Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm Engineering Optics and Optical Techniques Lecture Note No. 7. Interferometer (Chapter 9) Fraunhofer Diffraction (Chapter 10) SUPERPOSITION OF PLANE WAVES (Sections 9.1, 9.2) E1 r ,t E o1 cosk1 r t 1 E 2 r ,t E o 2 cosk 2 r t 2 E E1 E2 , whose intensity is equal to the ensemble average of E 2 : I E 2 E1 E2 E1 E2 E2 E2 E12 E 22 2 E1 E2 o1 o 2 2 E1 E2 I1 I 2 2 E1 E 2 2 2 and the trigonometric identity (p.387) shows that 1 1 E1 E 2 E o1 E o 2 cosk1 r 1 k 2 r 2 Eo1 E o 2 cos 2 2 where represents the phase differential. If E o1 E o 2 / 2, I I1 I 2 , i.e., the flux density remains constant. Furthermore, if I 1 I 2 I o , I I1 I 2 2I o . If Eo1 Eo 2 0 , I I1 I 2 Eo1 Eo 2 cos I1 I 2 2 I1 I 2 cos Furthermore, if I 1 I 2 I o , I 2 I o 1 cos 4 I o cos 2 2 I max 4I o at 0, 2 , 4 , … I min 0 at , 3 , … *Condition of Interference: Optical Path Differential (OPD) < coherence length l c 1 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm Young’s Fringes … Wave Front Splitting Interferometry (Sec. 9.3) I 4 I o cos 2 with k1 r1 1 k 2 r2 2 k r1 r2 ka sin 2 2 ay s ( 1 2 for a single coherent source) ( r1 r2 lc for the interferometry condition) I 4 I o cos 2 ay s Locations of the brightest fringes are for y max ay 0, , 2 ,..., m : s ms , m 0, 1, 2, ... a *If OPD r1 r2 > l c , the contrast of the fringes will degrade or vanish. 2 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm Fizeau Fringes … Amplitude Splitting Interferometry (Sec. 9.4) Eir = Internal Reflection E2r = External Reflection Eir and E2r constitute a relative phase shift of (Fig. 4.44) 1 OPD = 2 nfd = m o for maximum or constructive interference. 2 1 Thus, d m m , m 0, 1, 2, 3,... 2 2 And d m 4 for m = 0 [Criterion for optical flat: *Example of a soap bubble: 3 … no random fringes] 4 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm OPD of Dielectric Coating or Thin Liquid Film OPD = n1 (AB + BC) – no AD, Snell’s law: no sin i n1 sin t AB = BC = d cos t AD = AC sin i AC Therefore, OPD = n1 n sin t 2d tan t 1 sin t no no 2n1d 1 sin 2 t 2n1d cos t cos t Phase differential, OPD o 2 OPD k o 4n1d o cos t 4d cos t ~ With , 3 , 5 ... for destructive interference, i.e., d Non-reflection coating thickness: o / 4ncoating 4 m aterial 3 , 4 4 4d 5 4 ; , ... Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm THIN FILM COATING (Sec. 9.7) More rigorous analysis For E Plane-of-Incidence, the boundary conditions constituting a conservation of tangential E component of E-field and H-field give: [Goal: rI rI 0 for non-reflection] EiI ' E I EiI E rI EtI E rII At boundary I: ' H I H iI H rI cos iI H tI H rII cos iII * o EiI E rI no cos iI o EtI E rII' n1 cos iII o o 1 , o , H * B E E H , n c o At boundary II: E II EiII ErII EtII H II o EiII ErII n1 cos iII o EtII ns cos tII o o The phase differential for the traverse through the film once is given as: OPDI II k o = so that o En o k o 2n1d cos iII k o h [1/2 of the OPD on p.4] 2 EiII EtI e i EtI e iko h and 5 ' ErII ErII e iko h Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm Combining ALL the above equations shown on p. 5 gives: E I E II cos k o h H I E II H II i sin k o h o n1 cos iII o o n1 cos iII i sin k o h H II cos k o h o In matrix form (for E-field perpendicular to the plane-of-incidence) cos k o h EI H I i sin k h o n cos o 1 iII o o n1 cos iII E II E o I II H II H II cos k o h i sin k o h * I : Characteristic Matrix that relates the fields at the two adjacent boundaries Similarly, for E-field parallel to the plane-of-incidence, cos k o h EI H I i sin k h o n / cos o 1 iII o o n1 / cos iII E II E o I II H II H II cos k o h i sin k o h 6 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm Antireflection Coatings Note that the characteristic matrix for antireflection