Title: Vapor Phase Covalent Organic Frameworks for Thermally Conductive Low-k Dielectrics Submitted to: ********************************************* Date: September 2, 2025 Abram Inman PROJECT DESCRIPTION History: Modern electronic devices rely on integrated circuits (ICs), which use crystalline silicon chip structures comprised of billions of transistors to process inputs and outputs. As technology advances, these chips continue to shrink, along with the size of the transistors (switches) conductors and insulating pathways (wires and dielectrics) creating increasingly dense networks. While miniaturization improves performance, it also introduces challenges in managing both heat dissipation and capacitive coupling (when the electric field from a switching signal line induces unwanted noise on a neighboring signal line). To reduce power consumption and improve thermal performance, materials with lower dielectric constants (k) are required SiO₂ is widely used as a dielectric in many ICs, with a dielectric constant of 3.9 and a thermal conductivity of about 1.3 W/m·K for fused silica.3. In an article by Austin M. Evans et al.,1 COFs were shown to exhibit ultra-low dielectric permittivity (k=1.6, meaning good electrical insulators) while also maintaining relatively high thermal conductivity (TC~1 W/m·K), making them strong candidates for advanced dielectric layers. In ICs, oxide layers not only serve as electrical insulators but also play a role in thermal transport. Unfortunately, conventional oxides have limited thermal conductivity, which restricts efficient cooling of the silicon core. This project seeks to address that limitation by investigating covalent organic frameworks (COFs) as a next-generation alternative to traditional oxide layers. In a study by Liu, M. et al., 2 two-dimensional (2D) COF films were successfully synthesized in a tube oven with a thickness of approximately 30 nm. Although the paper did not specify dielectric properties, it provides a valuable baseline for developing general experimental procedures involving COFs. Achieving low k dielectrics will be especially important as the industry moves into threedimensional integrated circuit design, where both electrical isolation and effective heat management are critical. Image 1: Dielectric layers are present in both NMOS and PMOS transistors and are commonly used in integrated circuits (ICs). Objective: The objective of this experiment is to establish a reliable procedure for the growth of covalent organic frameworks (COFs) using vapor phase deposition techniques, with an emphasis on chemical vapor deposition (CVD) methods. The focus is on synthesizing COF films through controlled vapor phase processes to achieve uniform and high-quality layers suitable for dielectric applications. 1 Following synthesis, the experiment will assess the stability of the deposited COF films by evaluating their resistance to delamination, electrical capacitance, physical thickness, and thermal conductance. These metrics are critical to determining the suitability of COFs as dielectric materials. Given the inherently porous structure of COFs, it is anticipated that these materials will demonstrate reduced electrical conductivity, thus functioning effectively as low-k dielectrics. At the same time, the porous architecture is expected to enhance thermal conductivity, which could provide improved heat management capabilities compared to conventional materials. Image 2: Tube oven layout with substrate and precursor (COF) placement METHODS The method used will take the substrate (Si) and place it in the chamber at the location based on the deposition’s temperature needs. A precursor will be placed in the tube oven between the substrate and the gas inlet (H2 and Argon). After the substrate and the precursor have been placed, the chamber will be vacuumed down to the desired pressure setpoint, gas flows set through the MFC’s, temperature set to the desired setpoint, and the pressure valve set to maintain the vacuum pressure regulated. The proposed procedure: after sample and substrate placement, connect the gas flow of argon and hydrogen. Design Of Experiments (DOE): Place a copper sheet into the tube oven to see where the deposition visually takes place, run this trial with three different plates, at 3 different temperatures. Record locations and deposit substrates in those locations. Place