' Monolithic Amplifier Circuits: $ ' $ Introduction Device Physics: The Bipolar Transistor • In analog design the transistors are not simply switches • Second-order effects impact their performance • With each generation these effects become more significant Chapter 4 • The goal is to develop a circuit model for each device by formulating its operation Jón Tómas Guðmundsson – to do this a good understanding of the underlying principles is necessary tumi@hi.is & 2. Week Fall 2010 1 ' % & $ ' 2 % $ Bipolar Junction Transistors Bipolar Junction Transistors emitter base collector p+−type n−type p−type • The bipolar junction transistor (BJT) is a semiconductor device containing three adjoining alternately doped regions • pnp bipolar junction transistor • The central region is known as base and the outer regions emitter and collector • The emitter is much more doped than the collector & 3 • circuit symbol, voltage and current polarities keep the device in the active region % & 4 % ' $ • The pnp transistor is basically two very closely spaced p-n-junctions • npn bipolar junction transistor • The base region is ∼ 1 µm thick, so the junctions are very closely spaced and interact with each other • circuit symbol, voltage and current polarities keep the device in the active region 5 ' $ Bipolar Junction Transistors Bipolar Junction Transistors & ' • Thus the transistor is capable of current and voltage gain % & $ ' 6 % $ Bipolar Junction Transistors Bipolar Junction Transistors • The bipolar junction transistor has four regions of operation • The cutoff region • The most common region of operation is the active region – E-B-junctions are forward biased – E-B-junctions are reverse biased – C-B-junctions are reverse biased – C-B-junctions are reverse biased – gives the largest signal gain – represents an “off” state for the transistor as a switch – almost all linear amplifiers operate in the active region • The inverted region is when – E-B-junctions are reverse biased • The saturation region is when – C-B-junctions are forward biased – E-B-junctions are forward biased – C-B-junctions are forward biased & 7 % & 8 % ' $ ' $ % • In circuit applications the transistor typically has a common terminal between input and output & % $ ' $ Bipolar Junction Transistors Bipolar Junction Transistors • The four operating regions of the bipolar junction transistor & 9 ' Bipolar Junction Transistors 10 Bipolar Junction Transistors • Common emitter is the most popular • The common emitter amplifier has • This gives three amplifier types – output variables vEC and iC – common base (CB) – input variables vEB and iB – common emitter (CE) – common collector (CC) (emitter follower) & 11 % • if two of the voltages (or currents) are known the third is also known (Kirchhoff’s laws) & 12 % ' $ ' Bipolar Junction Transistors $ Bipolar Junction Transistors • The holes injected from the emitter that reach the collector junction are ICp • The current components within the transistor • The current due to thermally generated electrons near the junction are ICn IC = ICp + ICn • The holes injected from the emitter to base are IEp IE = IEp + IEn & 13 ' Bipolar Junction Transistors % & $ ' Bipolar Junction Transistors $ • The ratio IC /IE in the active region is defined as the dc alpha αdc = IC ICp + ICn = IE IEp + IEn • If the E-B junction is forward biased ICp ICn and • It is preferred that αT is unity, but due to recombination in base αT is slightly less