AN255 R EPLACING 6 2 2 M H Z VCSO DEVICES W I T H T HE Si55 X V C X O 1. Introduction The Silicon Laboratories Si550 is a high-performance, voltage-controlled crystal oscillator (VCXO) device that is suitable for use in SONET/SDH phase-locked loop (PLL) applications. The Si550 is available in a 5x7 mm package with an industry-standard footprint and pin-out and can be used as a replacement for voltage-controlled SAW oscillator (VCSO) or VCXO devices in existing PLL designs. This application note discusses use of the Si550 as a replacement for a leading 622 MHz VCSO device with respect to the following device characteristics: Modulation bandwidth Phase noise and jitter Nominal VCO gain (Kvco) Variation in Kvco over normal operating conditions Power supply rejection ratio (PSRR) 2. Modulation Bandwidth The phase shift associated with the modulation bandwidth of a VCO can be a factor in calculating the phase margin around the PLL loop if the loop bandwidth is relatively close to the VCO modulation bandwidth. In order to facilitate these phase margin calculations, the Si550 modulation bandwidth is specified as the modulation frequency at which the phase shift reaches –45 degrees, rather than the frequency at which the modulation amplitude reaches – 3 dB. The Si550 modulation bandwidth, measured using the –45 degree phase shift criteria, is 10 kHz typical. The PLL circuits used for clock recovery and jitter attenuation ("clock cleaning") in high-speed communications systems typically have loop bandwidths in the 1 to 2 kHz range, so the phase shift associated with the Si550 modulation bandwidth is not a significant factor in these designs. 3. Phase Noise and Jitter At the device level, both the Si550 and the 622 MHz VCSO devices have output jitter specifications of well below 1 psRMS for the standard SONET/SDH measurement bandwidths. However, several other factors, such as VCO gain and PSRR can have a significant affect on the PLL's jitter performance at the system level. These factors are addressed in the following sections. 4. Nominal VCO Gain—Kvco The VCO gain, Kvco, specifies the amount of change in VCO output frequency that will result from a change in voltage at the VCONTROL input pin of the VCO. The VCO gain multiplied by the operating voltage range of the VCONTROL pin gives the "total pull range" of the VCO. "Absolute Pull Range" (APR) is a measure of the amount of VCO pull range that is available for PLL tracking of variations in the reference clock signal after allowing for the total frequency accuracy of the VCO. APR = (Total Pull Range) – (Total Frequency Stability) Total Pull Range = Kvco x VCONTROL Range Total Frequency Stability = Initial Accuracy + Temperature Stability + Aging + Other ("Other" includes Supply variation, Load variation, Shock & Vibration, and Reflow) From a jitter generation and noise susceptibility perspective, it is desirable to use the lowest Kvco value that can still provide the minimum APR required for the application (PLLs for SONET/SDH applications typically need at least ±20 ppm APR). However, the poorer the frequency stability of the VCO, the larger the Kvco value must be to Rev. 0.2 2/09 Copyright © 2009 by Silicon Laboratories AN255 AN255 achieve a given APR. The 622 MHz VCSO device has a gain of Kvco = 390 ppm/V, and provides an APR of ±50 ppm. The Si550 is able to provide the same APR of ±50 ppm with a much lower gain of Kvco = 90 ppm/V. The lower Kvco value of the Si550 device can yield significant jitter performance benefits at the system level, as discussed in the following paragraphs. PLL circuits are commonly implemented using a charge-pump design or an op-amp active filter design. Simplified block diagrams for these two PLL topologies are given in Figure 1 and Figure 2, respectively. The loop bandwidth for a typical PLL design is proportional to the VCO gain and to the gain of the phase/frequency detector circuit. Selection of a particular VCO device determines the VCO gain. The loop bandwidth is then set by adjusting the gain of the phase/frequency detector circuit. The gain of the phase/frequency detector is typically set by adjusting the value of a resistor in the PFD filter circuit. This resistor is denoted Rg in both Figure 1 and in Figure 2. A capacitor, denoted Cz, is typically used with the resistor Rg to set the frequency of the loop zero. When replacing the VCO in an existing PLL design, it may be necessary to change the values of these discrete components in order to maintain the original loop bandwidth and zero location. up CLKIN PFD VCO dn CLKOUT Rg Cz (C << C z) ÷N Figure 1. Charge-Pump PLL Rg CLKIN Cz (R) XOR VCO CLKOUT + (C << C z) ÷N Figure 2. Op-Amp Active Filter PLL For example, when replacing a VCSO having Kvco = 390 ppm/V with the Si550, if none of the discrete component values are changed then the PLL loop bandwidth would be scaled by a factor of 90/390. Scaling of the resistor value Rg by a factor of 390/90 would maintain loop bandwidth of the original design. The capacitor value Cz should then be scaled in by a factor of 90/390 in order to maintain the original zero location. The original values and new values for these component changes are summarized in Table 1. 