PRELIMINARY TECHNICAL DATA
a
Preliminary Technical Data
FEATURES
Complete Rate Gyroscope on a Single Chip
Z Axis (Yaw rate) response
High Vibration rejection over wide frequency
0.05 °/s/ √Hz Noise
1000g Powered Shock Operation
Self-Test on Digital Command
Temperature Sensor Output
Precision Voltage Reference Output
Absolute Rate Output for Precision Applications
+5V Single Supply Operation
Ultra small and light (<150mm2, <1 gram)
APPLICATIONS
• GPS Navigation Systems
• Vehicle Stability Control
• Inertial Measurement Units
• Guidance and Control
• Platform Stabilization
GENERAL DESCRIPTION
±150deg/s Single Chip Yaw Rate Gyro
with Signal Conditioning
ADXRS150*
micromachining process to make a functionally complete
and low cost angular rate sensor integrated with all of the
required electronics all on the same chip.
The manufacturing technique for this device is the same
high-volume BIMOS process used to for high reliability
automotive airbag accelerometers.
The output signal, RATEOUT(1B,2A), is a voltage
proportional to angular rate about the axis normal to the top
surface of the package (see Figure 1). A single external
resistor can be used to lower the scale factor. An external
capacitor is used to set the bandwidth. Other external
capacitors are required for operation (see Figure 2).
A precision reference and a temperature output are also
provided for compensation techniques. Two digital self-test
inputs electro-mechanically excite the sensor to test proper
operation of both sensors and the signal conditioning
circuits.
The ADXRS150 is available in a 7mm x 7mm x 3mm BGA
surface-mount package.
The ADXRS150 is a complete angular rate sensor,
(gyroscope) which uses Analog Devices’ surface-
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties which may result from its use.
9/30/02
No license is granted by implications or otherwise under any patent or patent rights of
Analog Devices
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617-329-4700
Fax 617-326-8703
PRELIMINARY TECHNICAL DATA
ADXRS150-SPECIFICATIONS
@TA =+25°C, Vs=+5V; Bandwidth = 80Hz (Cout = 0.01µF), Angular Rate = 0 °/s, unless otherwise noted.
ADXRS150ABC
Parameter
Conditions
Min
Typ
Max
SENSITIVITY
Dynamic Range1
Initial
Over Temperature2
Nonlinearity
Voltage Sensitivity
NULL
Initial Null
Null Drift Over Temperature
Temperature Hysteresis of Null3
Turn On Time
Stability (after turn on time)
Linear acceleration effect
Voltage Sensitivity
NOISE PERFORMANCE
Rate Noise Density
Clockwise rotation is positive output
Full scale range over spec. range
@25 °C
+/- 150
11.25
11.25
Best fit straight line
0.1
°/s
mV/°/s
mV/°/s
% of FS
Vcc=4.75 to 5.25V
0.7
%/V
13.75
13.75
@25°C
ST1 pin from Logic '0' to '1', -40° to 85°C
ST2 pin from Logic '0' to '1', -40° to 85°C
Standard high logic level definition
Standard low logic level definition
To Common
TEMPERATURE SENSOR
V out at 298 °K
Max current load on pin
Scale factor
Sink to common
Proportional to absolute temperature
tbd
35
0.05
0.2
V
mV
mV
ms
°/sec
°/sec/g
1
°/sec/V
0.05
°/s/ √Hz
500
14
Hz
kHz
+/- 300
Vcc=4.75 to 5.25V
SELF TEST
ST1 RATEOUT Response
ST2 RATEOUT Response
Logic '1' Input Voltage
Logic '0' Input Voltage
Input Impedance
2.5 VOLT REFERENCE
Voltage value
Load Drive to ground
Load Regulation
Power Supply Rejection
Temperature Drift
12.5
2.50
Delta from 25°C
Return after temp excursion
Power on to ± ½ °/sec of final
0. 5 sec to 3 minutes from power-on
Any axis
FREQUENCY RESPONSE
Maximum Bandwidth (user selectable) Determined by Cout
Sensor Resonant Frequency
OUTPUT DRIVE CAPABILITY
Output Voltage Swing
Capacitive Load Drive
Units
-400
400
3.3
-660
660
-1000
1000
1.7
50
kΩ
2.50
Iout = ±100uA
50
8.4
0.25
1000
V
uA
mV/°K
Vs-0.25 V
pF
2.450
2.5
200
5.0
1.0
5.0
2.550
Volts
uA
mV/mA
mV/V
mV
4.75
5.00
6.0
5.25
8.0
V
mA
Source
0 < Iout < 200uA
4.75 to 5.25 Vs
Delta from 25°C
POWER SUPPLY
Operating Voltage Range
Quiescent Supply Current
mV
mV
V
V
TEMPERATURE RANGE
85
°C
Specified Performance A grade
−40
Notes:
1. Dynamic range is the maximum full scale measurement range possible including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at 5V supplies.
