Application of phase shifters in superconducting digital circuits M. Khabipov, D. Balashov, F. Maibaum, A. Zorin Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany V. A. Oboznov, V. V. Bolginov, A.N. Rossolenko and V. V. Ryazanov Institute of Solid State Physics, Chernogolovka, 142432 Moscow region, Russia The work was supported by DFG (German Science Foundation) through grant ZO124/2-1 and the joint grant of DFG and the Russian Foundation of Basic Researches and grants of the Russian Academy of Sciences. Physikalisch-Technische Bundesanstalt, Braunschweig October 11-16 2009, Chernogolovka 1 Outline • Introduction • Basic principles of Rapid Single Flux Quantum (SFQ) circuits • SFQ circuits fabrication technology at PTB • Operation of an SFQ circuits with integrated phase shifters based on – superconducting loop with trapped flux quantum – Superconductor-Ferromagnetic-Superconductor p-junction • Conclusion • Outlook October 11-16 2009, Chernogolovka 2 RSJ model of Josephson tunnel junction V JJ R damping resistor C JJ - Josephson junction I C – self-capacitance 2 w 2p ICR2C= c2 Stewart-McCumber parameter c = wp F0 Underdamped JJ I Ic Overdamped JJ I Ic IReturn <V> 0 IReturn C 1 C >> 1 0 October 11-16 2009, Chernogolovka <V> 3 Reaction on a short pulse I(t) R I Ic “sweep” of the dc I-V curve Idc bias a few Ohm a short trigger pulse Generation of Result: a SFQ pulse (strictly 2p-leap of phase!) <V> V(t) V(t)dt = F 0 time This pulse (carrier of information) can be used as a trigger pulse for other junctions - the basis of Rapid Single Flux Quantum circuits! (Likharev et al. 1985) Advantages of RSFQ: quantized information, fast (typically, few ps) switching time, low level of dissipation October 11-16 2009, Chernogolovka 4 SFQ pulse generation move to the adjacent minimum U(j) = - EJcosj - (F0/2p) j I +const R effect of the trigger pulse! large damping due to external shunt resistor washboard potential Low amplitude signals (noise) not reproduced by the circuit a noise discriminator 2p j October 11-16 2009, Chernogolovka 5 Definition of coding in RSFQ logic clock pulses V/Vc V/Vc V/Vc „0“ „1“ „0“ information pulse „0“ „0“ „1“ information pulse Time, a. u. The binary code: presence (absence) of SFQ pulse between adjacent clock SFQ pulses (for comparison) different voltage levels (CMOS, TTL, “latching” logic) October 11-16 2009, Chernogolovka 6 RSFQ dc/SFQ and SFQ/dc converter circuit Circuit provide generation and back conversion of SFQ pulses into voltage signals I _b I _in Li n J 19 J2 L2 I _L J1 J3 J4 J5 J17 J 18 L1 J 20 J21 J23 J22 R J 24 dc/SFQ converter Josephson transmission line V_out T-Flipflop with SFQ/dc converter V. Kaplunenko et al. IEEE Trans. Magnetics 25, 861-864, 1989 K. Likharev and V. Semenov IEEE Trans. Appl. Supercond. 1, 3-28, 1991 October 11-16 2009, Chernogolovka 7 RSFQ T-flip-flop circuit Circuit provides a frequency division of SFQ pulses Ibias jc = 100 A/cm2 As result frequency division ! operation frequency f = Vc /Ф0 =Ic Rn /Ф0 up to 40 GHz power consumption P = V Ibias = 15 nW K. Likharev and V. Semenov IEEE Trans. Appl. Supercond., 1, 1991 October 11-16 2009, Chernogolovka 8 T-flip-flop circuit, results of simulation Phase drop, input junction Phase drop, TFF junctions Voltage, input junction Voltage, TFF junction Voltage, TFF junction October 11-16 2009, Chernogolovka 9 Frequency division realised in CMOS logic (for comparison) Paul Horowitz, Winfield Hill. The Art of Electronics, Cambridge University Press, Second Edition, 1989 Pdyn = CeffV2DD x f For example, at 30fF/gate at 100MHz and VDD = 5 V, 75 μW is dissipated per gate UMBC, University in Mariland, Advanced VLSI design http://www.csee.umbc.edu . The circuit consists of 10 gates and includes about 50 transistors October 11-16 2009, Chernogolovka 10 SFQ circuits Nb/Al thin-films fabrication technology established at PTB -deposition and etching of The Nb ground plane Shielding of an electromagnetic noise, realization of the low value inductances - anodization of the ground plane - deposition of the SiO2 isolation layer - deposition and etching of the Cr/Pt/Cr resistor trilayer - deposition of the SiO2 isolation layer - etching of the contact holes realization of the shunt and bias current resistors -deposition of the Nb/AlxOy/Nb trilayer -deposition of a thin SiO2 layer jc between 100 A/cm2 and 1 kA/cm2 October 