Coherent VUV generation : High order Harmonics in gases (160 - 10nm) Rare gas (jet, cell, capillary) Forward Phase-matching Laser 5-50fs, 1-30mJ, 10Hz-1kHz IL ~1014 -1015 Wcm-2 Linear pol. Spectral selection /focussing Characterization Application Interaction of atoms with high laser field IL = 1013 -1017 W/cm2 Re-collision Multiionization field-electron momentum transfer Above-threshold Ionization (ATI) 2- Acceleration 3- Recombination Ultra-short (as) XUV burst wUVX = Ec + Ip Emission time te ELaser ELaser 1- Tunnel ionization ti te time xelec Discrete / broadband XUV emission 8 Ne 120 10 2 100 7 80 10 Cutoff 60 65 6 Phase (rad) Nb photons ~ |Amplitude| Plateau 25 40 10 20 5 10 0 30 25 20 15 (nm) Phase of XUV emission dfXUV = Single harmonic (Salières et al. Science 2001) Harmonic phase fq ≈ qfLaser + a IL Coherence properties a dIL + te dwXUV Broadband emission (Paul et al. Science 2001, Mairesse Science 2003) Characterization of attosecond pulse train Attosecond time structure and dynamics 45 EX(t) = S Aq e-iwq(t - teq) Intensity (arbitrary units) 40 N 35 30 H25-33 (N = 5) <w25-33>, te 25 H35-43 H45-53 20 <w35-43>, te 15 10 H55-63 H25-63 t =150 as 5 0 0 500 Energy wUVX 1 000 1 500 Time (as) 2 000 2 500 Electronic trajectory in the laser field Proof of semi-classical three-step model Dinu et al., PRL 2003 Mairesse et al, PRL 2004 Energy / Peak power Hannover: KrF 14mJ 500fs 1GW Riken 16mJ 10µJ Energy / pulse 100MW Ar µJ Riken 16mJ Saclay : EL= 20-25mJ Riken 130mJ 10MW 100nJ MW Ne 10nJ 100kW Peak Power (20fs XUV pulse) Xe nJ 160 120 80 70 60 50 (nm) 40 30 20 10 Scaling laser energy and medium at constant IL (Laserlab I3 ) 10µJ Spectral selection • Grating time stretch 100 CXRO data 100nm 160nm 80 Measured T thickness : 100nm 160nm 60 40 20 90 0 80 70 7 9 11 13 60 15 17 19 21 23 25 27 Harm order 50 40 0,50 30 0,45 20 0,40 7 9 11 13 In, Sn 15 17 19 In 162nm (CXRO) Sn 162nm 0,35 10 0 7 9 11 13 15 17 19 21 23 25 Harmonic order • Multilayer mirrors (< 40 nm) Transmission Reflectivity of two SiO2 Plates at 10° RIR ~ 10-4 100 Filter Transmission (%) • Silica plates + metallic filters Al 0,30 0,25 0,20 0,15 0,10 0,05 0,00 10 15 20 Photon energy (eV) 25 30 29 Spatial Coherence of High Harmonics g = 0.5 : Coherent flux ~ 75% Total flux Coherent Flux / Total Flux Collab. Lab. Charles Fabry Orsay = 61.5 nm (H13) 1,0 0,5 0,0 Fresnel bi-mirror Interferometer H13 (15) 61nm 0,2 0,4 0,6 0,8 Coherence degree g d=1mm d=2mm d=3mm Le Déroff et al. PRA 61 (2000) 043802 1,0 Focussing • Multilayer spherical M f=200 mm f=50mm • Parabola f=70mm H15 (52 nm) 10 5 2.5 µm 0 6 Spot diameter (µm) w0 (µm) 15 • Bragg Fresnel lens (Mo/Si) H37 (21.6 nm) 8 6 4 2 Zeitoun et al. LOA-LIXAM 4 -20 -10 10 M 2 Distance to focus (µm) 2 0 0 200 400 600 800 1000 Backing Pressure (torr) 1µJ at 20eV : IUVX ~ 1014 W.cm-2 20 Mutually coherent harmonic sources Separated spatially x= 80µm 180µm 380µm 600µm x H17 Spatial interferometry Separated temporally 1,0 t=450fs t=150fs t Intensity 0,8 H11 0,6 0,4 Spectral interferometry 0,2 0,0 -5 -3 -1 1 (Å) 3 5 -3 -1 1 (Å) 3 5 Temporal properties XUV Intensity (arb. units) 0,25 / ~10-3 -10-2 Ar 0,20 25 Coherence