2. Specification refers to the maximum extent of this parameter as a worst case value at Tmin or Tmax.
3. Repeatability of the null offset reading with returning to the same temperature after worst case operating temperature swing.
All min and max specifications are guaranteed. Typical specifications are not tested or guaranteed
REV. PrA 9/30/02
2
PRELIMINARY TECHNICAL DATA
CP1
5
ST2
CP2
4
AVCC
3
TEMP
2
AGND
1
F
SUMJ
G
CMID
Package
Option
BGA-32
3
CP3
ST1
PIN CONFIGURATION
REV. PrA 9/30/02
CP5
ADXRS150AB
G
ORDERING GUIDE
Temperatur
Package
e Range
Description
-40° to
32 pad BGA
+85°C
7
6
Drops onto hard surfaces can cause shocks of greater than
2000g and exceed the absolute maximum rating of the device.
Care should be exercised in handling to avoid damage
Model
CP4
PGND
V2.5
Stresses above those listed under Absolute Maximum Ratings may cause
permanent damage to the device. This is a stress rating only. Functional
operation of the device at these, or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device
reliability.
PDD
ABSOLUTE MAXIMUM RATING:
Acceleration
(any
axis,
unpowered,
0.5ms)………….….2000g
Acceleration (any axis, powered for 0.5ms)…………….1000g
+Vs……………………………….……………-0.3V to +6.0V
Output
Short
Circuit
Duration
(any
pin
to
Common)..Indefinite
Operating
Temperature……………..……..…-55°C
to
+125°C
Storage
Temperature……………….…….…..-65°C
to
+150°C
E
D
C
Bottom View
RATEOUT
B
A
PRELIMINARY TECHNICAL DATA
RATE SENSITIVE AXIS
This is a Z-axis rate-sensing device, also called yaw-rate
sensing. It produces a positive going output voltage for
clockwise rotation about the axis normal to the package top,
i.e., clockwise when looking down at the package lid.
Rate
Axis
Longitudinal
Axis
RATEOUT
Vcc=5V
4.75V
+
2.5V
7
A1
ABCDEFG
Lateral Axis
Rate In
1
0.25V
GND
Figure 1:RATEOUT signal increases with clockwise rotation.
REV. PrA 9/30/02
4
Pin #
6D, 7D
6A, 7B
6C, 7C
5A, 5B
4A, 4B
3A, 3B
1B, 2A
1C, 2C
1D, 2D
1E, 2E
2G, 1F
3F, 3G
4F, 4G
5F, 5G
6G, 7F
6E, 7E
Name
CP5
CP4
CP3
CP1
CP2
AVCC
RATEOUT
SUMJ
CMID
V2.5
AGND
TEMP
ST2
ST1
PGND
PDD
Description
HV Filter Capacitor – 47nF
Charge Pump Capacitor – 22nf
Charge Pump Capacitor – 22nf
+ Analog Supply
Rate Signal Output
Output Amp Summing Junction
HF Filter Capacitor – 100nf
2.5 Volt Precision Reference
Analog Supply Return
Temperature Voltage Output
Self-Test for Sensor 2
Self-Test for Sensor 1
Charge Pump Supply Return
+ Charge Pump Supply
PRELIMINARY TECHNICAL DATA
THEORY OF OPERATION
The ADXRS150 operates on the principle of a resonator gyro.
