XRF Metrology Tools for Solar Photovoltaic Manufacture Company Confidential 1 (Company Confidential) Solar Metrology: The Convergence Age of Solid State Energy PV Efficiency Gains & Cost Reduction will achieve Convergence With Fossil Fuel Grid Costs 2 (Company Confidential) Solar Metrology: The Market Driver Low-cost solar PV factories of the future will utilize: New Materials: R&D Products: Process 3 (Company Confidential) Develop and commercialize new low cost solar PV panels through capacity ramp and yield management. Solar Metrology: The Market Potential One Trillion-Dollar Global Electricity Generation Industry Solar PV currently <1% of total annual electric power generation worldwide. Solar PV market share in vicinity of 10% anticipated by 2020. PV Metrology Equipment Market: $5 billion TAM projected by 2012. 4 (Company Confidential) Solar Metrology: What We Do TCO Window Layer (CdS) CIGS We Provide an Enabling Technology… Back Contact (Mo) Glass, Stainless, Plastic CIGS Layer 5 (Company Confidential) Solar Metrology tools are required to manufacture the active layer in photovoltaic (PV) cells that converts sunlight to electricity. Solar Metrology technology enables manufacturers to conduct R&D, control processes and manage yield to produce high-efficiency, low-cost commercial solar PV panels. Solar Metrology: How We Do It CdS CIGS Mo Substrate 6 (Company Confidential) Photons from the X-Ray tube impinge on the sample material (CdS or CIGS/Electrode Layer/Substrate). Atoms are ionized and fluoresce characteristic emissions that are collected by a detector then amplified, digitized , and sorted into a histogram (intensity vs. energy – spectrum) and displayed Solar Metrology: Who Will Do It THE SOLAR MANAGEMENT TEAM… 7 Has over 100 years cumulative experience in the XRF business. Formed Matrix Metrologies in 2003 Has existing base of success to leverage in transition to solar. Has designed and marketed six XRF product lines, with an installed base in excess of 5000 units. Members have held key management positions at Thermo, Veeco Instruments, Fisons and Kevex. (Company Confidential) Solar Metrology: Who Will Do It MANAGEMENT TEAM: FRANK REILLY: President & Sales/Marketing Director (Principal) Successfully managed Matrix Metrologies as a going concern for five years. (Years XRF Experience: 22) FRANK FERRANDINO: V.P. & Dir. of Technology/Project Management (Principal) Patented X-ray optical beam and detector column with vacuum conduit; developed and patented NIST-traceable metal calibration standards. (Years XRF Experience: 26) JIM BOGERT: Director, Domestic Sales, Spectroscopist (Principal) Developed advanced mathematical methods for spectral analysis; extensive surface analysis, materials engineering and sales force management experience. (Years XRF Experience: 26) IGOR LENICKY: Director, International Sales, QC Engineer (Principal) Experienced global marketer of advanced technology-based instrumentation. (Years XRF Experience: 30) TIM CAHANEY: Director, Marketing/Product Management (Principal) Experienced in development of process and metrology equipment solutions for semiconductor industry and Polytechnic Inst. of NY graduate (Years Semi Experience: 30) BOARD OF DIRECTORS: Frank Reilly, Frank Ferrandino, Walter Scherr ADVISORS: WALTER SCHERR: Founder of Panafax (first commercially availably fax machine), Litton, Sperry and Veeco Instruments; operated XRF Industrial Measurement Group at Veeco. EDWARD BRAUN: MBO Veeco instruments (1991); CEO Veeco; President of SEMI and Solar Product Development Specialist at Veeco. 8 (Company Confidential) Solar Metrology: Product Platforms Our Products SMX-BEN, SMX-ILH, SMX-ISI The System SMX is a unique family of three platforms designed exclusively for the Photovoltaic manufacturing industry for multi-layer thickness and composition measurements of flexible or rigid substrates. Presently containing XRF technology it allows for the inclusion of other “best-ofbreed” measurement technologies. SMX-BEN for Bench top Measurements SMX-ILH for In-Line, Near-Line Atmospheric Measurements- Integrated or Remote X-Ray head; Static, Linear, and Dual-Axis Configurations SMX-ISI for In-situ Vacuum Measurements- Static or Linear X-Ray head Configurations 9 (Company Confidential) Solar Metrology: Tool Insertion Points XRF Tool Insertion Points R&D, Process development, Failure analysis Material selection, Layer formulations Off-Line Process Control Detailed individual Product Sampling Yield Management In-line and In-situ measurement of PV cells and panels 10 (Company Confidential) Solar Metrology: Moving Forward Future PV Manufacturing Requirements Capacity Ramp of existing technology Enhanced Yield Management Continuous Gains in Conversion Efficiency Future Solar Metrology Requirements Expansion of global distribution channels Rapid product development Procurement of additional metrology Methods 11 (Company Confidential)