than unity αdc = • The emitter injection efficiency IEp IEp = γ= IE IEn + IEp 15 14 % • As the emitter is more heavily doped γ −→ 1 and IEn −→ 0 • The base transport factor is defined as the ratio of the hole current diffusing into the collector to the hole current injected at the E-B junction ICp αT = IEp and measures the injected hole current compared to the total emitter current & IB = IE − IC = IB1 + IB2 − IB3 % ICp IEp + IEn which can be written as IEp 1 ICp = αT αdc = IEp 1 + IEn /IEp IEp + IEn or αdc = γαT & 16 % ' $ ' Bipolar Junction Transistors $ Bipolar Junction Transistors • Beta is defined as βdc = or βdc = IC IC = IB IE − IC IC /IE αdc = 1 − IC /IE 1 − αdc • The emitter current crossing the E-B depletion region is evaluated as two minority carrier diffusion currents • Note that as αdc −→ 1 then βdc −→ ∞ IE = IEp (0) + IEn (000 ) or & 17 ' Bipolar Junction Transistors % & $ ' IE = −qADB d∆pB d∆nE − qAD E dx x=0 dx00 x00 =0 18 Bipolar Junction Transistors % $ • For holes in the base region DB or where LB = • The collector current crossing the C-B junction is evaluated as & ∆pB (x) d2 ∆pB (x) = 2 dx L2B DB τB is the minority carrier diffusion length • The solution is IC = ICp (W ) + ICn (00 ) or √ d2 ∆pB (x) ∆pB (x) = 2 dx τB ∆pB (x) = C1 exp(x/LB ) + C2 exp(−x/LB ) d∆pB IC = −qADB dx x=W 19 d∆nC + qADC dx0 x0 =0 % • Similar equations can be found for ∆nE (x00 ) and ∆nC (x0 ) & 20 % ' Bipolar Junction Transistors $ ' Bipolar Junction Transistors $ • If there is no recombination of holes in the base τB = ∞ then d2 ∆pB (x) =0 dx2 which has solution of the form ∆pB (x) = C1 x + C2 • The two boundary conditions yield ∆pB (0) = pB0 (exp(qVEB /kT ) − 1) = C1 × 0 + C2 • The junction voltage VEB and VCE determine the minority carrier concentrations at the edges of the depletion region – give the boundary conditions & % & ' $ ' 21 Bipolar Junction Transistors ∆pB (W ) = pB0 (exp(qVCB /kT ) − 1) = C1 × W + C2 ∆pB (0) − ∆pB (W ) x ∆pB (x) = ∆pB (0) − W 22 % $ Bipolar Junction Transistors • Similarly ∆nE (x00 ) = C1 exp(−x00 /LE ) + C2 exp(x00 /LE ) and with the boundary conditions ∆nE (x00 ) = nE0 (exp(qVEB /kT ) − 1) exp(−x00 /LE ) • Thus the electron current is • Thus the slope of ∆pB (x) is ∆pB (0) − ∆pB (W ) − W & 23 IEn (000 ) = −qADE % & d∆nE (x00 ) qADE 00 = LE nE0 (exp(qVEB /kT )−1) dx x =0 24 % ' Bipolar Junction Transistors $ which gives IEp (0) = d∆pB (x) qADE [∆pB (0) − ∆pB (W )] = dx x=0 W • The total collector current is the sum of the hole and electron currents DB pB0 DC nC0 (exp(qVCB /kT ) − 1) + IC = −qA LC W qADB pB0 [(exp(qVEB /kT ) − 1) − (exp(qVCB /kT ) − 1)] W DB pB0 (exp(qVEB /kT ) − 1) W • The base current is then +qA • The total emitter current is the sum of the hole and electron currents DB pB0 DE nE0 (exp(qVEB /kT ) − 1) IE = qA + LE W −qA & $ Bipolar Junction Transistors • Simlarly the hole current is IEp (0) = −qADB ' DB pB0 (exp(qVCB /kT ) − 1) W 25 ' IB = −qA % & $ ' Bipolar Junction Transistors – Ebers – Moll DC nC0 DE nE0 (exp(qVEB /kT )−1)+qA (exp(qVCB /kT )−1) LE LC 26 Bipolar Junction Transistors – Ebers – Moll IE = IF − αR IR IF = IF0 (exp(qVEB /kT ) − 1) DB pB0 DE nE0 + = qA ×(exp(qVEB /kT ) − 1) LE W | {z } • Similarly the collector current can be split up into IR = IR0 (exp(qVCB /kT ) − 1) DB pB0 DC nC0 ×(exp(qVCB /kT ) − 1) + = qA LC W | {z } IF0 DB pB0 (exp(qVCB /kT )−1) αR IR = αR IR0 (exp(qVCB /kT )−1) = −qA W IR0 and αF IF = αF IF0 (exp(qVEB /kT )−1) = qA & 27 $ • The emitter current can be written as • The currents are now given different names and % % & 28 DB pB0 (exp(qVEB /kT )−1) W % ' $ Bipolar Junction Transistors – Ebers – Moll ' Bipolar Junction Transistors – Ebers – Moll $ • The emitter current can be written as IE = IF − αR IR • The collector current is then written as IC = αF IF − IR • With • The Ebers - Moll circuit for an ideal pnp bipolar junction transistor IB = IE − IC = (1 − αF )IF + (1 − αR )IR • These equations are known as the Ebers - Moll equations for an ideal pnp bipolar junction transistor & 29 ' Bipolar Junction Transistors – Ebers – Moll • Note that • If % & $ ' and αF 1 − αF αR 1 − αR then only three numbers are necessary for the Ebers-Moll equations to be completely specified, βF , βR , and IS (or αF , αR , and IS ) and all other parameters can be calculated 31 BJT - Small-signal models $ • Small signal models are then derived to calculate the circuit gain and terminal impedances • We recall βR = • The direct connection between the doping densities, base width, lifetime, etc. and the Ebers - Moll equations makes them particulary useful in integrated circuit analysis & 30 % • Analog circuits are often operated with signal levels that are small compared to the bias voltages and currents αF IF0 = αR IR0 = IS βF = • The complete set of input-output I − V characteristics can be calculated from these equations IC = IS exp VBE VT • The transconductance is defined as gm = % dIC dIS exp(VBE /VT ) IS VBE IC = = exp = dVBE dVBE VT VT VT • Note that gm = 38 mS for IC = 1 mA at 25 ◦ C. & 32 % ' $ BJT - Small-signal models ' BJT - Small-signal models $ • The minority carriers are supplied by the base lead so the device has input capacitance (npn) Cb = ∆Qh IC = τF gm = τF ∆VBE VT where WB2 2Dn is the base transit time in the forward direction τF = • A change in the base-emitter voltage ∆VBE causes a change in the minority carrier charge in the base ∆Qe & 33 ' • Typical values are – τF = 50 − 500 ps for npn – τF = 1 − 40 ps for pnp % & $ ' 34 % $ BJT - Small-signal models • In the forward active region the base current is related to the collector current IC IB = βF and IC d ∆IC ∆IB = dIC βF or −1 ∆IC IC d β0 = = ∆IB dIC βF BJT - Small-signal models • Typical values of β0 are close to those of βF • If βF is constant then βF = β0 • A single value of β is often assumed for a transistor and then used in both ac and dc calculations where β0 is the small signal current gain of the transistor & 35 % & 36 % ' BJT - Small-signal models $ BJT - Small-signal models $ • r0 is the small-signal output resistance of the transistor • Small-signal input inpedance of the device rπ = ' ∆VBE β0 ∆VBE = β0 = ∆IB ∆IC gm r0 = 1 VA gm VT • The small-signal input shunt resistance for a bipolar transistor depends on the current gain and is inversly proportional to IC • Small changes ∆VCE in VCE lead to changes ∆IC in IC ∆IC = ∂IC ∆VCE ∂VCE % • The large-signal characteristics of the transistor when the Early effect is included is VCE VBE IC = IS exp 1+ VT VA & % $ ' $ or ∆VCE VA = = r0 IC IC where VA is the Early voltage & ' 37 38 BJT - Small-signal models BJT - Small-signal models • Note that r0 is inversly proportional to IC and thus r0 can be related to gm 1 r0 = ηgm where kT η= qVA • Combination of the above small-signal elements yields the small-signal model often referred to as the hybrid-π model • So if VA = 100 V then η = 2.6 × 10−4 at 25◦ C & 39 • This is the basic model that