Two polysilicon sensing structures each contain a dither frame,
which is electrostatically driven to resonance. This produces
the necessary velocity element to produce a Coriolis force
during angular rate. At two of the outer extremes of each
frame, orthogonal to the dither motion, are movable fingers that
are placed between fixed pickoff fingers to form a capacitive
pickoff structure which senses Coriolis motion. The resulting
signal is fed to a series of gain and demodulation stages that
produce the electrical rate signal output. The dual sensor design
rejects external g-forces and vibration. Fabricating the sensor
with the signal conditioning electronics preserves signal
integrity in noisy environments.
The electrostatic resonator requires 14V to 16V for operation.
Since only 5V is typically available in most applications, a
charge pump is included on chip. If an external 14V to 16V
supply is available, the two capacitors on CP1-CP4 can be
omitted and this supply connected to CP5 (pin 7D) with a
100nF decoupling capacitor in place of the 47nF.
After the demodulation stage there is a single pole low pass
filter consisting of an internal 7k resistor (Rsen1) and an
external user supplied capacitor (Cmid). A Cmid capacitor of
100 nF sets a 400 Hz low pass pole ±35% and is used to limit
high frequency artifacts before final amplification. Bandwidth
limit capacitor Cout sets the pass bandwidth. (See figure 3
below and Setting Bandwidth section following)
100nF
22nF
CP4
CP5
CP3
PDD
7B
7C
7E
7D
PGND
7F
47nF
6A
22nF
+5V
6G
CP1
5A
5G
ST1
CP2
4A
4G
ST2
AVCC
3A
3G
100nF
2A
TEMP
2G
1F
Cout = 22nF
100nF
AGND
RateOut
V2.5
1D
CMID
1E
1C
SUMJ
1B
(Top View)
FIGURE 2: EXAMPLE APPLICATION CIRCUIT.
REV. PrA 9/30/02
5
SUPPLY AND COMMON CONSIDERATIONS
Only power supplies used for supplying analog circuits are
recommended for powering the ADXRS150. High frequency
noise and transients associated with digital circuit supplies may
have adverse affects on device operation.
Figure 2 shows the recommended connections for the
ADXR150 where both AVCC and PDD have a separate
decoupling capacitor. These should be placed as close to the
their respective pins as possible before routing to the system
analog supply. This will minimize the noise injected by the
charge pump that uses the PDD supply.
Also recommended is to place the three charge pump capacitors
connected to the CP1-CP5 pins as close to the part as possible.
These capacitors are used to produce the on chip high-voltage
supply switched at the dither frequency at approximately
15kHz. Care should be taken that there is no more than 50pF of
stray capacitance between CP1 – CP5 and ground. Surfacemount chip capacitors are suitable as long as they are rated for
over 15V.
PRELIMINARY TECHNICAL DATA
+
5V
Cout
100nF
AVCC
ST1 5G
100nF
3A
2G
SELF
TEST
ST2 4G
1F
AGND
CMID
SUMJ
1D
Rout
CORIOLIS SIGNAL CHANNEL
π
RATE
SENSOR
1C
Rsen1
Rsen2
180k ± 1%
DEMOD
≈7k ±35%
≈7k ±35%
1B
2A
RATEOUT
RESONATOR LOOP
2.5V REF
1E V2.5
PTAT
CHARGE
PUMP/
REG.
