4 - 2011 Guide for Design, Operation, & Integration of Distributed
Resource Island Systems with EPS
1547.6 - 2011 Recommended Practice for Interconnecting DR With EPS
Distribution Secondary Networks
P1547.7 Draft Guide to Conducting Distribution Impact Studies for DR
Interconnection -- ballot recirculation Aug 11, 2013 (21 days)
http://grouper.ieee.org/groups/scc21/index.html
1547- 2008 Standard for Interconnecting Distributed Resources
with Electric Power Systems
P1547.8 Recommended Practice for Establishing Methods and Procedures that
Provide Supplemental Support for Implementation Strategies for Expanded
Use of IEEE Standard 1547
Slide 6
IEEE Standards Classification
Standard: documents with mandatory requirements
(shall)
Recommended Practice: documents in which
procedures and positions preferred
by the IEEE are presented (should)
Guide: documents in which alternative (different)
approaches to good practice are suggested but no
clear-cut recommendations are made (may)
6
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 6
Slide 7
Participants, Patents, and Duty to Inform
All participants in this meeting have certain obligations under the IEEE-SA
Patent Policy. Participants:

“Shall inform the IEEE (or cause the IEEE to be informed)” of the identity of
each “holder of any potential Essential Patent Claims of which they are
personally aware” if the claims are owned or controlled by the participant or
the entity the participant is from, employed by, or otherwise represents

“Personal awareness” means that the participant “is personally aware that the
holder may have a potential Essential Patent Claim,” even if the participant is not
personally aware of the specific patents or patent claims
“Should inform the IEEE (or cause the IEEE to be informed)” of the identity
of “any other holders of such potential Essential Patent Claims” (that is,
third parties that are not affiliated with the participant, with the participant’s
employer, or with anyone else that the participant is from or otherwise
represents)

The above does not apply if the patent claim is already the subject of an
Accepted Letter of Assurance that applies to the proposed standard(s)
under consideration by this group
Quoted text excerpted from IEEE-SA Standards Board Bylaws subclause 6.2
Early identification of holders of potential Essential Patent Claims is strongly
encouraged
No duty to perform a patent search



7
Slide 8
Patent Related Links
All participants should be familiar with their obligations
under the IEEE-SA Policies & Procedures for standards
development.
Patent Policy is stated in these sources:
IEEE-SA Standards Boards Bylaws
http://standards.ieee.org/guides/bylaws/sect6-7.html#6
IEEE-SA Standards Board Operations Manual
http://standards.ieee.org/guides/opman/sect6.html#6.3
Material about the patent policy is available at
http://standards.ieee.org/board/pat/pat-material.html
If you have questions, contact the IEEE-SA Standards Board Patent Committee
Administrator at patcom@ieee.org or visit http://standards.ieee.org/board/pat/index.html
This slide set is available at http://standards.ieee.org/board/pat/pat-slideset.ppt
8
P1547.1a meeting Aug 15 – 16, 2013 Notes
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Slide 9
Call for Potentially Essential Patents

If anyone in this meeting is personally aware
of the holder of any patent claims that are
potentially essential to implementation of the
proposed standard(s) under consideration by
this group and that are not already the
subject of an Accepted Letter of Assurance:



Either speak up now or
Provide the chair of this group with the identity of the
holder(s) of any and all such claims as soon as possible or
Cause an LOA to be submitted
9
Slide 10
Other Guidelines for IEEE WG Meetings

All IEEE-SA standards meetings shall be conducted in compliance with
all applicable laws, including antitrust and competition laws.


Don’t discuss the interpretation, validity, or essentiality of patents/patent
claims.
Don’t discuss specific license rates, terms, or conditions.

Relative costs, including licensing costs of essential patent claims, of different technical
approaches may be discussed in standards development meetings.


Technical considerations remain primary focus
Don’t discuss or engage in the fixing of product prices, allocation of
customers, or division of sales markets.

Don’t discuss the status or substance of ongoing or threatened litigation.

