Every Wednesday:
15:00 hrs to 18:00 hrs
: عبرا ره
نيئات يڳو 6 ناک يڳو 3 ماش
DIGITAL INTEGRATED
CIRCUITS FOR
COMMUNICATION
يِڻاسرع دمحا ناسحا
My Introduction
فراعت وجنهنم
Ahsan Ahmad Ursani يڻاسرع دمحا ناسحا
Associate Professor رسيفورپ ٽيئيسوسيا
Dept. of Telecommunication
Engineering
تايطبر روڏ وبعش
TL-117 : ربمن رتفد
Office No: TL-117
زيجلاا نڪيٽ نشيڪينويمڪ ف ا ٽويٽيٽسنا
Institute of Communication
Technologies
Email:
Web page: ahsan.ursani@faculty.muet.edu.pk
https://sites.google.com/a/fac ulty.muet.edu.pk/aau/home
: لاپٽ قرب
: وحفص بيو
The Teaching Plan
اٿر يسيردت
Pre-Requisite: IC Design
S. No. Chapter
1
2
3
Dynamc Combinational CMOS Logic
Designing Sequential Logic
Designing Memory and Array Structures
Total
Hours
10
17
21
48
The Textbook
باتڪ يباصن
Digital Integrated Circuits
A Design Perspective
Jan M. Rabaey
Chapter 6, 7, & 12
Chapter 2
نويرهپ باب
S. No.
Topic
1 Introduction
2
3
Static Latches and Registers
Dynamic Latches and Registers
6
7
8
4
5
9
10
Alternative Register Styles
Pipelining: An approach to optimize sequential
Speed and Power Dissipation
Non-Bistable Sequential Circuits
Perspective: Choosing a Clocking Strategy
Total
1
1
1
1
1
Hours
1
1
1
1
1
10
Timing Metrics for Sequential Circuits
Set-Up time t su
Time before clock transition
Hold time t hold
Time After clock transition
worst-case propagation delay tc-q
minimum delay (contamination delay) t cd
Propagation Delay of combinational logic t plogic
Time period of the Clock signal T
Timing Metrics for Sequential Circuits
Classification of Memory Elements
Foreground Memory
embedded into logic
organized as individual registers of register banks
Background Memory
Large amounts of centralized memory core
Not the subject of this chapter
Static
Not refreshed frequently
Circuits with Positive feedback
Multivibrators
Dynamic
Refreshed frequently
In order of miliseconds
Store state of parasitic capacitances of MOS
Higher performance
Lower Power
Dissipation
Level-sensitive circuit
Passes input D to the Output Q
Output does not change in the HOLD MODE
Input just before the going into HOLD phase is held stable during the following HOLD phase
An essential component of Edge-triggered Register
Basic Part of a memory
Having two stable states
Use +ve feedback
loop gain is greater than unity loop gain is much smaller than unity
Transition from one state to the other
This is generally done by applying a trigger pulse at Vi1 or Vi2
The width of the trigger pulse need be only a little larger than the total propagation delay around the circuit loop, which is twice the average propagation delay of the inverters
Using NAND Gates Using NOR Gates
Fully fully-complimentary
CMOS implementation of
SR flip Flop requires 8 transistors
Clocked operation will require extra transistors
Two Crossed Coupled
Inverters
4 extra transistors for R, S, and CLK inputs
M4, M7, and M8 forms a
ratioed Inverter
Q is high and R is applied
we must succeed in bringing Q below the switching threshold of the inverter M1-M2
Must increase the size of
M5, M6, M7, and M8
Example 7.1: Transistor Sizing of
Clocked SR Latch
(W/L)
M1
= (W/L)
M3
= 0.5mm/0.25mm
(W/L)
M2
=(W/L)
M4
=1.5mm/0.25mm
V
M
= V
Q = 0
DD
/2
V
OL
(Q=0) < V
M
(W/L)
M5-6
≥ 2.26
(W/L)
M5
= (W/L)
M6
≥ 4.5
DC output voltage vs. individual pulldown device
Transient Response
Example 7.2: Propagation Delay of Static SR Flip-Flop
Problem 7.2 Complimentary CMOS SR FF
Instead of using the modified SR FF of Figure
7.8, it is also possible to use
complementary logic to implement the clocked SR FF.
Derive the transistor schematic (which consists of
12 transistors). This circuit is more complex, but switches faster and consumes less switching power. Explain why.
Advantages
The feedback loop is off while output is changing
Feedback is not to be overridden to change the output
Transistor sizing is not critical to fuctionality
Disadvantages
Clock load is 4
NMOS latch using Pass Transistors
Clock load = 2
Degraded logic 1 passed to the first inverter (V
DD
-V
TN
)
For smaller values of V
DD
Less noise margin
Less switching performance
Static Power Dissipation
Master Slave Edge-triggered Register:
Positive edge-triggered
Problem 7.3: Optimization of the
Master Slave Register
I
1 and I
2 can be removed
Functionality affected ?