3G TEMP
+12V
ADXRS150
CP2
4A
5A
CP1
7E
PDD
6G 7F
PGND
100nF
22nF
6A 7B
CP4
7C
CP3
7D
CP5
47nF
22nF
Figure 3 – ADXRS150 Block Diagram with External Components
SETTING BANDWIDTH
INCREASING MEASUREMENT RANGE
Refer to Figure 3. External capacitors Cmid and Cout are used in
combination with on-chip resistors to create two low pass
filters to limit the bandwidth of the ADXRS150’s rate
response. The –3dB frequency set by Rout and Cout is:
The full-scale measurement range of the ADXRS150 can be
increased by placing an external resistor between the
RATEOUT(1B, 2A) and SUMJ(1C, 2C) pins which would
parallel the internal Rout resistor that is factory-trimmed to
180KΩ. For example, a 330KΩ external resistor will give
approximately 8.1 mV/deg/sec sensitivity and a commensurate
~ 50% increase in the full-scale range. This is effective for up
to a 4X increase in the full-scale range (minimum value of the
parallel resistor allowed is 45KΩ). Beyond this amount of
external sensitivity reduction, the internal circuitry headroom
requirements prevent further increase in linear full-scale
output range. The drawbacks of modifying the full-scale
range are the additional output null drift (as much as 2 °/sec
over temperature) and the re-adjustment of the initial null bias
(See section on Null Adjust).
ƒout=1 / (2 *π *Rout *Cout)
and can be well controlled since Rout has been trimmed during
manufacture to be 180kΩ +/-1%. Any external resistor applied
between RATEOUT(1B, 2A) and SUMJ(1C, 2C) pins, will
result in
Rout = (180KΩ * Rext) / (180KΩ + Rext)
The –3dB frequency set by Rsen (the parallel combination of
Rsen1 and Rsen2) at about 4.5KΩ nominal and Cmid is less well
controlled since Rsen1 and Rsen2have been used to trim the rate
sensitivity during manufacture and have a ±35% tolerance. Its
primary purpose is to limit the high frequency demodulation
artifacts from saturating the final amplifier stage. Thus, this
pole of nominally 400 Hz @ 0.1 uF, need not be precise.
Lower frequency is preferable but its variability usually
requires it to be at least higher than the well-controlled output
pole. In general both –3dB filter frequencies should be set as
low as possible to reduce the amplitude of these high
frequency artifacts as well as to reduce overall system noise.
REV. PrA 9/30/02
6
TEMPERATURE OUTPUT AND CALIBRATION
It is common practice to temperature-calibrate gyros to
improve their overall accuracy. The ADXRS150 has a
temperature-proportional voltage output to provide input to
such a calibration method. The voltage at TEMP(3F, 3G) is
nominally 2.5v at 27°C and has a PTAT (proportional to
absolute temperature) characteristic, i.e., 8.4 mV / °C. Note
that the TEMP output circuitry is limited to 100µa/50µa
source/sink currents respectively.
PRELIMINARY TECHNICAL DATA
If an external resistor is used across RATEOUT and SUMJ
then the parallel equivalent value is substituted into the above
equation. Note that the resistor value is an estimate as it
assumes Vcc=5.0 volts and VSUMJ= 2.5 Volts.
5
4
3
Null Drift (°/s)
2
SELF TEST FUNCTION
1
0
-1
-2
-3
-4
-5
1.8
2.0
2.2
2.4
2.6
2.8
3.0
Vtemp (V)
Figure 4: Null drift vs Vtemp output for several devices.
Using a 3-point calibration technique, it is possible to calibrate
the ADXRS150's null drift and sensitivity drift to an overall
accuracy of nearly 300 deg/hour. An overall accuracy of 70
degrees an hour or better is possible using more points.
Limiting the bandwidth of the device reduces the flat-band
noise during the calibration process improving the
measurement accuracy at each calibration point.
USING THE ADXRS150 WITH A SUPPLYRATOMETRIC ADC
The ADXRS150's RATEOUT signal is non- ratiometric; i.e.,
neither the null voltage nor the rate sensitivity is proportional
to supply. Rather, they are nominally constant for D.C. supply
changes within the 4.75 to 5.25v operating range.