11-16 2009, Chernogolovka 11 SFQ circuits Nb/Al thin-films fabrication technology established at PTB JJ -etching of the thin SiO2 isolation layer and the Nb counter electrode, definition of JJs Smallest junction area A=10 µm2 SiO2 -anodization mask Al2O3 Nb2O5 -anodization with the thin SiO2 layer as a mask -etching of the base electrode SiO2 October 11-16 2009, Chernogolovka -deposition and etching of the SiO2 isolation layer 12 Cross-section of shunted Josephson junction in Nb/Al technology JJ Nb Tunnel barrier AlxOy Al2 O3 Al Cr/Pt/Cr damping resistor Rsq=2Ω/sq. Cr/Pt/Cr } Nb2 O5 Thermally oxidized silicon substrate SiO2 IV curve of the underdamped JJ A = 24 µm2 Ic 20 µA Rn 59 Ω IV curve of the overdamped JJ C>>1 Rsh IR IC T = 4.2 K Current I (20µA/div) October 11-16 2009, Chernogolovka JJ Voltage V (100µV/div) Voltage V (1mV/div) Si A = 24 µm2 Ic 24 µA Rsh 4 Ω C ~ 1 IC T = 4.2 K Current I (20µA/div) 13 Why we need phase shifting elements in RSFQ? Qubit control and read out: low back action on Josephson qubit cells (low value Ic, large value of shunt resistor, low power consumption) Low Ic value due to Ic x L ~Ф0 result in proportionally increased value of inductances L, circuits have a large area and became sensitive to an electromagnetic noise Physikalisch-Technische Bundesanstalt, Braunschweig October 11-16 2009, Chernogolovka 14 Conventional TFF with large storing inductance Symmetry of the TFF states is due to phase drop of about p created by dc control current: Icontr L j = p Compact phase shifters are required SFS p-JJ L F0 Superconducting loop with trapped flux quanta TFF with RC shunted Josephson junctions. Parameters: jc=100 A/cm2, Ic= 16µA, L=130 pH The p shift can also be realized on the basis of HTS junctions exhibiting the d-wave symmetry of the order parameter (see T. Ortlepp et al. Science 312, 1495, 2006) October 11-16 2009, Chernogolovka 15 Superconducting loop with trapped flux quantum as a phase shifting element The work carried out in collaboration with the group in TU Ilmenau f = I shifter I shifter T = 10 K External flux F applied at T > TC Nb (T = 10 K) Ftrapped = n F0 T = 4.2 K External flux F turned of when T < TC Nb (liquid helium temperature T = 4.2K). Quantized flux trapped Ftrapped = n F0 F0 2.07 mVps (single flux quantum) Flux quantization law It was proposed as a phase-bias circuit for the Josephson qubit in J.B. Majer et al. APL 80, 3638, 2002. October 11-16 2009, Chernogolovka 16 Superconducting loop with trapped flux quantum as a phase shifting element The work carried out in collaboration with the group in TU Ilmenau Pinning a flux quanta into ground plane hole During the cooldown, the flux is trapped in the ground plane hole. October 11-16 2009, Chernogolovka 17 Conventional TFF and TFF with integrated π – shifter Schematic diagram of the ordinary TFF circuit Schematic diagram of the TFF with integrated p-shifter TFF input TFF input J2 J1 TFF out1 Lint J3 TFF out2 J1 J2 TFF out1 TFF out2 Lshifter J4 J3 J4 The large quantizing inductance Lint can be replaced by passive π – shifter, ensuring bistable functioning of the TFF D. Balashov et al., IEEE Trans. Appl. Supercond. 17, 142, 2007 October 11-16 2009, Chernogolovka 18 Simpler circuit: dc-interferometer with integrated π–shifter dc-interferometer with integrated π – shifter Microphotograph of the sample Ibias Ibias Vout Vout p-shifter Isweep Isweep JJ f JJ Isweep Isweep f+p J1 J2 Control line Circuit parameters: IC 270 µA, RN 0.8 , Lshifter 7 pH (at T=4.2K), and Lshifter 15 pH (at T=10K), Flux bias current for single F0 operation mode Icontr 200 µA October 11-16 2009, Chernogolovka 19 Experimental testing of the dc-interferometer with integrated π–shifter Voltage-flux characteristics of the dc-interferometer with integrated shifter loop realized in jC=1 kA/cm2 Nb/Al technology J1 V (20 µV/div) Isweep Vout Isweep J2 1 F0 trapped in the shifter loop Icontr 200 µA Ibias F0 No flux trapped in the shifter loop Icontr 0 µA F0/2 Flux Current Isweep ( 200 µA/div) Voltage-flux characteristics October 11-16 2009, Chernogolovka 20 TFF circuit with integrated π–shifter Microphotograph of the sample Schematic diagram of the TFF with integrated p-shifter TFF input TFF separate bias TFF input p-shifter J2 J1 TFF out-1 TFF out-1 f f+p TFF out-2 TFF out-2 Lshifter J3 J4 Control line October 11-16 2009, Chernogolovka 21 Block-diagram