Don’t be silent if inappropriate topics are discussed … do formally object.
---------------------------------------------------------------
See IEEE-SA Standards Board Operations Manual, clause 5.3.10 and “Promoting Competition and Innovation:
What You Need to Know about the IEEE Standards Association's Antitrust and Competition Policy” for
more details.
10
P1547.1a meeting Aug 15 – 16, 2013 Notes
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Slide 11
IEEE 1547 Series Web Site
1547 series public Web site
http://grouper.ieee.org/groups/scc21/dr_shared/





Meeting information
Registration Information
Agenda – for most recent meeting
Minutes
Listserv – listserv archived e-mails
11
Slide 12
P1547.1a IEEE ListServ
ListServ is for IEEE standards development use only.
IEEE code of ethics identified in information file sent to each
subscriber.
To: stds-p1547-1a@listserv.ieee.org
From: you@yourISP.com
Only subscribers can send to the list. Exchanges between individuals
and among your self-established small groups are encouraged.
ListServ e-mails are immediately sent to all subscribers.
Reply to all – sent to all
Reply to sender – only sent to sender
E-mail to listserv is auto-archived at
P1547.1a Work Group Area (public page) at ListServ
Archived e-mails can be viewed under
Subject Thread or Date Thread.
12
P1547.1a meeting Aug 15 – 16, 2013 Notes
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Slide 13
Future Activities: 1547 series
Next Meetings – early December or late November
IEEE 1547 full revision project planned start fall/winter 2013
IEEE 1547a Amendment 1 (V regulation, response to area
EPS abnormal conditions of V and frequency) initiated Nov
2012: at ballot July – Aug 2013; to IEEE publications Sept?
IEEE 1547.1a Amendment 1 (test procedures) initiated Aug
2013
P1547.7 (impacts of DR on distribution) – at recirculation;
to IEEE publications group Sept. 2013
P1547.8 (recommended practices/”how-to”) to IEEE ballot
13
in 2014
9/19/2013
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 10
Attachment C – 1547.1a Amendment Considerations Related to P1547a
Slide 1
IEEE 1547.1a
Aug 15, 2013 San Francisco CA
Amendment Considerations for
Harmonization with IEEE 1547a
By
James M. Daley, PE
Slide 2
IEEE 1547.1-2005
Title.
Standard for Conformance Test Procedures for
Equipment Interconnecting Distributed Resources
with Electric Power Systems
Scope.
This standard specifies the type, production, and
commissioning tests that shall be performed to
demonstrate that the interconnection functions
and equipment of the distributed resources (DR)
conform to IEEE Std 1547.
P1547.1a meeting Aug 15 – 16, 2013 Notes
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Slide 3
IEEE 1547.1-2005 Purpose
• Interconnection equipment that connects DR
to an electric power system (EPS) must meet
the requirements specified in IEEE Std 1547.
Standardized test procedures are necessary to
establish and verify compliance with those
requirements. These test procedures must
provide both repeatable results, independent
of test location, and flexibility to
accommodate the variety of DR technologies.
Slide 4
IEEE 1547.1-2005 Requirements
• Test sequences and criteria for success are
established in IEEE 1547 – 2003 Clause 5.
• Test regimens are established in IEEE 1547.1 –
2005 in clauses Clause 5, 6 & 7
P1547.1a meeting Aug 15 – 16, 2013 Notes
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Slide 5
IEEE 1547.1-2005 Tests
• Clause 5 Type Tests – confirm product design (
IEEE 1547 5.1)
• Clause 6 Production Tests – verify the
operability of every unit of interconnect
equipment manufactured for customer use ( IEEE
1547 5.2)
• Clause 7 Commissioning Tests - verify that the
completed and installed ICS meets the
requirements of IEEE Std 1547. ( IEEE 1547 5.4)
Slide 6
IEEE 1547.1a PAR
• Scope: This IEEE Std 1547.1a Amendment 1
establishes test regimens to verify
interconnection systems conformance to IEEE
Std 1547a Amendment 1 for voltage
regulation, and response to area EPS
abnormal conditions of voltage and
frequency.
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 13
Slide 7
IEEE 1547.1a PAR
• Purpose: Interconnection equipment that
connects DR to an electric power system (EPS)