the precursor and perform 5 trial runs for a batch of 5 substrates for each run. The variables will be temperature, gas, and pressure. Then we will use a mercury probe (an instrument used in the semiconductor industry to make fast, nondestructive electrical measurements on materials by using liquid mercury to form contacts) to analyze the dielectric constant to see which ones have the desired features. The probe measures effectively in the 10e-107 Hz range. This is important because it tells us which physical processes we are measuring in the film, and whether your dielectric constant reflects the “intrinsic” material or extra effects like traps, leakage, or interfacial polarization. TIME SCHEDULE Phase 1: Months 1–2: Optimize furnace operation and ensure reliable process control. (Copper strips) 2 Phase 2: Months 3–5: Conduct initial deposition trials; refine process parameters. (Trial samples) Phase 3: Months 6-7: Systematic testing of COFs, characterization of thin films. (Produce samples for study) Phase 4: Month 8: Data analysis, evaluation of deposition outcome. Poster development and printing. STUDENT BACKGROUND I am a senior in electrical and computer engineering at UMKC, engaged with the Missouri Institute for Defense & Energy and MIDE since early 2024. I expect to earn my bachelor’s degree in spring 2026 and plan to pursue a master’s in the same field. My coursework covers logic design, electronic circuits, semiconductors, and device analysis—including MOSFETs, FETs, BJTs, and PN/NP transistors—which directly relates to my current research. As of spring 2025, my GPA is 3.47. I have practical experience with Physical Vapor Deposition (PVD) and substrate preparation, and am currently learning Chemical Vapor Deposition (CVD) techniques that will support upcoming experiments. IMPORTANCE TO STUDY Although solvothermal synthesis of COFs is well-documented, vapor phase deposition for semiconductor uses is not. I aim to address this by conducting deposition studies with a quartz crystal vacuum tube furnace under Prof. Paquette's guidance. While Prof. Paquette will advise on materials and analysis, I will focus on substrate prep, deposition, and process optimization. A critical step is testing the best equipment setup to enhance my knowledge of modern deposition and fabrication techniques. BUDGET $236.34 PID heater control, $285 replacement Quartz tube 30”, $100 Silicon wafer, $ $149/g from TCI Chemicals Benzene-1,3,5-tricarboxaldehyde-1,3,5-triformylbenzene, $345 Methane gas, $145 Argon gas, $96.77 PPE (Gloves and Eyewear), $129 Poster. PWORK CITED 3 1. Evans, Austin M. “Thermally Conductive Ultra-Low-k Dielectric Layers Based on TwoDimensional Covalent Organic Frameworks.” Nature Materials, U.S. National Library of Medicine, 20 Aug. 2021, pubmed.ncbi.nlm.nih.gov/33737728/. 2. Liu, Minghui, and Youxing Liu. “Two-Dimensional Covalent Organic Framework Films Prepared on Various Substrates through Vapor Induced Conversion.” Nature News, Nature Publishing Group, 17 Mar. 2022, www.nature.com/articles/s41467-022-29050-9. 3. Robertson, J. “High Dielectric Constant Oxides.” ChromeExtension://Efaidnbmnnnibpcajpcglclefindmkaj/Https://Web.Stanford.Edu/Class/Ee311/N OTES/Robertson%20JAP04.Pdf, Engineering Department, Cambridge University, Cambridge, 2 Dec. 2004. I will have time to make edits tomorrow. Please disregard content beyond page 3 unless the works cited section is required, as it is assumed not to contribute to the total page count. STUDENT BACKGROUND I am currently a senior studying electrical and computer engineering at the University of Missouri–Kansas City (UMKC), where I have been engaged with the Missouri Institute for Defense & Energy and the Division of Energy (MIDE) since early 2024. My expected graduation with a bachelor’s degree is in spring 2026, after which I intend to pursue a master’s degree in the same field. Throughout my academic career, I have completed coursework that includes logic design, electronic circuits, and studies of semiconductors and devices. These courses have provided me with a solid foundation in topics such as MOSFETs, FETs, BJTs, and PN/NP transistor characteristics, along with their analysis. The research I am undertaking is closely related to these subjects, and I believe it will allow me to gain a deeper understanding of technology. As of the end of spring 2025, my GPA stands at 3.47. My classes have offered a broad overview of the relevant topics, and I am eager to further explore the operational principles of transistors in modern devices. In addition to my academic background, I have hands-on experience with Physical Vapor Deposition (PVD), as well as expertise in substrate handling and preparation. I am currently expanding my knowledge by studying the techniques and general operation of Chemical Vapor Deposition (CVD) using a tube oven, which will be employed in the upcoming experiment. 