arises directly from essential processes in the device % & 40 % ' $ BJT - Small-signal models ' BJT - Small-signal models $ • An increase ∆VCE in VCE leads to a decrease ∆IB in IB modelled by ∆VCE ∆VCE ∆IC ∆IC rµ = = = r0 ∆IB1 ∆IC ∆IB1 ∆IB1 • Typically IB1 < 0.1IB so rµ ≈ 2β0 r0 − 5β0 r0 • All pn junctions have voltage dependent capacitance • Technological limitations in the fabrication of a transistor give rise to a number of parasitic elements that have to be taken into account as well & 41 ' BJT - Small-signal models – Cje is for the base-emitter junction – Cµ is for the base-collector junction % & $ ' 42 % $ BJT - Frequency Response • The base-collector junction capacitance Cµ = – Ccs is for the collector-substrate junction Cµ0 1− V ψ0 n where V is forward bias and n ∼ 0.2 − 0.5 • Furthermore there are resistive parasitics – rb is series resistance in base – rc is series resistance in collector • The addition of the resistive and capacitive parasitics to the basic small-signal circuit gives the complete small-signal equivalent circuit – rex is series resistance in emitter • The capacitance Cπ contains the base-charging capacitance Cb and the emitter-base depletion layer capacitance Cje & Cπ = Cb + Cje 43 =⇒ Example 4.1 % & 44 % ' $ BJT - Frequency Response ' $ BJT - Frequency Response • The parasitic circuit elements influence the high-frequency gain of the transistor • The capability of a transistor to handle high frequency is specified by the frequency where the magnitude of the shor-circuit sommon-emitter gain falls to unity • This frequency is the transition frequency fT • Then the small signal voltage v1 is • To determine fT we neglect rex and rµ and redraw the complete small signal equivalent circuit v1 = rπ ii 1 + rπ (Cπ + Cµ )s • If rc is assumed small then ro and Ccs have no influence & 45 ' BJT - Frequency Response % & $ ' • If the current fed forward through Cµ is neglected we can write gm r π io ≈ ii 1 + rπ (Cπ + Cµ )s and the high frequency current gain β0 (Cπ +Cµ ) jω gm & 47 |β(jω)| = 1 we find ω = ωT = = β(jω) • At high frequencies the imagniary part of the denominator dominates and the equation simplifies to gm β(jω) ≈ jω(Cπ + Cµ ) $ • When the gain is unity and thus β0 46 BJT - Frequency Response io ≈ gm v1 io (jω) ≈ ii 1+ % and fT = % & gm Cπ + Cµ 1 gm 2π Cπ + Cµ 48 % ' $ ' BJT - Frequency Response $ BJT - Frequency Response • The frequency ωβ is defined as the frequency where β0 |β(jω)| = √ 2 or has fallen 3 dB down from the low frequency value • That is • The frequency response of a bipolar junction transistor |β(jω)| & 49 ' % & $ ' τT = 50 % $ This discussion is based on sections 1.1, 1.4, 2.1 - 2.4 and 2.6 in Neudeck (1983). It is worth looking at the original paper by Ebers and Moll (1954). A detailed discussion on the small-signal models and frequency response is found in sections 1.3 and 1.4 of Gray et al. (2001). • A time constant τT is associated with ωT or gm 1 β0 Cπ + Cµ Further reading BJT - Frequency Response τT = ωβ = 1 ωT References Cje + Cb + Cµ Cje + Cµ Cπ + Cµ = = τF + gm gm gm Ebers, J. J. and J. L. Moll (1954). Large-signal behavior of junction transistors. Proceedings of the IRE 42 (12), 1761–1772. Gray, P. R., P. J. Hurst, S. H. Lewis, and R. G. Meyer (2001). Analysis and Design of Analog Integrated Circuits (4 ed.). New York: John Wiley & Sons. =⇒ Example 4.2 Neudeck, G. W. (1983). The Bipolar Junction Transistor. Reading, Massachusets: Addison-Wesley. & 51 % & 52 %