must meet the requirements specified in IEEE Std
1547a. Standardized test procedures are
necessary to establish and verify compliance with
those requirements. These test procedures must
provide both repeatable results, independent of
test location, and flexibility to accommodate the
variety of DR technologies.
Slide 8
IEEE 1547a Amendments
• 4.1.1 – Voltage regulation
• 4.2.3. – Response to abnormal voltage
• 4.2.4 – Response to abnormal frequency
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 14
Slide 9
Voltage regulation
• 4.1.1
• The DR shall not actively regulate the voltage at
the PCC. Coordination with and approval of, the
area EPS and DR operators, shall be required for
the DR to actively participate to regulate the
voltage by changes of real and reactive power.
The DR shall not cause the Area EPS service
voltage at other Local EPSs to go outside the
requirements of ANSI C84.1-2011 1995, Range A.
Slide 10
Response to abnormal voltage
• 4.2.3.
– When any voltage is in a range given in Table 1, the DR
shall cease to energize the Area EPS within the
clearing time as indicated. Under mutual agreement
between the EPS and DR operators, other static or
dynamic voltage and clearing time trip settings shall
be permitted. Clearing time is the time between the
start of the abnormal condition and the DR ceasing to
energize the Area EPS. For DR less than or equal to
300 kW in peak capacity, the voltage set points and
clearing times shall be either fixed or field adjustable.
For DR greater than 300 kW, the voltage set points
and clearing times shall be field adjustable.
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 15
Slide 11
Response to abnormal frequency
• 4.2.4.
– When the system frequency is in a range given in Table 2,
the DR shall cease to energize the Area EPS within the a
pre-set clearing time as indicated. Under mutual
agreement between the EPS and DR operators, other static
or dynamic frequency and clearing time trip settings shall
be permitted. Clearing time is the time between the start
of the abnormal condition and the DR ceasing to energize
the Area EPS. For DR less than or equal to 30 kW in peak
capacity, the frequency set points and clearing times shall
be either fixed or field adjustable. For DR greater than 30
kW, the frequency set points shall be field adjustable.
Slide 12
Response to abnormal frequency
• 4.2.4. (Continued)
The frequency and time set points in Table 2 shall
be field adjustable. Adjustable under-frequency
(UF) and over-frequency (OF) trip settings shall be
coordinated with the Area EPS operatortions. DR
settings for frequency response shall be
coordinated with load shedding schemes of the
Area EPS.
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 16
Slide 13
IEEE 1547.1 Test Regimen
• 5.2 Test for response to abnormal voltage
conditions
– 5.2.1 Overvoltage
• 5.2.1.2 Magnitude
• 5.2.1.3 Time
– 5.2.2 Undervoltage
• 5.2.2.2 Magnitude
• 5.2.2.3 Time
Slide 14
IEEE 1547.1 Test Regimen
• 5.2 Test for response to abnormal voltage
• Original Standard requires no revision to meet
requirements of IEEE 1547a
P1547.1a meeting Aug 15 – 16, 2013 Notes
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Slide 15
IEEE 1547.1 Test Regimen
• 5.3 Test for response to abnormal frequency
conditions
– 5.3.1 Overfrequency
• 5.3.1.2 Magnitude
• 5.3.1.3 Time
– 5.3.2 Underfrequency
• 5.3.2.2 Magnitude
• 5.3.2.3 Time
Slide 16
IEEE 1547.1 Test Regimen
• 5.2 Test for response to abnormal frequency
• Original Standard requires no revision to meet
requirements of IEEE 1547a
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 18
Slide 17
IEEE 1547.1 Test Regimen
New Requirement
• Establish test regimen to verify IEEE 1547a
4.1.1
– Define device performance
– Define test regimen
– Establish criteria for success
Slide 18
Define device performance
• Does device respond to voltage variations
automatically
• Does control respond as a function of a preset,
algorithm or communicated input
• Is measure VAR, VA or pf
• Does control limit throughput current to
within the thermal capability of the device
and/or power source
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 19
Slide 19
Suggestion
• Resolve voltage regulation test regimen first,