If the ADXRS150 is to be used with a supply-ratiometric
ADC, the ADXRS150’s V2.5 output can be converted and
used to make corrections in software for the supply variations.
NULL ADJUST
Null adjustment is made possible by injecting a suitable
current to SUMJ(1C, 2C). Adding a suitable resistor to either
ground or the positive supply is a simple way of achieving
this. The nominal 2.5 V null is for symmetrical swing range
at RATEOUT(1B, 2A). However, a non-symmetric output
swing may be suitable in some applications. Note that if a
resistor is connected to the positive supply, then supply
disturbances may reflect some null instabilities. Digital supply
noise is to be particularly avoided in this case. (See Supply
and Common Considerations).
The value of the resistor to use is approximately:
Rnull = (2.5 * 180,000) / (Vnull0 –Vnull1)
Vnull0 is the un-adjusted zero rate output; Vnull1 is the target
null value. If the initial value is below the desired value the
resistor should terminate on common, or ground. If it is above
the desired value, the resistor should terminate on the 5V
supply. Values typically are in the 1-5 MΩ range
REV. PrA 9/30/02
7
The ADXRS150 includes a self-test feature that actuates each
of the sensing structures and associated electronics in the same
identical manner as if subjected to angular rate. It is activated
by standard logic high levels applied to inputs ST1 (5F, 5G)
or ST2 (4F, 4G), or both. ST1 will cause the voltage at
RATEOUT to change about –0.7V and ST2 will cause an
opposite +0.7V. The self-test response follows the viscosity
temperature dependence of the package atmosphere,
approximately 0.25 %/°C.
Activating both ST1 and ST2 simultaneously is not damaging.
As ST1 and ST2 are not necessarily closely matched,
actuating both simultaneously may result in an apparent null
bias shift.
CONTINUOUS SELF-TEST
The one-chip integration of the ADXRS150 gives it higher
reliability than is obtainable with any other high volume
manufacturing method. Also, it is manufactured under a
mature BIMOS process which has field-proven reliability. As
an additional failure-detection measure, power-on self-test can
be performed. However, some applications may warrant
continuous self-test while sensing rate. Application notes
outlining continuous self test techniques are available.
PRELIMINARY TECHNICAL DATA
There are two effects of concern, shifts in the static null and
induced null noise. Scale factor is not significantly affected
until the acceleration reaches several hundred meters per
second squared.
Static acceleration in the lateral axis gives a null shift defined
by first and second order coefficients both of which are
random variables in the population of parts. The first order
coefficient has zero mean and a standard deviation of
0.02(°/s)/(m/s2). The second order coefficient has a
distribution with mean 0.00005(°/s)/(m/s2) 2 and a standard
deviation of 0.000015(°/s)/(m/s2) 2. These values were
obtained by centrifuge testing at ±100 m/s2.
Vibration rectification for frequencies up to 20kHz is of the
order of 0.00002(°/s)/(m/s2) 2, is not significantly dependent
on frequency and has been verified up to 400 m/s2 rms.
Linear vibration spectral density near the 14kHz sensor
resonance translates into output noise. In order to have a
significant effect the vibration must be within the angular rate
bandwidth (typically ±40Hz of the resonance), so it takes
considerable high frequency vibration to have any effect.
Away from the 14kHz resonance the effect is not discernible,
except for vibration frequencies within the angular rate
passband. This can be seen from figures 15 through 17 for the
various sensor axes. The in-band effect can be seen in Figure
7. This is the result of the static g-sensitivity. The specimen
used for Figure 7 had a g-sensitivity of 0.15 °/s/g and its total
in-band noise degraded from 3 mVrms to 5 mVrms for the
specified vibration. The effect of broadband vibration up to
20kHz is shown in Figure 7.
