Supporting Information
Selective Control over the Lamellar Thickness of One Domain in Thin Binary Blends of
Block Copolymers Films
Sang-Byung Park and Wang-Cheol Zin
Department of Materials Science and Engineering, Pohang University of Science and
Technology, Pohang, Kyungbuk, 790-784, Republic of Korea
S1. Size exclusion chromatography (SEC) data for the block copolymers.
Figure S1 displays the SEC data for S42 and A122, which are provided from Polymer
Source Inc.
Figure S1. SEC data for the block copolymers: (a) S42, (b) A122
S2, S3, and S4. Atomic force microscopy (AFM) data for A122/S42 20/80, A122/S42
30/70, A122/S42 40/60 accrording to film thickness and mole fraction of styrene in
random brush.
Figure S2. AFM phase images of A122/S42 20/80. Film thickness is 21 nm (a-c), 24 nm
(d-f), and 29.4 nm (g-i). The mole fraction of styrene in the random brush is 0.62 (a,d,g), 0.65
(b,e,h), 0.68 (e,f,i). The images are 2 μm × 2 μm.
Figure S2 shows the AFM phase images of A122/S42 20/80. Perpendicular orientation was
shown at the film thickness of 21 nm and 24 nm. But, the ordering of pattern differed with the
mole fraction of styrene in the random brush. At the film thickness of 29.4 nm, perpendicular
orientation was partially existed.
Figure S3. AFM phase images of A122/S42 30/70. Film thickness is 21 nm (a-d), 26 nm
(e-h). The mole fraction of styrene in the random brush is 0.62 (a,e), 0.65 (b,f), 0.68 (e,g),
and 0.71 (d,h). The images are 2 μm × 2 μm.
Figure S3 shows the AFM phase images of A122/S42 30/70. Perpendicular orientation was
shown at the film thickness of 21 nm. But, the ordering of pattern differed with the mole
fraction of styrene in the random brush like the case of A122/S42 20/80. At the film thickness
of 26 nm, perpendicular orientation was getting disappeared as the mole fraction of styrene in
the random brush increased.
Figure S4. AFM phase images of A122/S42 40/60. Film thickness is 29 nm (a-c), 33 nm
(d-f), and 40.6 nm (g-i). The mole fraction of styrene in the random brush is 0.65 (a,d,g), 0.68
(b,e,h), 0.71 (e,f,i). The images are 2 μm × 2 μm.
Figure S4 shows the AFM phase images of A122/S42 40/60. When the mole fraction of
styrene in the random brush was 0.65, perpendicular orientation was kept until the film
thickness reached at 33nm. When mole fraction of styrene in the random brush was 0.68,
perpendicular orientation was shown at the film thickness of 29 nm. However, we did not
find the film thickness to induce the expected orientation at 0.71 mole fraction of styrene in
the random brush.