this is new territory for the standard.
• Review Test regimens for response to
abnormal voltage and frequency to assure
that they are still adequate.
• Compile a list of additional revisions to this
standard that can be passed on to the working
group that takes on the full revision of this
standard.
Slide 20
Contact information
James M. Daley PE
Principal
Facilities Electrical Consulting Services
1942 Grigio PL
Easton, PA 18045
610 866 3673
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 20
Attachment D – Initial Draft Test Procedures
P1547.1a meeting Aug 15 to 16, 2013: onsite notes related to draft test
procedures based on P1547a Amendment 1
IEEE Std P1547a (voltage regulation draft text follows)
4.1.1 Voltage regulation (P1547a Amendment 1 draft wording)
Coordination with and approval of, the area EPS and DR operators, shall be required for the
DR to actively participate to regulate the voltage by changes of real and reactive power. The
DR shall not cause the Area EPS service voltage at other Local EPSs to go outside the
requirements of ANSI C84.1-2011, Range A.
--------------------------- ---------------------------------P1547.1a discussion/drafting development guidance established onsite.
-
Review IEEE Std 1547.1 especially clause 5, and clause 4 and Annex A.
Draft procedures should follow IEEE Std 1547.1 format (style will be harmonized to 1547.1
in future): Test title; Purpose; Procedure; Requirements; Criteria.
Please capitalize only the first word in a sentence and in headings; acronyms written as all
caps.
EUT -- equipment under test
Brainstorming topics – not for final P1547.1a draft:
-
Consider need for both steady state test and a dynamic test.
Characteristics required: ranges of and default values (default typically =
manufacturer setting if otherwise not mandated)
Example characteristics of concern: current, Voltage, VA, pf, VAR, Ramp rates?
More? And characteristic times, e.g., intentional delay, hysteresis, dead bands,
response time.
-------------------------- -------------------------------P1547.1 Clause 5 initial draft text follows as per working group discussion August 15-16,
2013 -- reformatting/numbering introduced after the meeting.
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 21
P1547.1 a
5. Type tests
…
5.13 Voltage regulation
The manufacturer shall specify the response characteristics of the EUT to respond to the
requirement to provide real and reactive power.
[The following categories will be redrafted as introductory text under 5.13].
Categories of voltage regulation testing follow. Each category is applicable to the three types of
DR stated in 1547: static power inverters/converters (aka inverter-based), induction machines,
and synchronous machines.
1. Where the EUT responds to variations in voltage the manufacturer shall
specify the response characteristics.
2. Where the EUT responds to input stimuli the manufacturer shall specify
the response characteristics.
3. Where the EUT responds to communicated settings the manufacturer
shall specify the protocol, means of communications and the response
characteristics.
4. Where the EUT responds to a time schedule the manufacturer shall specify
the response characteristics.
5.13.1 Voltage regulation test where the EUT responds to variations in voltage the
manufacturer shall specify the response characteristics.
5.13.1.1 Purpose.
The purpose is to test the response of the EUT to changes in voltage magnitude as provided by
manufacturer’s response characteristics. {If multiple characteristics are available, this test shall
be performed with each of the available settings. Record applicable settings}
5.13.1.2 Procedure.
This procedure uses the voltage ramp rates defined in 1547.1 Annex A and a series of test
voltage magnitudes sufficient to reproduce the manufacturer’s response characteristics (including
hysteresis, and dead band) with an accuracy to evaluate the manufacturer’s accuracy.
1. Connect the EUT according to the instructions and specifications provided by the
manufacturer.
2. Set all source parameters to the nominal operating conditions for the EUT.
3. Set (and verify) all EUT parameters to the prescribed operating settings
