XRF Metrology
Tools for Solar
Photovoltaic
Manufacture
Company
Confidential
1
(Company
Confidential)
Solar Metrology: The Convergence
Age of Solid State Energy
PV Efficiency Gains & Cost Reduction
will achieve Convergence With Fossil Fuel Grid
Costs
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(Company Confidential)
Solar Metrology: The Market Driver

Low-cost solar PV factories of the
future will utilize:
 New Materials: R&D
 Products: Process

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(Company Confidential)
Develop and commercialize
new low cost solar PV panels
through capacity ramp and
yield management.
Solar Metrology: The Market Potential
One Trillion-Dollar Global Electricity Generation Industry
 Solar PV currently <1% of
total annual electric power
generation worldwide.
 Solar PV market share in
vicinity of 10% anticipated
by 2020.
 PV Metrology Equipment
Market: $5 billion TAM
projected by 2012.
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(Company Confidential)
Solar Metrology: What We Do
TCO
Window Layer (CdS)
CIGS
We Provide an Enabling
Technology…
Back Contact (Mo)
Glass, Stainless, Plastic
CIGS Layer
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(Company Confidential)

Solar Metrology tools are required to
manufacture the active layer in
photovoltaic (PV) cells that converts
sunlight to electricity.

Solar Metrology technology enables
manufacturers to conduct R&D,
control processes and manage yield to
produce high-efficiency, low-cost
commercial solar PV panels.
Solar Metrology: How We Do It
CdS
CIGS
Mo
Substrate
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(Company Confidential)
Photons from the X-Ray tube
impinge on the sample material
(CdS or CIGS/Electrode
Layer/Substrate). Atoms are
ionized and fluoresce
characteristic emissions that are
collected by a detector then
amplified, digitized , and sorted
into a histogram (intensity vs.
energy – spectrum) and displayed
Solar Metrology: Who Will Do It
THE SOLAR MANAGEMENT
TEAM…
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
Has over 100 years cumulative experience in the XRF business.

Formed Matrix Metrologies in 2003

Has existing base of success to leverage in transition to solar.

Has designed and marketed six XRF product lines, with an installed
base in excess of 5000 units.

Members have held key management positions at Thermo, Veeco
Instruments, Fisons and Kevex.
(Company Confidential)
Solar Metrology: Who Will Do It
MANAGEMENT TEAM:

FRANK REILLY: President & Sales/Marketing Director (Principal)
Successfully managed Matrix Metrologies as a going concern for five years.
(Years XRF Experience: 22)

FRANK FERRANDINO: V.P. & Dir. of Technology/Project Management (Principal)
Patented X-ray optical beam and detector column with vacuum conduit; developed
and patented NIST-traceable metal calibration standards. (Years XRF Experience: 26)

JIM BOGERT: Director, Domestic Sales, Spectroscopist (Principal)
Developed advanced mathematical methods for spectral analysis; extensive surface analysis, materials
engineering and sales force management experience. (Years XRF Experience: 26)

IGOR LENICKY: Director, International Sales, QC Engineer (Principal)
Experienced global marketer of advanced technology-based instrumentation.
(Years XRF Experience: 30)

TIM CAHANEY: Director, Marketing/Product Management (Principal)
Experienced in development of process and metrology equipment solutions for semiconductor industry
and Polytechnic Inst. of NY graduate (Years Semi Experience: 30)
BOARD OF DIRECTORS: Frank Reilly, Frank Ferrandino, Walter Scherr
ADVISORS:

WALTER SCHERR: Founder of Panafax (first commercially availably fax machine), Litton,
Sperry and Veeco Instruments; operated XRF Industrial Measurement Group at Veeco.

EDWARD BRAUN: MBO Veeco instruments (1991); CEO Veeco; President of SEMI and
Solar Product Development Specialist at Veeco.
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(Company Confidential)
Solar Metrology: Product Platforms
Our Products SMX-BEN, SMX-ILH, SMX-ISI
The System SMX is a unique family of three platforms designed exclusively
for the Photovoltaic manufacturing industry for multi-layer thickness and
composition measurements of flexible or rigid substrates. Presently
containing XRF technology it allows for the inclusion of other “best-ofbreed” measurement technologies.

SMX-BEN for Bench top Measurements

SMX-ILH for In-Line, Near-Line Atmospheric Measurements- Integrated or
Remote X-Ray head; Static, Linear, and Dual-Axis Configurations

SMX-ISI for In-situ Vacuum Measurements- Static or Linear X-Ray head
Configurations
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(Company Confidential)
Solar Metrology: Tool Insertion Points
XRF Tool Insertion Points

R&D, Process development, Failure analysis
Material selection, Layer formulations

Off-Line Process Control
Detailed individual Product Sampling

Yield Management
In-line and In-situ measurement of PV cells
and panels
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(Company Confidential)
Solar Metrology: Moving Forward
Future PV Manufacturing Requirements

Capacity Ramp of existing technology

Enhanced Yield Management

Continuous Gains in Conversion Efficiency
Future Solar Metrology Requirements

Expansion of global distribution channels

Rapid product development

Procurement of additional metrology Methods
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(Company Confidential)