time < pulse duration 0,15 0,10 0,05 0,00 50 45 40 35 30 25 (nm) fq I L qwL a Frequency modulation : t t Complete characterization of an XUV pulse Principle of SPIDER in the visible w 2 Replicas •Temporal delay t w0 •Spectral shift W Spectral interference t w0W w0 Grating S (w) E(w) ² E(w - W) ² 2 E(w) E(w - W) cos(j(w) - j(w - W) wt ) Reconstruction of E(w) and j(w) from the spectral interference pattern C. Iaconis & I.A. Walmsley, Optics Letters 23 (1998) Transposition in XUV : “Dazzling SPIDER” w0 w0dw t Laser Oscillator w0 DAZZLER Lens Gas Jet wqW t wq Amplifier F. Verluise et al., Optics Letters 25 (2000) Acousto-optic filter Tailoring of the IR pulse HH Generator Creation of two delayed replicas t is programmable and accurately set by the Dazzler Spectral shift of one of them dw set by cutting the wings of the laser spectrum HHG Transfer as W=q.dw on harmonic q W is measured on the harmonic spectra Mairesse et al. PRL 2005 SPIDER XUV SPECTRUM Phase-locked XUV pulses Intensity Intensity (a.u.) w 10 9 25,6 25,7 25,8 25,9 26,0 26,1 26,2 w (.10 -15 rad/s) Quadratic spectral phase Quadratic XUV temporal phase (IL-dependent) Negative linear chirp : wq = qwL + bq t 8 Phase (rad) SPIDER ALGORITHM 11 Temporal profile of harmonic emission IR XUV (H11) FWHM=50fs FWHM=22fs Consistent Chirp Rate b11= 1.2 10 236 1 231 230 229 -2 Chirp rate bq (s ) Intensity 232 XUV Phase (rad) 233 x10 Exp. bfund=0 Th. 27 -2 Exp. bfund=0.8 10 s Th. 0 -1 -2 -3 13 -100 -50 0 50 100 228 s-2 28 235 234 28 15 17 19 Order 21 23 Varju et al., JMO 52, 379 (2005) Time (fs) Complete characterization of harmonic pulse Amplification of harmonics in a laser medium 20 mJ, 30 fs Delay line /4 1 J, 30 fs 10Hz Ph. Zeitoun et al., Nature 431, 426 (2004) HHG cell Toroidal Mirror Kr plasma Al Filter 3d94d J=0 32,6nm towards diagnostics 3d94p J=1 Collisions e - ions Ni-like Kr 8+ : (Ne)3s23p63d10 Amplification in Krypton IX plasma at 32.8 nm 12000 Amplified harmonic 10000 8000 6000 HHG +XRL non synchronized XRL line 4000 2000 0 0 100 200 300 400 500 600 600 700 800 Prints of Laser at 32.8 nm Harmonic 25 alone Amplified Harmonic Amplification Factor : 15 à 200 (depending on seed level) Divergence : < 2 mrad Amplification of harmonics in X-Ray laser : TUIXS (NEST) Broad band Amplification ASE regime L’amplification dépend du > niveau d’injection Gss = 80 cm-1 Iseed ~ Isat/100 : strong amplification (x 200) Iseed ~ 4Isat : moderate amplification ( x 20) Researchers - Collaborations - Contracts Attophysics group 2005 P. Breger B. Carré M.-E. Couprie H. Merdji P. Monchicourt P. Salière s H. Wabnitz W. Boutu M. de Grazia M. Labat G. Lambert Y. Mairesse PDoc PhD PhD PhD PhD PhD Collaborations Lab. Francis Perrin, CEA-Saclay Lab. Optique Appliquée, ENSTA-Ecole Polytechnique, Palaiseau Centre d’Etudes des Lasers Intenses et Applications, Bordeaux Lab. Interaction du rayonnement X Avec la Matière, Orsay Lab. Charles Fabry , Institut d’Optique, Orsay Service de Chimie Moléculaire, CEA-Saclay Lund Laser Center, Lund CUSBO, Politecnico Milano FOM Institute for Atomic and Molecular Physics, Amsterdam IESL- FORTH, Heraklion, Creete INOA-LENS, Firenze Brookhaven Nat