4. Ramp voltage down from the present voltage set point to the next using the ramp rate
defined in 1547.1 Annex A. Record the time domain response of real and reactive power.
P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 22
5. When EUT real and reactive power has reached steady state record values
6. Repeat 4 & 5 until the lowest operating voltage of the EUT is reached.
7. Ramp voltage up from the present voltage set point to the next using the ramp rate defined
in Annex A. Record the time domain response of the real and reactive power.
8. When EUT real and reactive power has reached steady state record values
9. Repeat 7 & 8 until the highest operating voltage of the EUT is reached.
10. Repeat 4 – 9 until 5 full sweeps through the entire voltage range have been completed.
Repeat test sequence 3 through 10 at power levels of the EUT specified by the manufacturer.
5.13.1.4 Requirements
5.13.1.5 Criteria
5.13.2 Voltage regulation test where the EUT responds to input stimuli the
manufacturer shall specify the response characteristics.
5.13.2.1 Purpose.
The purpose of this test is to verify the EUT changes its output of real and reactive power in
response to voltage variations as specified by the manufacturer.
5.13.2.2 Procedure {need to get description of acronyms}
Set the EUT mode to fixed VAR {consider separate procedure for each mode}
Set the “EPS test source to 1 pu” [then at manufacturer min V pu and manufacturer max V pu
operating conditions … e.g., 0.9 1.0 1.1]
a) Connect the EUT according to the instructions and specifications provided by the
manufacturer. Where the EUT requires a separate test input source to conduct this test, that
source shall be capable of supplying 150% of the input required to evaluate the EUT in this test
regimen.
b) Set all source parameters to the nominal operating conditions for the EUT.
c) Set (or verify) all EUT parameters to the nominal operating settings.
d) Set the EUT ac output power to nominal/rated value.
e) Set (or command) EUT to the reactive power to +Qmax_Pnom.
f) Record the active and reactive power generated by the EUT.
g) Plot the response in the specified parameter versus time.
h) Set (or command) EUT target reactive power to zero.
i) Repeat steps d) through g) four times for a total of five tests.
P1547.1a meeting Aug 15 – 16, 2013 Notes
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Table 5.13.2—Table 1 “Title”
Test Scenario
Reactive
Power
Real Power
#1
#2
+Qmax_Pnom -Qmax_Pnom
#3
+Qmax
Pnom
Pmax_+Qmax Pmax_Qmax
Pnom
#4
-Qmax
?
?
+Qmax_Pnom: Maximum +ve reactive var capability of EUT at nominal active power settings
-Qmax_Pnom: Maximum -ve reactive var capability of EUT at nominal active power settings
Pmax_+Qmax Maximum active power capability of EUT while generating +Qmax reactive
var
Pmax_-Qmax
Maximum active power capability of EUT while generating -Qmax reactive var
Pnom nominal power
5.13.2.3 Requirements
5.13.2.4 Criteria
5.13.3 Voltage regulation test where the EUT responds to communicated settings the
manufacturer shall specify the protocol, means of communications and the response
characteristics.
5.13.3.1 Purpose
The purpose of this test is to verify the EUT establishes its output of real and reactive power in
response to communicated commands as specified by the manufacturer.
5.13.3.2 Procedure
Manufacturer shall specify communication protocols
Manufacturer shall specify the communications media
Manufacturer shall … specify the data characteristics (times, throughput, synchronicity, etc. ).
Manufacturer shall specify the communication networks.
Manufacturer shall specify … how to change the settings.
5.13.3.3 Requirements
5.13.3.4 Criteria
P1547.1a meeting Aug 15 – 16, 2013 Notes
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5.13.4 Voltage regulation test where the EUT responds to a time schedule the
manufacturer shall specify the response characteristics.
5.13.4.1 Purpose
The purpose of this test is to verify the EUT establishes its output of real and reactive power in
response to a time schedule as specified by the manufacturer.
5.13.4.2 Procedure
5.13.4.3 Requirements
5.13.4.4 Criteria
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P1547.1a meeting Aug 15 – 16, 2013 Notes
Page 25