4 IGNORE THIS UNLESS YOU SEE SOMETHING I SHOULD ADD. DO I NEED TO ADD THE CITATIONS? If so I will need to format them This research investigates the feasibility of chemical vapor deposition (CVD) of COFs onto silicon substrates to form functional monolayers or thin films. While solvothermal synthesis of COFs is widely reported in the literature, their vapor phase deposition for semiconductor applications remains underexplored. Under the supervision of Professor Michelle Paquette (Missouri Institute for Defense & Energy and Division of Energy, Matter & Systems, School of Science & Engineering), I will conduct deposition studies using a quartz crystal vacuum tube furnace equipped with mass flow controllers (MFCs). My expertise lies in electrical and computer engineering rather than chemistry, so material selection and characterization will be guided by Prof. Paquette, while I will focus on substrate preparation, deposition operation, and process optimization. SIGNIFICANCE AND INNOVATION Targeted Need: Current oxide layers in ICs exhibit suboptimal thermal conductivity, limiting cooling efficiency as device dimensions shrink. Improved low-k dielectric materials are urgently needed to sustain continued miniaturization and performance scaling. Innovation: This project introduces vapor phase COF deposition to semiconductor processing, a novel approach that combines the structural benefits of porous frameworks with the precision of CVD techniques. Successful outcomes could establish a new class of dielectric materials that simultaneously provide electrical insulation and enhanced thermal transport. BACKGROUND AND APPROACH I bring prior experience in CVD and substrate preparation, including deposition of chromium (Cr) and copper (Cu) layers onto silicon wafers. Although COF deposition is relatively new to me, I have been trained in tube furnace operation and will adapt that expertise to vapor phase deposition of organic frameworks. 5 The project will compare COF deposition against conventional dielectric processes to identify deficiencies, advantages, and process feasibility. Specifically, vapor phase deposition (VPD) will be employed to test whether stable, uniform COF films can be achieved under controlled furnace conditions. TASKS AND ANTICIPATED RESULTS Develop reliable vapor phase deposition protocols for COFs. Achieve uniform, thin COF films on silicon substrates. Evaluate adhesion, stability, and thermal/electrical properties of deposited films. Demonstrate potential of COFs as low-k dielectrics with improved thermal conductivity. STUDENT BACKGROUND I am a senior pursuing a Master of Science in Electrical and Computer Engineering with a minor in Mathematics. I have been working at the Missouri Institute for Defense & Energy for the past 18 months, gaining practical experience in substrate preparation, CVD processes, and vacuum system operation. This project leverages my technical training while expanding into a novel application under expert mentorship. REFERENCES 1. Lab and Furnace – Chemical Vapor Deposition Explained 2. ScienceDirect – Review Article on CVD 3. Liu, M., Liu, Y., Dong, J. et al. Two-dimensional covalent organic framework films prepared on various substrates through vapor induced conversion. Nat Commun 13, 1411 (2022). https://doi.org/10.1038/s41467-022-29050-9 Published17 March 2022 4. chromeextension://efaidnbmnnnibpcajpcglclefindmkaj/https://web.stanford.edu/class/ee311/NO TES/Robertson%20JAP04.pdf 5. https://pubmed.ncbi.nlm.nih.gov/33737728/ 6. Pic: https://www.google.com/search?q=CVD%20tube%20oven%20COFs.%20examples&ud m=2&tbs=rimg:CRVSVkxXYq9EYY-npG75F8msgIAwAIA2AIA4AIA&cs=1&hl=en&sa=X&ved=0CBoQuIIBahcKEwiwiabOt2PAxUAAAAAHQAAAAAQBw&biw=1600&bih=731&dpr=1#vhid=9ZUdrUbsxfpqL M&vssid=mosaic 6 7. https://www.nature.com/articles/s41467-022-29050-9#citeas 7
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