- 70
- 80
- 90
- 100
- 110
- 120
- 130
1
100 0
10000
100000
2.60
2.58
2.56
2.54
2.52
2.50
0
2
4
6
8
10
Time (s ec )
Figure 6: Random Vibration (Lateral) 2Hz to 40 Hz 3.2grms
s haking 2.4 mV rms
s tatic 0.8 mV rms
2.60
2.60
2.58
2.58
2.54
100
Figure 5: Noise Spectral Density at RATEOUT – BW=40Hz
s haking 10.6 mV rms
2.56
10
Fr equenc y ( Hz )
RA TEOUT (V )
RA TEOUT (V )
s tatic 3.1 mV rms
- 60
RA TEOUT (dBV /rt Hz )
The most sensitive orthogonal axis for acceleration effects is
the lateral axis as defined in Figure 1. The sign convention
used is that lateral acceleration is positive in the direction
from pin column A to pin column G of the package. That is, a
device has positive sensitivity if its voltage output increases
when the row of pins 2A-6A are tipped under the row 2G-6G
in the Earth’s gravity.
The output noise of the part falls away in accordance with the
output low-pass filter and does not contain any 'spikes' more
than 1% of the low-frequency noise. A typical noise spectrum
is shown in figure 6 below.
RA TEOUT (V )
ACCELERATION SENSITIVITY
2.56
2.54
2.52
2.52
2.50
2.50
0
2
4
6
8
10
0
2
4
6
8
time (s ec )
time (s ec )
Figure 7 :Random Vibration (Lateral) 10kHz to 20kHz at 0.01g/rt.Hz with 60 Hz sampling and 0.5 sec averaging.
REV. PrA 9/30/02
8
10
PRELIMINARY TECHNICAL DATA
ADXRS150 - TYPICAL PERFORMANCE CURVES
No Prior Warmup, 0.6Hz Sampling
Pre-applied rate=100 °/s , Pow er-on @ t=0
2.570
4.5
4.0
2.565
3.5
2.560
RA TEOUT (V )
3.0
2.5
2.555
2.0
2.550
1.5
1.0
2.545
0.5
0.0
2.540
-0.05
0.00
0.05
0.10
0.15
Time (s ec )
0.20
0.25
0
60
90
120
Time (s ec )
150
180
Figure 9: Null Settling Time
2.570
0.07
2.565
0.06
0.05
2.560
0.04
2.555
°/s
RA TEOUT (V )
Figure 8: Rate Sensing Startup Time
30
0.03
2.550
0.02
2.545
0.01
2.540
0
0
600
1200
1800
2400
3000
3600
1
10
100
Sec onds
Time (s ec )
Figure 10: Null Stability for 1hr
Figure 11: Root Allan Variance vs. Avg. Time
3.4
2.5040
3.2
2.5035
3.0
V2.5 (V)
V temp (V )
2.5030
2.8
2.6
2.4
2.5025
2.5020
2.2
2.5015
2.0
2.5010
1.8
-40 -30 -20 -10
-55
-30
-5
20
45
70
95
Temperature (°C)
Figure 12: Temperature Sensor Output
REV. PrA 9/30/02
0
10 20 30 40 50 60 70 80
Temperature (°C)
Figure 13: V2.5 Voltage Reference vs Temperature
9
PRELIMINARY TECHNICAL DATA
ADXRS150 at BW = 40Hz, Typical Vibration Characteristics, 10g Flat Band, 20Hz to 2kHz
Pac kage Lateral A x is (0.5 s A v e)
2.500
2.500
2.490
2.490
2.480
0g
2.470
10g
RA TEOUT (V )
R ATEOU T (V)
Pac kage Lateral A x is (1/60 s ec s ample rate)
2.460
2.480
0g
2.470
10g
2.460
2.450
2.450
0
5
10
0.0
Time (s ec )