2 Rev. 0.2 AN255 Table 1. Summary of Component Value Changes Original Value New Value 622 MHz VCSO Si550 VCXO VCO APR ±50 ppm ±50 ppm VCO Gain 390 ppm/V 90 ppm/V PFD Gain Resistor Rg Rnew = Rg x 390/90 Zero location Capacitor Cz Cnew = Cz x 90/390 VCO Device In this example, the new VCO gain value is smaller than the original, and the new resistor value is made larger in order to maintain the original loop bandwidth. This is a beneficial tradeoff from a system-level jitter perspective, because any noise that is coupled into the Vcontrol pin of the VCO is converted to jitter at the VCO output with a gain factor equal to Kvco. One small source of noise at the Vcontrol pin is noise voltage generated by the resistor Rg. The noise voltage generated by a resistor is proportional to the square root of the resistance, so the resistor noise voltage is roughly doubled in our example ((390/90)^0.5 = 2.08). However, Kvco has been reduced by a factor of four (90/390 = 0.23), so the net effect is that the jitter due to resistor noise has been cut in half. A more significant source of noise at the Vcontrol pin in typical PLL designs is the conducted or radiated emissions from other circuits in the equipment. Jitter resulting from these sources will be cut by a factor of four. The system level jitter implications discussed in the previous paragraph are summarized in Table 2. The Vcontrol pin of the VCO is generally considered the most sensitive node in any PLL design, and PLL designers must work hard to minimize noise at this point. Reducing the VCO gain, Kvco, reduces the sensitivity at this node, which results in lower PLL output jitter and also simplifies the PLL design task. Table 2. System Jitter Implications of Suggested Component Value Changes Output Jitter Source Effect of Component Changes Output Jitter Due to Resistor Noise at VCONTROL pin. Jitter reduced by a factor of two. Output Jitter due to radiated/conducted noise at VCONTROL pin. Jitter reduced by a factor of four. An additional potential benefit of the component value changes suggested in Table 1 is the reduction of the capacitor value. The large capacitance required for designs that have high VCO gain can cause difficulties for PLL designers. Reduction of this value may allow use of a capacitor with a smaller footprint and/or better a dielectric material. Alternatively, if the resistor value is scaled as indicated in Table 1 but the original capacitor value is retained, the effect is a lowering of the zero location, which can improve loop stability and reduce jitter peaking. Rev. 0.2 3 AN255 5. Variation in Kvco over Normal Operating Conditions As stated earlier, typical PLL designs have a loop bandwidth that is proportional to the VCO gain, Kvco. As the VCO gain varies over the normal operating temperature and frequency of the application, the PLL loop bandwidth will also change. The PLL loop bandwidth, of course, affects critical performance characteristics such as jitter attenuation capability and loop stability/jitter peaking, so minimizing Kvco variation is important. The Si550 exhibits less variation in Kvco over temperature and operating frequency than does the 622 MHz VCSO device. To measure the difference in Kvco variation, one PLL circuit was built using the 622 MHz VCSO device, and a second PLL circuit was built using the Si550 VCXO with component value substitutions as indicated in Table 1. These two PLL circuits were built using identical circuit boards and using the same phase/frequency detector integrated circuit. The VCO gain for each device was measured by locking the PLL at two different frequencies that represented small offsets from the nominal operating frequency (i.e., 622 MHz ±5 ppm) and measuring the control voltage at the VCONTROL pin of the VCO at each frequency. The gain was then calculated as the difference in