of tested circuit including TFF with integrated π – shifter p-shifter I_in (Divider 2:1) f f+p (Divider 2:1) V_out2 V_out1 Control line TFF with p-shifter should operate as a frequency divider 2:1 October 11-16 2009, Chernogolovka 22 Experimental testing of the circuit with integrated π–shifter Circuit realized in Nb/Al technology with jC=1k A/cm2 Voltage (200 µV/div) When F0 trapped in the π – shifter loop fout1 = fout2= fin/4 Bias current margin of the circuit is 20% Current (500 µA/div) When no flux trapped in the π – shifter loop fout1 = fout2= fin/2 I_in V_out1 V_out2 I_in V_out1 Bias current margin of the circuit is 17% V_out2 Time t ( 5 ms/div) October 11-16 2009, Chernogolovka 23 p-junction as a phase inverting element Josephson current-phase π-junction currentrelation phase relation I I 2p 2p j j 0 p-JJ I=Icsinj I=Icsin[p+j]= -Icsin j E E -p Symbolic notation p 0-junction energy minimum at 0 j -p p j p-junction energy minimum at p October 11-16 2009, Chernogolovka E= EJ[1-cosj] E= EJ[1-cos(p+j )]=EJ[1+cosj] Bulaevsky, Kuzii and Sobyanin, JETP Lett. (1977) 24 Superconductor-Ferromagnet-Superconductor (SFS) junction: 0-state and π–state Nb-Cu0.47Ni0.53-Nb p-junction dF = 12-22 nm “0”-state I=Icsinj “0”-state “p”- state I=Icsinj I = Icsin(j+p) = - Icsin(j) V. A. Oboznov et al. PRL 96, 197003, 2006 October 11-16 2009, Chernogolovka 25 Cross-section of shunted Josephson junction in Nb/Al technology and ferromagnetic based junction SIS-junction jc=100 A/cm2 A = 10 µm2 SFS-junction jc=850 A/cm2 A = 8x8 µm2 Topologically, the SFS junction is placed between Nb-wiring nodes of pre-fabricated circuit. October 11-16 2009, Chernogolovka 26 dc-interferometer with integrated SFS π-junction Voltage-flux characteristics of the dc interferometers: a) conventional, b) with SFS p-junction October 11-16 2009, Chernogolovka 27 Integration of the p- SFS junction into TFF circuit TFF with integrated π-SFS junction Conventional TFF circuit JTL JTL In JJ JTL Out1 JJ JJ ∆j = π L In JJ I_b JJ I_b π-SFS JTL JJ Out2 JTL JJ JJ Out1 JTL Out2 Proposed in: A. Ustinov and V. Kaplunenko J. Appl. Phys. 94, 5405, 2003 October 11-16 2009, Chernogolovka 28 Integration of the p- SFS junction into TFF circuit Phase drop, input junction Phase drop, TFF junctions Voltage, TFF junction Voltage, TFF junction Voltage, p-junction operation ranges: jc = 32%, Ib = 40%, L = 50% p- junction substituted by fixed phase shift of p and junction having Ic of large value October 11-16 2009, Chernogolovka 29 Microphotograph of integrated circuit V_out1 V_out2 SFS p-junction JTL SFQ/dc JTL SFQ/dc TFF dc/SFQ I_bias I_in 50 µm SFQ pulses generated by dc/SFQ converter, processed by TFF with integrated p-SFS junction and converted to the voltage levels by SFQ/dc converter circuits October 11-16 2009, Chernogolovka 30 TFF circuit with integrated SFS π–junction a) Block diagram of the test circuit October 11-16 2009, Chernogolovka b) microphotograph of the TFF circuit 31 Proof of correct operation of TFF circuit with integrated SFS π–junction Circuit realized in Nb/Al technology with jC=100 A/cm2 SF S p - junc tion TFF out1 20 A/div Iin TFF -core cell T in T o ut1 =T o ut2 =4T in Vou t1 50 V/div Vou t2 50 V/div Input TFF out2 50 m Time t, 10 ms/div When SFS junction is in a π–state then circuit operates properly Tout1 = Tout2= 4Tin Bias current margin of the circuit is 19% and limited by bias current margins of dc/SFQ converters! October 11-16 2009, Chernogolovka 32 Conclusion • We have successfully integrated the phase shifting elements in RSFQ circuits without deep modification of currently available technological process. • The following phase shifting elements were experimentally studied: – superconducting ring with trapped flux quantum – SFS p-junctions October 11-16 2009, Chernogolovka F0 p-JJ 33 Outlook Measurements of operation ranges of bias current of SFQ circuits with integrated SFS p-junctions - design of the TFF circuit with separate bias current Bit error rate (BER) measurements - realisation of the TFF circuit incorporated into ring oscillator October 11-16 2009, Chernogolovka 34 Integration of the p- SFS junction into TFF circuit Schematic for the circuit simulation, operation ranges, jc = 32%, Ib = 40%, L = 50% p- junction substituted by fixed phase shift of p and junction having Ic of large value October 11-16 2009, Chernogolovka 35