5.0
10.0
Time (s ec )
Figure 14: 10g Random Vibration in package-lateral axis orientation
Pac kage Longitudinal A x is (0.5 s A v e)
2.500
2.500
2.490
2.490
2.480
0g
2.470
10g
RA TEOUT (V )
RA TEOUT (V )
Pac kage Longitudinal A x is (1/60 s ec s ample rate)
2.480
0g
2.470
2.460
2.460
2.450
2.450
0
5
10g
0.0
10
Time (s ec )
5.0
10.0
Time (s ec )
Figure 15: 10g Random Vibration in package-longitudinal axis orientation
Rate ax is (0.5 s A v e)
Rate ax is (1/60 s ec s ample rate)
2.500
2.500
2.490
2.480
0g
2.470
10g
2.460
RA TEOUT (V )
RA TEOUT (V )
2.490
2.480
0g
2.470
10g
2.460
2.450
2.450
0
5
0.0
10
Tim e (s ec)
Time (s ec )
Figure 16: 10g Random Vibration in rate axis orientation
REV. PrA 9/30/02
5.0
10
10.0
PRELIMINARY TECHNICAL DATA
BEHAVIOR UNDER VARIOUS SHOCK TEST CONDITIONS
Figure 17: Shock Test 100g 5ms in Lateral Axis (40 Hz)
Figure 18: Shock Test 100g 5ms in Longitudinal Axis (40Hz)
Figure 19: Hi-g shock test in Lateral Axis (40Hz)
Figure 20: Hi-g shock test, lateral axis, 10X time base (40Hz)
Figure 21: Hi-g shock in Rate Axis (40 Hz)
Figure 22: Hi-g shock, Rate Axis, BW reduced to 8Hz
REV. PrA 9/30/02
11
PRELIMINARY TECHNICAL DATA
STATISTICAL DISTRIBUTIONS
X = 0.066
σ = 0.007
N = 498
0.04
0.05
0.07
0.06
0.08
0.09
Noise at +85 °.C (°/√s)
0.10
0.11
X = 0.036
σ = 0.005
N = 498
150
150
100
100
50
50
0.12
0.02
0.03
0.04
Noise at -25 °.C (°/√s)
0.05
0.06
Figure 23: ADXRS150 Gyro Noise at +85 and -25 deg. C
125
X = 0.0007
σ = 0.0055
N = 242
X = 0.16
σ = 0.13
N = 242
100
75
75
50
50
25
25
-0.03
-0.02
-0.01
0.00
0.01
Peak error in Null Bias Fit (V)
0.02
0.03
-0.4
-0.1
0.8
0.2
0.5
Peak error in S.F. fit (mV/°/s)
Figure 24: ADXRS150 Temperature coefficient Fit error Distributions
150
X = -0.04
σ = 0.10
N =544
X = 0.02
σ = 0.08
N = 544
200
100
150
100
50
50
-0.4
-0.2
0.0
0.2
First Order Null Coefficient ‘a’ (V/V)
0.4
-0.4
-0.2
0.0
0.2
2
Second Order Null Coefficient ‘b’ (V/V )
0.4
Figure 25: ADXRS150 Null Coefficient Distributions
150
X = 0.13
σ = 0.26
N = 393
X = -0.62
σ = 0.24
N = 393
125
100
100
75
50
50
25
-0.5
-0.2
0.1
0.4
0.7
1.0
First Order S. F. Coef. ‘a’ (mV/°/sec/V)
1.3
1.6
-1.5
-1.2
-0.9
-0.6
-0.3
0.0
0.3
2
Second Order S. F. Coef. ‘b’ (mV/°/sec/V )
Figure 26: ADXRS150 Scale Factor Coefficient Distributions
REV. PrA 9/30/02
12
0.6
PRELIMINARY TECHNICAL DATA
SURFACE-MOUNT BALL GRID ARRAY (BOTTOM VIEW)
0.276” sq. max
0.12”± 0.015
CP3
CP5
PDD
PGND
CP4
ST1
CP1
ST2
CP2
TEMP
AVCC
AGND
RATEOUT
SUMJ
CMID
V2.5
0.020”
0.0315” typ
NOTE: Metal lid is internally connected to AGND.
REV. PrA 9/30/02
13