A Behavioral and Temperature MeasurementsBased Modeling of an Operational Amplifier Using VHDL-AMS 17th IEEE International Conference on Electronics, Systems and Systems Athens-13th December 2010 Sahbi Baccar12, Timothée Lévi1, Dominique Dallet1, Vladimir Shitikov2, François Barbara2 1 IMS Laboratory- Université Bordeaux 1, France 2 Schlumberger Riboud Product Center (SRPC), Clamart, France 1 Outlines Outline Motivation and Context Op-amp Description and Characterization Development of HT Op-amp Models Conclusion and Prospects 2 Outlines Motivation and Context HTE (high temperature electronics), a recent growing market with specific circuit requirements Market Temperature (°C) Down-hole Instruments 150-300 Turbine Engine 200-300 Internal Combustion Engine >150 Validity of SPICE industrial components models in HT? Reviewing transistor factors in HT ?? 3 Outlines Motivation and Context SPICE: among first simulator for ICs Working conditions effect modeling in SPICE macro-model? VHDL-AMS language: modern tool for AMS and multi-domain modeling and simulating huge time of computation: 23.5 hours for simulating a feedback of a PLL loop!! Emergence of: - new simulators - new modeling approaches HTE Behavioral Modeling 4 Outlines Outline Motivation and Context Op-amp Description and Characterization Development of HT Op-amp Models Conclusion and Prospects 5 Op-amp Description and Characterization High Temperature Front End Amplifier Anaog Filter 6 Outlines Op-amp Description and Characterization Op-amp Stage 1 Stage 2 Input Stage Gain Stage Vos , Ios, PSRR, CMRR, Rin,Cin, Zcm… Aol, GBPW, fol, SR-, SR+.. Stage 3 Output Stage Voutlimp, Voutlimn, Rout… performance parameters 7 Outlines Outline Motivation and Context Op-amp Description and Characterization Development of HT Op-amp Models Conclusion and Prospects 8 Outlines Development of HT op-amp Models Parameter Measurement(T1, T2,..) Fitting by Mathematical Functions Error Evaluation HT Behavioral Model Development Simulation 9 Outlines Development of HT op-amp Models Input Stage Model Ib(T)/2 2Zcm inp+ Vcm+(T) Vs(T) Vos(T) CMRR(T) PSRR+(T) Ios(T) inp- Rin Cin Vcm-(T) Vs(T) CMRR(T) PSRR-(T) 2Zcm inpo1 inpo2 Ib(T)/2 10 Outlines Development of HT op-amp Models Middle Stage Model K=Aol(T) fol(T).Aol(T)=GBW(T) wol(T)=2 .fol(T) SR+(T), SR-(T), Iomax(T),gm inp+ Vine AOL (0) jf 1 fOL inp_po1 Ig Ig=Vine.gm AOL ( f ) Vg LTF K 1 s Vop inp_po2 inpSlew rate, Transconductance First Order LPF sub-stage 1 sub-stage 2 1 dVop Vg 1 AOL . Vop OL dt 11 Outlines Development of HT op-amp Models Output Stage Model inp_out Voutlimp(T) Rout output Iout Vout inn_out Voutlimn(T) Voltage limiter sub-stage Impedance Stage 12 Outlines Simulation Results and Discussions Voltage Offset and Saturation Voltage Voutlimp (T1=25°C) Voutlimp (T2=150°C) T=25°C T=150°C Vos (T1=25°C) Vos (T2=150°C) Voutlimn (T1=25°C) Voutlimn (T2=150°C) Op Amp Developed Model Rs=1K Rl=1K Vin Test-bench circuit 13 Outlines Simulation Results and Discussions Voltage Offset and Saturation Voltage 15V T=25°C T=150°C Input Voltage Rf=10K Op Amp Developed Model Rs=1K Rl=1K Vin=1V Test-bench circuit 14 Outlines Simulation Results and Discussions Frequency Response and Open-Loop Gain Temperature Increases T=150°C T=25°C 100dB Aol (dB, T1 25C ) 100dB Aol (dB, T2 150C ) Op Amp Developed Model Rs=1K Rl=1K Vin Test-bench circuit 15 Outlines Parameter Extraction and Model Validation Title: Comparison of measured and simulated voltage offset for different temperatures 16 Outlines Outlines Motivation and Context Op-amp Description and Characterization Development of HT Op-amp Models Conclusion and Prospects 17 Outlines Conclusion and Prospects A novel behavioral op-amp model in HT Simulation of major op-amp performance parameters Modeling methodology based on measurement of performance parameters Confirmation of VHDL-AMS abilities as a useful and modern modeling language A first step to model the whole analog-front end of a data acquisition system: Op-amp, Filter and ADC 18 Outlines References [1] E. Bruls, M. Verstraelen, T. Zwemstra, and P. Meijer, “Analogue fault simulation in standard VHDL,” IEE Proc. Circuits, Devices and Systems, vol. 143, 1996, pp. 380. [2] F. Pecheux, C. Lallement and A. Vachoux, “VHDL-AMS and Verilog- AMS as alternative hardware description languages for efficient modeling of multidiscipline systems,” ComputerAided Design of Integrated Circuits and Systems, IEEE Trans. on, vol. 24, n. 2005, pp. 204-225. [3] R. Kirschman, High-Temperature Electronics, Wiley-IEEE Press, 1998. [4] R. Johnson, J. Evans, P. Jacobsen, J. Thompson and M. Christopher, “The changing automotive environment: high-temperature electronics,” Electronics Packaging Manufacturing, IEEE Trans. on, vol. 27, 2004, pp. 164-176. [5] S. Baccar, S.M. Qaisar, D. Dallet, T. Levi, V. Shitikov and F. Barbara, “Analog to digital converters for high temperature applications: The modeling approach issue,” Instrumentation and Measurement Technology Conf. (I2MTC) IEEE, pp. 550-554, Austin, 3-6 May 2010 [6] G.B. Clayton et S. Winder, Operational Amplifiers, Fifth Edition, Newnes, 2003. [7] P.J. Ashenden, G.D. Peterson and D.A. Teegarden, The System Designer's Guide to VHDLAMS: Analog, Mixed-Signal, and Mixed- Technology Modeling, Morgan Kaufmann, 2002. [8] H. Qin, F. Wang, “ Modeling of Operational Amplifier based on VHDLAMS”, in Proc. IEEE International Conference on Electronics Circuits and Systems 2006, pp. 894-897, Nice, 10-13 19 December 2010 THANK YOU FOR YOUR ATTENTION Questions?