Timing properties of Multiplexer-based
Master-Slave Register
Set-up time
Hold time
Propagation Delay
Propagation Delay of
Inverter (t pd_inv
)
Propagation Delay of
Transmision Gate (t pd_tx
) t su t c-q
= 3 t pd_inv
= t pd_tx
+ t
(T
3
) pd_tx
+ t pd_inv t hold
= 0
(I
6
)
Master Slave Edge-triggered Register:
Negative Edge-trggerred
Draw a circuit based on transmission gate multiplexers
Progressively skew the input with respect to the clock edge until the circuit fails
Tsetup = 0.21 nsec Tsetup = 0.20 nsec
Tc-q = t pd_tx
(T
3
) + t pd_inv
(I
6
)
T c-q(LH)
T c-q(HL)
= 160 ps
= 180 ps
Feedback transmission gates removed
Clock load = 4
Ratioed Logic
T
1 should be properly sized so as to be able to change the I
1
I
2 state
T
2 can also drive T
1
I
4 must be a weak device to prevent it from driving T
2
Assumption that clock inversion takes ZERO time
Effects of Capacitive loads dissimilar capacitive loads due to different data stored in the connecting latches
Different routing conditions of the two signals
Clock Skew
Direct Path B/W D and Q
Race Condition
Can conduct on +ve edge of clock
Solution to Clock Skew: Pseudostatic
2-phase D register
Two phase Clock signal
2 non-overlaping phases
t su
= t pinv t cq
= 2t pinv
+ t ptgate
Needs Refereshing
Clock Overlap can cause the problem called Race
1-1 Overlap
Increasing hold time
0-0 Overlap
T overlap0-0
< t
T1
+ t
I1
+ t
T2
Input Signal D must not be able to propagate through T overlap
2
During 0-0 o
C 2 MOS – Clocked CMOS
A Clock Skew Insensitive Approach
Positive Edge Triggered
Master –Slave Register
Clocked CMOS
CLK=0; Master samples the inverted version of D on X
CLK=1; Master is in the
HOLD mode and Slave passes the value on X to Q
0 – 0 Overlap
1 – 1 Overlap
2
0 – 0 overlap does not create any problem
1 – 1 overlap puts a HOLD constraint
It consists of two parallel masterslave based edge-triggered registers, whose outputs are multiplexed using
the tri-state drivers
The advantage of this scheme is that a lower frequency clock (half of the original rate) is distributed for the same functional throughput, resulting in power savings in the clock distribution network
True Single-Phase Clocked Register
(TSPCR)
Positive Latch Negative Latch
Example 7.4 Impact of embedding logic into latches on performance
Consider embedding an AND gate into the TSPC latch, as shown in Figure 7.31b. In a 0.25
mm, the set-up time of such a circuit using minimum- size devices is 140 psec. A conventional approach, composed of an AND gate followed by a positive latch has an effective set-up time of 600 psec (we treat the AND plus latch as a black box that performs both functions). The embedded logic approach hence results in significant performance improvements.
Simplified TSPC latch / Split Output
ADVANTAGES
Reduced
Implementaiton Area
Less Power
Consumption
Reduced Clock Load
DISADVANTAGES
All nodes do not experience full logic swing
Reduced Performance
This also limits the amount of VDD scaling possible on the latch
CLK = 0
Sampling inverted D on node X.
The second inverter is in the precharge mode
M6 charging up node
Y to VDD.
3 rd inverter is in HOLD,
M8 and M9 are off.
Positive Edge Triggered
Single-phase edge-triggered register
On the rising edge of the clock, the dynamic inverter M4-M6
evaluates. If X is high on the rising edge, node Y discharges.
The third inverter M7-
M8 is ON during the
high phase, and the node value on Y is passed to the output Q.
Positive Edge Triggered
Single-phase edge-triggered register
On the +ve phase of the clock, X transitions to a low if D transitions to a high level.
Input must be kept stable till the value on node X before the rising edge of the clock propagates to Y. This represents the hold time of the register
hold time less than 1 inverter delay since it takes 1 delay for the input to affect X.
The propagation delay of the register is 3 inverters since the value on node X must propagate to the output Q.
Finally, the set-up time is the time for node X
to be valid, which is 1 inverter delay.
TSPC Edge-Triggered Register
Transistor Sizing
D is low & X=Q~=1; Q=0.
CLK is low, Y is precharged high turning on M7.
CLK transitions from low to
high, Y and Q~ start dis- charging simultaneously
(through M4-M5 & M7-M8, respectively).
Once Y is sufficiently low, the trend on Q~ is reversed and the node is pulled high anew through M9.
fatal errors, as it may create unwanted events
when the output of the latch is used as a clock signal input to another register). It reduces the contamination delay of the register.
The problem can be corrected by
resizing the relative strengths of the pull-down paths through M4-M5 and
M7-M8, so that Y discharges much faster than Q.
This is accomplished by reducing the
strength of the M7-M8 pulldown path, and by speeding up the M4 -
M5 pulldown path.
TSPC Edge-Triggered Register
Transistor Sizing