coating condition is expressed for both E and E for iI iII tII 0 and k o h : 2 0 I i o n1 o o n1 o 0 i MASAGING ALL above equations, together with iI iII tII 0 , E rI n1 no ns cos k o h i no ns n12 sin k o h r1 EiI n1 no ns cos k o h i no ns n12 sin k o h With k o h , which is equivalent to d film 2 4 the reflectance at the boundary I is given as: R1 r r * 1 1 n n n n o o s s n12 2 and 2 2 1 n (called a “quarter-wave antireflection coating”), R1 0 when n12 no n s *For example, no 1, ns 1.80 (flint glass in Table 4.1), the coating material must have n1 1.342 and MgF2 ( n1 1.38 ) may be selected to use. The coating thickness is calculated as: d o for d 587.5618 nm from Table 6.1 4n1 7 = 106.44235 nm Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm For a double-layer of n1 and n 2 , I M II 0 i o n1 o 0 o n1 o 0 i o n2 o i o n2 n / n o 2 1 0 0 i n1 / n2 0 Also, the reflectance is given as, n 2 n ns n12 R2 22 o 2 n2 no ns n1 2 and R2 0 n when 2 n1 2 n s no Note that n2 n1 . The layers are referred as s (substrate: g-l-s)-H-L-a (air). For underwater lens, the coating thickness (d) and materials (n1, n2) must be different because of different no. 8 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm OPTICAL DIFFRACTION (Sections 10.1 and 10.2) R: smaller of S and P If R a2 … Fraunhofer diffraction (Far-field); similar diffraction patterns with increasing distance (Today) If R a2 … Fresnel diffraction (Near-field); varying shape of diffraction patterns with varying distance – (Lecture Note 9) 9 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm Coherent Line Source [the same , and the same polarization] Ei L ri sin t kri yi L : Source strength per unit length sin t kr dy L D / 2 r R E L D/2 D/2 D / 2 sin t krdy 10 for R >> y Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm SINGLE SLIT (slit width b) … R >> b and b << 1 E L R b/2 b / 2 sin t krdy and substituting r R y sin (This is also called a Fraunhofer condition) Carrying out the integration gives E I oc 2 L b sin sin t kR , R E 2 E 2 1 b L 2 R 2 2 kb b sin sin 2 2 sin sin I 0 I o sin c 2 (Table A-1) 11 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm DOUBLE SLIT (slit width of b and separation of a) E L R b/2 b / 2 sin t k R z sin dz L R sin t k R z sin dz a b / 2 a b / 2 Carrying out the integration gives, sin 2 cos 2 I 4 I o 2 with kb ka sin and sin 2 2 ya … Young’s fringes s If b 0, I 4 I o cos 2 4 I o cos 2 If a 0 , sin 2 sin 2 … single-slit of width 2b I 4 I o I 0 2 2 FOR N-EQUALLY SPACED SLITS: sin 2 I I o 2 sin N 2 sin 12 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm Arbitrary Shape Aperture R >>, and r >> aperture dimension dE A r e i t kr dS A R e i t kr dS … (1) r X 2 Y y Z z R 1 y 2 z 2 / R 2 2Yy Zz / R 2 2 2 since R X 2 Y 2 Z 2 R1 f ' ' 0 ... R1 ] 2! 2 Combining (1) and (2), and integrating w.r.t. the total aperture area will give, e ik Yy Zz / R Aperture 13 dS f 1/ 2 r R 1 Yy Zz / R 2 … (2) ~ A e i t kR E R 1/ 2 Taylor series expansion of r gives, [ f f 0 f ' 0 1/ 2 Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm CIRCULAR APERTURE (radius a) z cos , y sin Z q cos , Y q sin , dS dd Then, i t kR ~ Ae E R 2 a 0 0 ~ e i t kR E A R + e ik Yy Zz / R Aperture e i kq / R cos dd ~ A e i t kR Integrate it for 0 (axi-symmetry), E 2a 2 R / kaqJ 1 kaq / R R 1 ~ ~ * 2 A2 A 2 J 1 kaq / R Since I EE 2 R 2 kaq / R 2 J ka sin I I 0 1 ka sin 2 2 … Airy function, J1(x) in Table 10.1 I 0 A2 A 2 2R 2 , and 14 q sin R dS Engineering Optics and Optical Techniques- 2007 Spring Lecture note No. 7 by Professor Kenneth D. Kihm Homework Assignment #8 E-o-C Problems: Ch.9: Ch. 10: 3, 5, 27, 32, 47 7, 8, 22 *Special Assignment: Plot the three-dimensional Airy pattern (Fig. 10.23) using any computer plotting software Due: March 29 (Thursday), 2006 15