High open-circuit voltage, high fill factor single-junction organic solar cells Yuelin Peng†, Lushuai Zhang§, Trisha L. Andrew‡§* [†] Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706 [§] Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706 [‡] Department of Chemistry, University of Wisconsin-Madison, Madison, Wisconsin 53706 [*] corresponding author (email: tlandrew@wisc.edu) SUPPLEMENTAL INFORMATION Determination of Frontier Energy Levels with Cyclic Voltammetry Electrochemical measurements on 150 nm-thick films of DPP grown on a platinum button electrode (working electrode) were made in acetonitrile/NBu4PF6 electrolyte with a Pine Instruments Wavenow potentiostat using a quasi-internal Ag wire reference electrode (BioAnalytical Systems) submersed in 0.1M AgNO3 and a platinum wire counter electrode. The ferrocene/ferrocenium (Fc/Fc+) redox couple in dichloromethane was used as an external reference. An irreversible oxidation peak is observed (see Figure S1). The onset potential of the first oxidation peak is measured to be 1.05 V vs. Ag/AgNO3, or equivalenly 0.96 V vs. Fc/Fc+ (the ferrocene redox couple occurs at 90 mV vs. Ag/AgNO3). To convert this oxidation potential to the vacuum highest occupied molecular orbital (HOMO) level, we employ the linear relationship between oxidation levels obtained by cyclic voltammetry and HOMO levels obtained from ultraviolet photoemission spectroscopy that was previously established.S1 We arrive at a HOMO level of 5.9 ± 0.2 eV. In order to determine the lowest occupied molecular orbital (LUMO), we first use a previously-described empirical relationS2 to relate the optical bandgap (λ = 650 nm) to the transport bandgap (Et) of DPP. We then add Et to the HOMO level. Et is calculated to be 2.08 ± 0.2 eV and the LUMO level is calculated to be 3.8 ± 0.2 eV. Figure S1. Cyclic voltammogram for a 150 nm-thick DPP film grown on a platinum button electrode (working electrode) obtained in an acetonitrile/NBu4PF6 electrolyte with an Ag/AgNO3 reference electrode. Measurement of Optical Characteristics Figure S2. Absorption spectra for 20 nm-thick films of DBP (black) and DPP (red). Figure S3. Wavelength-resolved 1-Reflection (R)-Transimission (T) for a DBP/C60 based solar cell (blue triangles) and DBP/DPP based solar cell (black dots). Understanding DBP and DPP Contributions to EQE Figure S4. (a) Absorption spectra of the individual DBP (blue) and DPP (red) active layers overlaid onto the wavelength-resolved EQE of the PHJ device (black). (b) Plot of the residual arising from subtracting the DBP absorption spectrum from the EQE of the PHJ device. The residual largely coincides with the DPP absorption spectrum in the 450–600 nm range, indicating that DPP does contribute to the photoactivity of the PHJ solar cell. Understanding DBP and DPP Morphology Figure S5. X-ray Diffraction (XRD) data for MoO3 , DBP and DPP thin film layers grown on ITO. The blank ITO XRD data is also provided. All the samples were sequentially deposited by vacuum thermal evaporation in parallel. Film thicknesses were as follows: 5 nm MoO3, 150 nm DBP, 150 nm DPP. The broad peak from 18° to 38° arises from the amorphous glass substrate. Peaks at 21.8°, 30.9°, 35.8°, 45.9°, and 51.5° are assigned to ITO crystallites.S3 No unique diffraction peaks are observed for either the MoO3 film or DBP film, suggesting that both these layers are amorphous. Only a unique peak at 27.2° is observed for the DPP film, which corresponds to a d-spacing of 3.4 Å. This peak most likely arises due to intermolecular πstacking within the DPP layer; no long-range order is observed for the DPP film. Amorphous thin films with weak Van der Waals interactions between a donor and a acceptor were previously reported to yield lower JSO than crystalline materials,S4 suggesting that the largely amorphous nature of our DBP and DPP films also contribute to a high VOC. Figure S6. (a) and (b) AFM phase images of the surface of a 150 nm-thick DBP film on ITO\MoO3 (5 nm). (c) and (d) AFM phase images of the surface of a 150 nm-thick DPP film on ITO\MoO3 (5 nm) \DBP (150 nm). All films were deposited by vacuum thermal evaporation in parallel. The root mean square roughness of the DBP film is 0.63 nm and that of the DPP film is 3.4 nm. Distinct grains, indicating crystalline domains, can be observed on the surface of the DPP film, which is consistent with the unique XRD peak (d-spacing 3.4 Å) observed for the DPP film. In contrast, no such grains can be observed in AFM surface micrographs of the DBP film, indicating that the DBP film is amorphous (this is also corroborated by the absence of any diffraction peaks unique to the DBP film). The surface roughness observed in the AFMs of the DBP film arises from the underlying substrate. Diode Characteristics Figure S7. Ideality factors calculated from dark current densities of DPP based solar cell (black dots) and C60 based solar cell (blue triangles). Exploring the molecular origins of JSO We posit that the strength of intermolecular coupling at the D/A heterointerface is higher for a DBP/C60 interface, compared to a DBP/DPP interface. To support this hypothesis, we used Density Functional Theory (Gaussian, B97xD dispersion-corrected functional, aug-cc-pVDZ basis set) to obtain geometry-optimized structures of a Van der Waals bonded DBP-C60 dimer and a DBP-DPP dimer. We found that the intermolecular spacing in a DBP-DPP dimer is longer than that of a DBP-C60 dimer. Since orbital overlap and exchange interactions are exponentially dependent on distance, the longer intermolecular spacing in DBP-DPP is indicative of weaker coupling, to first degree. Figure S8. Geometry-optimized structure of DBP-C60 dimer obtained using Density Functional Theory (Gaussian, B97xD dispersion-corrected functional, aug-cc-pVDZ basis set). Figure S9. Geometry-optimized structure of DBP-DPP dimer obtained using Density Functional Theory (Gaussian, B97xD dispersion-corrected functional, aug-cc-pVDZ basis set). Supplemental Information References S1. S2. S3. S4. B. Dandrade, S. Datta, S. Forrest, P. Djurovich, E. Polikarpov, and M. Thompson, Org. Electron. 6, 11 (2005). P. I. Djurovich, E. I. Mayo, S. R. Forrest, M. E. Thompson, Org. Electron. 10, 515 (2009). M. D. Irwin, D. B. Buchholz, A. W. Hains, R. P. H. Chang, T. J. Marks, Proc. Natl. Acad. Sci. 105, 2783 (2007). M. D. Perez, C. Borek, S. R. Forrest, M. E. Thompson, J. Am. Chem. Soc. 131, 9281 (2009).