frequencies divided by the incremental change in control voltage: K VCO = f2 – f1 V CONTROL2 – V CONTROL1 This measurement was repeated at a number of different temperatures, ranging from –20 to +85 Cº, and the results were plotted as a graph of Kvco vs. temperature. To demonstrate the correlation between Kvco variation and PLL bandwidth variation, a jitter transfer measurement was made at the same temperature points for both PLL boards using an Anritsu MP1777A Jitter Analyzer. The –3 dB cutoff frequencies from the measured jitter transfer curves were then also plotted as a function of temperature. The results from these measurements are shown in Figure 3 and Figure 4. To view this information another way, consider the task of designing a PLL to operate with a 1 kHz loop bandwidth and jitter peaking of less than 0.1 dB at a nominal operating temperature of +45 Cº. The component values can be adjusted to achieve the desired loop bandwidth and stability at the target temperature. It would then be desirable to know what the expected variation in Kvco would be relative to its value at +45 Cº. The variation in Kvco relative to +45 Cº is plotted in Figure 5 for the Si550 and for the 622 MHz VCSO. The total variation over –20 to +45 Cº for the Si550 is 12.7% (–7% to +5.7%), while the total variation for the 622 MHz VCSO is 19.6% (+2% to –17.6%). 4 Rev. 0.2 AN255 350 1310 340 1260 330 1160 310 1110 300 Loop BW (Hz) Kvco (ppm/V) 1210 320 1060 290 Kvco Loop Bandwidth 280 1010 270 -40 -20 0 20 40 60 80 960 100 Temperature (deg C) Figure 3. Kvco v. Temp and Loop Bandwidth v. Temp for 622 MHz VCSO 105 103 1740 Kvco 1690 Loop Bandwidth 99 1640 97 1590 95 Loop BW (Hz) Kvco (ppm/V) 101 1540 93 91 1490 89 1440 100 -40 -20 0 20 40 60 80 Temperature (deg C) Figure 4. Kvco v. Temp and Loop Bandwidth v. Temp for Si550 Rev. 0.2 5 AN255 % Change in Kvco relative to value @ +45degC 10.0% 5.0% 0.0% -5.0% -10.0% -15.0% 622 MHz VCSO Si550 VCXO -20.0% -40 -20 0 20 40 60 80 Temperature (degC) Figure 5. Kvco Variation over Temperature, Relative to Value at +45 Cº 6 Rev. 0.2 100 AN255 6. Power Supply Rejection Ratio (PSRR) Jitter due to 1mV Sinusodal Noise (ps/mVrms) Noise that is present on the VCO supply voltage (VDD) may be converted to jitter on the VCO clock output. To measure the relative sensitivities of the Si550 and the 622 MHz VCSO devices with respect to supply noise, a sinusoidal noise source was added to the dc supply voltage, and the incremental increase in jitter present on the VCO output was measured. This test was repeated for a number of different sinusoidal noise frequencies, the results are plotted in the graph given in Figure 6. Here it can be seen that the Si550 device, which employs integral on-board voltage regulators, is much less susceptible to supply noise than the 622 MHz VCSO. The benefits of higher PSRR afforded by the Si550 device are most pronounced in the 1 to 10 kHz frequency range, where noise generated by switching ICs is often most problematic. 622 MHz VCSO Si550 VCXO 4.5 4.0 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 1 10 100 1,000 Modulation Frequency (kHz) Figure 6. Jitter Due to Power Supply Noise 7. Summary The Si550 VCXO is an excellent choice for use in new PLL designs or for replacement of 622 MHz VCSO or VCXO devices in existing PLL designs. The lower nominal Kvco value of this device, combined with improved Kvco temperature stability and superior power supply rejection ratio, serve to reduce overall PLL output jitter, reduce PLL noise sensitivity, and simplify the PLL design task. 8. Update Since this application note was initially written, the Si55x family of hybrid oscillators has added more Kv selections. In particular, a higher Kv = 356 ppm/V selection is now available. This feature gives the engineer another option to consider when replacing a VCSO. Depending on the PLL design, a high Kv VCSO may be drop-in replaced by a Kv = 356 ppm/V Si550 without needing to change any loop filter components. If the design allows, the Si55x linearity and power supply rejection advantages may then be accrued without otherwise changing the bill of materials. Review the current Si55x data sheets for the latest specifications. Rev. 0.2 7 AN255 DOCUMENT CHANGE LIST Revision 0.1 to Revision 0.2 8 Added "8. Update" on page 7 noting Si55x Rev. D higher Kv option available. Rev. 0.2 AN255 NOTES: Rev. 0.2 9 ClockBuilder Pro One-click access to Timing tools, documentation, software, source code libraries & more. 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