Powerpoint

advertisement
AP 5301 / 8301
Instrumental Methods of Analysis
Course Coordinator: Prof. Paul K. Chu
Electronic mail: paul.chu@cityu.edu.hk
Tel: 34427724 Fax: 34420542
1
Reference Books
• Encyclopedia of Materials Characterization, C. Richard Brundle,
Charles A. Evans, Jr., and Shaun Wilson (Editors), ButterworthHeinemann (1992)
• X-Ray Microanalysis in the Electron Microscopy (4th Edition), J. A.
Chandler, North Holland (1987)
• Methods of Surface Analysis: Techniques and Applications, J. M. E.
Walls (Editor), Cambridge University Press (1990)
• Secondary Ion Mass Spectrometry, Benninghoven, Rudenauer, and
Werner, John Wiley & Sons (1987)
• Surface Analytical Techniques, J. C. Riviere, Oxford University Press
(1990)
• Modern Techniques of Surface Science, D. P. Woodruff and T. A.
Delchar, Cambridge University Press (1994)
• Analysis of Microelectronic Material Devices, M. Grasserbauer and H.
W. Werner (Editors), John Wiley & Sons (1991)
• Scanning Electron Microscopy and X-Ray Analysis (3rd Edition), J.
Goldstein, D. Newbury, D. Joy, C. Lyman, P. Echlin, E. Lifshin, L.
Sawyer, and J. Michael, Kluwer (2003)
2
CourseOBJECTIVES
Objectives
COURSE
•
Basic understanding of materials characterization
techniques
•
Emphasis on applications
3
Classification of Techniques
•
•
•
•
Microscopy and related techniques
Surface characterization techniques
Elemental / chemical depth profiling techniques
Non-destructive testing
4
Microscopy and Related Techniques
• Light Microscopy
• Scanning Electron Microscopy (SEM) / Energy
Dispersive X-Ray Spectroscopy (EDS) /
Wavelength Dispersive X-Ray Spectroscopy
(WDS) / X-ray Diffraction (XRD) / X-Ray
Fluorescence (XRF)
• Transmission electron microscopy (TEM) /
Scanning Transmission Electron Microscopy
(STEM) / Electron Diffraction (ED)
5
Surface Characterization Techniques
• Auger Electron Spectroscopy (AES)
• X-ray Photoelectron Spectroscopy (XPS) or
Electron Spectroscopy for Chemical Analysis
(ESCA)
• Scanning Probe Microscopy (SPM) – Scanning
Tunneling Microscopy (STM), Atomic Force
Microscopy (AFM), …
6
Depth Profiling Techniques
• Auger depth profiling
• XPS depth profiling
• Secondary Ion Mass Spectrometry (SIMS)
7
Non-Destructive Testing Techniques
•
•
•
•
•
•
•
Radiographic and Neutron Radiographic Tests
Electromagnetic & Magnetic Particle Tests
Sonic, Electrical, Mechanical, and Visual Tests
Photoelasticity Test
Liquid Penetrant Tests
Leak Tests
Acoustic Emission Tests
8
Principles of Analytical Techniques
9
10
Product Yield Enhancement
• Understand via modeling and simulation which
parameters can improve product yield
• Systematically identify these parameters within
the process
• Control and reduce / eliminate these parameters by
identifying their root cause
• Process monitor these parameters to measure the
success of contamination control efforts
11
Surface Contaminant Identification
• Particles – Optical Microscopy, SEM/EDS, AES,
XPS, SPM
• Residues – SEM/EDS, AES, XPS, SIMS
• Stains, discoloration, hazes – SPM, SEM, XPS,
AES, SEM/EDS
• General surface contamination – XPS, AES,
SEM/EDS, SIMS
12
Haze on Silicon Surface (SPM)
13
TiN Grains (SPM)
14
Imaging of Hard Disk (SPM)
15
Residues on Integrated Circuits (SEM)
16
Integrated Circuit (SEM)
17
Hard Disk Defects (AES)
18
Si Wafer Surface Contamination (XPS)
19
Depth Profiling
20
Gate Oxide Breakdown (SIMS)
21
Download