Lab J. J. Thomson Lab., Univ. Reading Kurchatov Institute, Moscow Contracts I3 Laserlab : access (SLIC) / Development of Coherent ultra-short XUV source Applications of Coherent ultra-short XUV : Marie Curie RTN “XTRA” Amplification of harmonics in X-Ray laser : TUIXS (NEST) Seeding of FEL with laser harmonics generated in gas : EUROFEL-DS4 Saclay Laser-matter Interaction Center UHI10 LUCA PLFA Power: 10TW Duration: 65 fs Power: <1TW Power: 0.4TW reprate: 10 Hz Duration: 45 fs Duration: 30 fs Intensity: >3.1018W/cm2 Reprate: 20 Hz Reprate: 1 kHz Plasma physics +1 line 560-650 nm (GW) + 2 NOPAs (~5GW) Particles acceleration 5 experimental stations Tunability: 520-750 nm B4.2 Time-resolved diagnostics of dense plasmas XUV interferometer using HH mutual coherence Collab. Lab. Ch. Fabry Orsay Magnif. ~10 Pump Imaging elliptical mirror B4C/Si multilayer (32nm) plasma Object Resolution (object): 4 µm Field diam ~ 0.8 mm. IR beam splitter Salières et al. PRL (1999) Descamps et al. Optics Lett. (2000) Interferogram in virtual Object plane Applications of Coherent XUV pulses High intensity in the XUV (~ 1012W/cm2) : Non Linear processes Short duration (10fs100as) /synchronization with laser : time-resolved studies Intrinsic or mutual coherence : interferometry techniques Atomic physics (photoionization): Toma et al. Phys. Rev. A (2000). Solid state physics : Quéré et al., Phys. Rev. B (2000), Gaudin et al., Appl. Phys. B (2004) Plasma physics : Salières et al., Phys. Rev. Lett. (1999), Descamps et al., Opt. Lett. (2000). In 2001-2005 Multi-photon/multi-color photoionization of atoms (AMOLF 2003) Photoionization of water in the liquid phase (Univ. Stockholm 2004) Surface ablation by XUV pulses (Univ. Warsaw, PALS 2005) Photoionization of clusters by XUV pulses (Technische Univ. Berlin 2005) Spectral selection • Grating time stretch • Silica plates + metallic filters Filter Transmission (%) 100 100 90 Tr / Re (%) 80 70 Transmission Reflectivity 60 50 Polarization S 40 30 CXRO data 100nm 160nm 80 Measured T thickness : 100nm 160nm 60 40 20 20 0 10 0 5 10 15 20 7 25 9 11 13 15 17 19 21 23 Harm order 100 7 0,50 90 9 11 13 0,45 80 0,40 70 0,35 Transmission Reflectivity of two SiO2 Plates at 10° Incidence (°) 60 50 40 30 17 19 In 162nm (CXRO) Sn 162nm 0,30 0,25 0,20 0,15 20 0,10 10 0,05 0 15 0,00 7 9 11 13 15 17 19 Harmonic order 21 23 25 10 15 20 Photon energy (eV) 25 30 25 27 29 Spectral selection and focussing • Multilayer mirror (< 40 nm) Parabola f=70mm 0,35 0,30 Spherical Mirror f=200 mm Simul (inc=4°) Exp: , incidence 4°, 5° B4C/Si 15 0,20 2.5 µm 0,15 0,10 w0 (µm) Reflectivity 0,25 Zeitoun et al. LOA-LIXAM 0,05 30 35 40 Wavelength (nm) 5 2 4 M 1µJ at 20eV : IUVX ~ 1014 W.cm-2 10 0 6 0,00 25 H15 (52 nm) 2 0 200 400 600 800 Backing Pressure (torr) • Bragg Fresnel lens (Mo/Si) 1000 Complete characterization of XUV pulse : SPIDER w 2 Replicas Principle of IR SPIDER Spectral interference •Temporal delay t w0 •Spectral shift W t w1W w1 Grating S (w) E(w) ² E(w - W) ² 2 E(w) E(w - W) cos(j(w) - j(w - W) wt ) Reconstruction of j(w) from the spectral interference pattern C. Iaconis & I.A. Walmsley, Optics Letters 23 (1998)